• 제목/요약/키워드: Polymer passivation

검색결과 44건 처리시간 0.038초

Synthesis, Characterization, and Properties of Fully Aliphatic Polyimides and Their Derivatives for Microelectronics and Optoelectronics Applications

  • Mathews Anu Stella;Kim Il;Ha Chang-Sik
    • Macromolecular Research
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    • 제15권2호
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    • pp.114-128
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    • 2007
  • Polyimides are one of the most important classes of polymers used in the microelectronics and photoelectronics industries. Because of their high thermal stability, chemical resistance, and good mechanical and electric properties, polyimides are often applied in photoresists, passivation and dielectric films, soft print circuit boards, and alignment films within displays. Recently, fully aliphatic and alicyclic polyimides have found applications as optoelectronics and inter layer dielectric materials, due to their good transparencies and low dielectric constants $(\varepsilon)$. The low molecular density, polarity and rare probability of forming inter- or intra-molecular charge transfers, resulting in lowering of the dielectric constant and high transparency, are the most striking characteristics of aliphatic polyimide. However, the ultimate end use of polyimides derived from aliphatic monomers is in their targeted applications that need less stringent thermal requirements. Much research effort has been exerted in the development of aliphatic polyimide with increased thermal and mechanical stabilities, while maintaining their transparencies and low dielectric constants, by the incorporation of rigid moieties. In this article, the recent research process in synthesizing fully aliphatic polyimides, with improved dimensional stability, high transparency and low $\delta$values, as well as the characterizations and future scope for their application in micro electric and photo-electronic industries, is reviewed.

Characterization of Surface Damage and Contamination of Si Using Cylindrial Magnetron Reactive Ion Etching

  • Young, Yeom-Geun
    • 한국재료학회지
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    • 제3권5호
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    • pp.482-496
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    • 1993
  • Radiation damage and contamination of silicons etched in the $CF_4+H_2$ and $CHF_3$ magnetron discharges have been characterized using Schottky diode characteristics, TEM, AES, and SIMS as a function of applied magnetic field strength. It turned out that, as the magnetic field strength increased, the radiation damage measured by cross sectional TEM and by leakage current of Schottky diodes decreased colse to that of wet dtched samples especially for $CF_4$ plasma etched samples, For $CF_4+H_2$and $CHF_3$ etched samples, hydrogen from the plasmas introduced extended defects to the silicon and this caused increased leakage current to the samples etched at low magnetic field strength conditions by hydrogen passivation. The thickness of polymer with the increasing magnetic field strength and showed the minimum polymer residue thickness near the 100Gauss where the silicon etch rate was maximum. Also, other contaminants such as target material were found to be minimum on the etched silicon surface near the highest etch rate condition.

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Effect of Self-Assembled Monolayer Treated ZnO on the Photovoltaic Properties of Inverted Polymer Solar Cells

  • Yoo, Seong Il;Do, Thu Trang;Ha, Ye Eun;Jo, Mi Young;Park, Juyun;Kang, Yong-Cheol;Kim, Joo Hyun
    • Bulletin of the Korean Chemical Society
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    • 제35권2호
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    • pp.569-574
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    • 2014
  • Inverted bulk hetero-junction polymer solar cells (iPSC) composed of P3HT/PC61BM blends on the ZnO modified with benzoic acid derivatives-based self-assembled monolayers (SAM) are fabricated. Compared with the device using the pristine ZnO, the devices with ZnO surface modified SAMs derived from benzoic acid such as 4-(diphenylamino)benzoic acid (DPA-BA) and 4-(9H-carbazol-9-yl)benzoic acid (Cz-BA) as an electron transporting layer show improved the performances. It is mainly attributed to the favorable interface dipole at the interface between ZnO and the active layer, the eective passivation of the ZnO surface traps, decrease of the work function and facilitating transport of electron from PCBM to ITO electrode. The power conversion eciency (PCE) of iPSCs based on DPA-BA and Cz-BA treated ZnO reaches 2.78 and 2.88%, respectively, while the PCE of the device based on untreated ZnO is 2.49%. The open circuit voltage values ($V_{oc}$) of the devices with bare ZnO and SAM treated ZnO are not much different. Whereas, higher the fill factor (FF) and lower the series resistance ($R_s$) are obtained in the devices with SAMs modification.

Power Enhancement of ZnO-Based Piezoelectric Nanogenerators Via Native Defects Control

  • Kim, Dohwan;Kim, Sang-Woo
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2013년도 제45회 하계 정기학술대회 초록집
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    • pp.297.2-297.2
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    • 2013
  • Scavenging electricity from wasteful energy resources is currently an important issue and piezoelectric nanogenerators (NGs) based on zinc oxide (ZnO) are promising energy harvesters that can be adapted to various portable, wearable, self-powered electronic devices. Although ZnO has several advantages for NGs, the piezoelectric semiconductor material ZnO generate an intrinsic piezoelectric potential of a few volts as a result of its mechanical deformation. As grown, ZnO is usually n-type, a property that was historically ascribed to native defects. Oxygen vacancies (Vo) that work as donors exist in ZnO thin film and usually screen some parts of the piezoelectric potential. Consequently, the ZnO NGs' piezoelectric power cannot reach to its theoretical value, and thus decreasing the effect from Vo is essential. In the present study, c-axis oriented insulator-like sputtered ZnO thin films were grown in various temperatures to fabricate an optimized nanogenerator (NGs). The purity and crystalinity of ZnO were investigated with photoluminescence (PL). Moreover, by introducing a p-type polymer usually used in organic solar cell, it was discussed how piezoelectric passivation effect works in ZnO thin films having different types of defects. Prepared ZnO thin films have both Zn vacancies (accepter like) and oxygen vacancies (donor like). It generates output voltage 20 time lager than n-type dominant semiconducting ZnO thin film without p-type polymer conjugating. The enhancement is due to the internal accepter like point defects, zinc vacancies (VZn). When the more VZn concentration increases, the more chances to prevent piezoelectric potential screening effects are occurred, consequently, the output voltage is enhanced. Moreover, by passivating remained effective oxygen vacancies by p-type polymers, we demonstrated further power enhancement.

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$TiS_2$ Composite/SPE/Li Cell의 충방전에 따른 AC 임피던스의 변화 (Variation of AC Impedance of the $TiS_2$ Composite/SPE/Li Cell with Cycling)

  • 김종욱;구할본;문성인;윤문수
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 1995년도 하계학술대회 논문집 C
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    • pp.1034-1038
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    • 1995
  • The purpose of this study is to research and develop $TiS_2$ composite cathode for lithium polymer battery(LPB). $TiS_2$ electrode represent a class of insertion positive electrode used in Li secondary batteries. In this study, we investigated preparation of $TiS_2$ composite cathode and AC impedance response of $TiS_2$ composite/SPE/Li cells as a function of state of charge(SOC) and cycling. The resistance of B type cell using $TiS_2PEO_8LiClO_4PC_5EC_5$ composite cathode was lower than that of A type cell using $TiS_2PEO$ composite cathode. The cell resistance of B type cell is high for the first few percent discharge, decreases for midium discharge and then increases again toward the end of discharge. We believe the magnitude of the cell resistance is dominated by passivation layer impedance and small cathode resistance. AC impedance results indicate that the cell internal resistance increase with cycling, and this is attributed to change of passivation layer impedance with cycling. The passivation layer resistance($R_f$) of B type cell decreases for the 2nd cycling and then increases again with cycling. Redox coulombic efficiency of B type cell was about 141% at 1st cycle and 100% at 12th cycle. Also, $TiS_2$ specific capacity was 115 mAh/g at 12 cycle.

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Lifetime characteristics of flexible organic light emitting diodes on PET substrate with plasma polymer barrier layers

  • Kim, Kyu-Hyung;Kho, Sam-Il;Jung, Dong-Geun;Boo, Jin-Hyo
    • 한국정보디스플레이학회:학술대회논문집
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    • 한국정보디스플레이학회 2004년도 Asia Display / IMID 04
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    • pp.41-43
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    • 2004
  • Plasma polymerized para-xylene ($PP_PX$) deposited by plasma-enhanced chemical vapor deposition (PECVD) was used as the barrier layer on the polyethylene terephthalate (PET) substrate to improve lifetime of the flexible organic light-emitting diodes (FOLEDs). The $PP_PX$ barrier layer deposited on top of the PET substrate with plasma power of 30 W at deposition pressure of 0.2 torr showed transmittance spectra good enough to be applied in FOLED on PET substrates. FOLEDs with the $PP_PX$ barrier layer (barrier-FOLEDs) showed similar I-V and B-V characteristics to FOLEDs without the $PP_PX$ layer (control-FOLEDs). The lifetime of barrier-FOLED was two times longer than that of the control-FOLED. With $PP_PX$ passivation layers, lifetimes of both control and barrier-FOLEDs were improved by more than 4 times. These results show that PECVD deposited $PP_PX$ layers can be used as barrier layers for FOLEDs on plastic substrates as well as passivation layers for general OLEDs.

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The electrical and corrosion properties of polyphenylene sulfide/carbon composite coated stainless steel bipolar plate for PEM fuel cell

  • Lee, Yang-Bok;Kim, Kyung-Min;Park, Yu-Chun;Hwang, Eun-Ji;Lim, Dae-Soon
    • 한국신재생에너지학회:학술대회논문집
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    • 한국신재생에너지학회 2011년도 춘계학술대회 초록집
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    • pp.89.2-89.2
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    • 2011
  • Stainless steel bipolar plates have many advantage such as high electrical conductivity and mechanical strength and low fabrication cost. However, they need a passivation layer due to low corrosion resistance under PEM fuel cell operation condition. In this study, polyphenyene sulfide(PPS)/carbon composite coated stainless steel bipolar plates were fabricated by compression molding method after PPS/carbon composite sprayed on the stainless steel plate. PPS and carbon were chosen as the binder and conductive filler of passivation layer, respectively. The interfacial contact resistance and corrosion resistance of PPS/carbon composite coated stainless steel bipolar plates were investigated and compared to the stainless steel. The PPS/carbon composite coated stainless steel compared to stainless steel was improved interfacial contact resistance. The results of the potentiodynamic and potentiostatic measurements also showed that the PPS/carbon composite coated stainless steel did not corroded under PEM fuel cell operating conditions.

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Effect of Amine Functional Group on Removal Rate Selectivity between Copper and Tantalum-nitride Film in Chemical Mechanical Polishing

  • Cui, Hao;Hwang, Hee-Sub;Park, Jin-Hyung;Paik, Ungyu;Park, Jea-Gun
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2008년도 하계학술대회 논문집 Vol.9
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    • pp.546-546
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    • 2008
  • Copper (Cu) Chemical mechanical polishing (CMP) has been an essential process for Cu wifing of DRAM and NAND flash memory beyond 45nm. Copper has been employed as ideal material for interconnect and metal line due to the low resistivity and high resistant to electro-migration. Damascene process is currently used in conjunction with CMP in the fabrication of multi-level copper interconnects for advanced logic and memory devices. Cu CMP involves removal of material by the combination of chemical and mechanical action. Chemicals in slurry aid in material removal by modifying the surface film while abrasion between the particles, pad, and the modified film facilitates mechanical removal. In our research, we emphasized on the role of chemical effect of slurry on Cu CMP, especially on the effect of amine functional group on removal rate selectivity between Cu and Tantalum-nitride (TaN) film. We investigated the two different kinds of complexing agent both with amine functional group. On the one hand, Polyacrylamide as a polymer affected the stability of abrasive, viscosity of slurry and the corrosion current of copper film especially at high concentration. At higher concentration, the aggregation of abrasive particles was suppressed by the steric effect of PAM, thus showed higher fraction of small particle distribution. It also showed a fluctuation behavior of the viscosity of slurry at high shear rate due to transformation of polymer chain. Also, because of forming thick passivation layer on the surface of Cu film, the diffusion of oxidant to the Cu surface was inhibited; therefore, the corrosion current with 0.7wt% PAM was smaller than that without PAM. the polishing rate of Cu film slightly increased up to 0.3wt%, then decreased with increasing of PAM concentration. On the contrary, the polishing rate of TaN film was strongly suppressed and saturated with increasing of PAM concentration at 0.3wt%. We also studied the electrostatic interaction between abrasive particle and Cu/TaN film with different PAM concentration. On the other hand, amino-methyl-propanol (AMP) as a single molecule does not affect the stability, rheological and corrosion behavior of the slurry as the polymer PAM. The polishing behavior of TaN film and selectivity with AMP appeared the similar trend to the slurry with PAM. The polishing behavior of Cu film with AMP, however, was quite different with that of PAM. We assume this difference was originated from different compactness of surface passivation layer on the Cu film under the same concentration due to the different molecular weight of PAM and AMP.

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나노리소그라피 기술을 이용한 초소수성 불소 실란 분자의 나노패턴 제조 (Fabrication of Superhydrophobic molecules Nanoarray by Dip-pen Nanolithography)

  • 연경흠;강필선;김경민;임정혁
    • 접착 및 계면
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    • 제19권4호
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    • pp.163-166
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    • 2018
  • 이 딥펜 나노리소그라피(DPN)는 원자 힘 현미경(AFM)을 기반으로 하는 나노 및 마이크로 패턴 제조 기술이다. 다양한 잉크 물질을 AFM 탐침에 코팅하여 탐침과 기판 사이에 형성된 물 메니스커스를 통해 기판으로 전이시켜 패턴을 제조한다. 본 연구에서는, 실란 전처리된 AFM 탐침 표면에 불소 실란 잉크 용액을 코팅하고 하이드록시기로 개질된 실리콘 기판 위에 접촉시킨 후, DPN 기술을 이용하여 표면으로 잉크 물질을 전이시키는 연구를 진행하였다. HDFDTMS 잉크 물질의 dot 어레이 패턴을 안정적으로 제조하였으며, AFM 탐침과 기판 사이의 접촉시간에 따라 패턴 크기가 선형적으로 증가하는 전형적인 DPN의 확산 메커니즘을 보였다.

Wafer-Sawing시 발생하는 particle을 효과적으로 제거하기 위한 DI water 노즐의 최적 설계 (DI water Nozzle Design for Effective Removal of the Particles Generated during Wafer-sawing)

  • 김병수;이기준;이성재
    • 마이크로전자및패키징학회지
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    • 제10권4호
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    • pp.53-60
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    • 2003
  • CCD(Charge-Coupled Device) wafer와 같이 표면이 polymer 성분의 micro lens로 구성되어있는 경우 passivation 막을 도포하지 않는 것이 보통인데, 이때 particle이 lens 표면에 쉽게 달라붙는 현상이 나타나게 된다. 특히 sawing 하면서 발생하는 particle은 치명적인 불량을 유발한다. 본 연구에서는 sawing에서 발생한 particle을 효과적으로 flushing하기위한 방안으로 측면노즐과 중심노즐의 분사위치, 분사각도, 퍼짐각도를 최적화 하고, 아울러 flushing 노즐을 추가한 새로운 형태의 wafer saw를 도입하였다. 개선된 saw를 적용하여 실험한 결과 particle로 인한 CCD chip의 불량률이 9.l%로부터 0.63%로 현격하게 개선되었음을 확인할 수 있었다.

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