Characteristics of Defects in SiOx Thin films on Ethylene Terephthalate by High-temperature E-beam Deposition (고온 전자빔 증착에 의한 Ethylene Terephthalate상의 SiOx 박막의 특성 평가)
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- Journal of the Korean Institute of Electrical and Electronic Material Engineers
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- v.19 no.1
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- pp.71-74
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- 2006