Characteristics of Defects in SiOx Thin films on Ethylene Terephthalate by High-temperature E-beam Deposition
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Han Jin-Woo
(연세대학교 전자전기공학과)
Kim Young-Hwan (연세대학교 전자전기공학과) Kim Jong-Hwan (연세대학교 전자전기공학과) Seo Dae-Shlk (연세대학교 전자전기공학과) Moon Dae-Gyu (순천향대학교 신소재공학과) |
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