• Title/Summary/Keyword: Optical reflectance

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Electro-optical Characteristics of Full-HD LCOS Depending on the Trench Structure between Adjacent Pixels (Full-HD LCOS의 이웃한 픽셀 사이의 Trench구조 변화에 따른 전기광학적 특성 분석)

  • SonHong, Hong-Bae;Kim, Min-Seok;Kang, Jung-Wwon
    • Journal of the Semiconductor & Display Technology
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    • v.8 no.2
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    • pp.59-62
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    • 2009
  • In order to check the validation of LC simulation, 0.7 inch LCOS panel in full-HD resolution was fabricated and used for the electro-optical measurement. Compared the measured data with the calculated data, the averaged difference was 1.72% under 0 ~ +6 V bias on pixel electrode. To improve the optical characteristics of full-HD LCOS panel, the planar structure and trench structures (0.1 um, 0.2 um and 0.3 um-in-depth) between adjacent pixels were investigated with LC simulation. The planar structure showed the higher reflectance and faster reflectance-voltage response time than the trench structure. The optical fill factor and contrast ratio of planar structure were also higher than those of trench structures. As compared 1 um-in-depth trench structure resembled to the real structure with the planar structure, the optical fill factor was improved by 1.15% and the contrast ratio was improved by 5.26%. In order to minimize the loss of luminance and contrast ratio, the planar structure need to be applied between adjacent pixels.

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Tuned Optical Reflection Characteristics of Chemically-Treated Ti Substrates

  • Yun, Ho-Gyeong;Kim, Myoung;You, In-Kyu
    • ETRI Journal
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    • v.34 no.6
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    • pp.954-957
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    • 2012
  • Titanium foils for use in photoelectrochemical devices are treated with a $HNO_3$-HF solution. After this treatment, the optical reflection characteristics of the Ti substrates are markedly increased in terms of not only reflectivity but also optimized wavelength. Furthermore, the "multiple beam interference" theory and optical analysis of surface morphologies clearly verify the origin of the optimized optical reflection properties.

Comparison of optical reflectance spectrum at blade and vein parts of cabbage and kale leaves

  • Ngo, Viet-Duc;Ryu, Dong-Ki;Chung, Sun-Ok;Park, Sang-Un;Kim, Sun-Ju;Park, Jong-Tae
    • Korean Journal of Agricultural Science
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    • v.40 no.2
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    • pp.163-167
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    • 2013
  • Objective of the study was to compare reflectance spectrum in the blade and the vein parts of cabbage and kale leaves. A total 6 cabbage and kale leaves were taken from a plant factory in Chungnam National University, Korea. Spectra data were collected with a UV/VIS/NIR spectrometer (model: USB2000, Ocean Optics, FL, USA) in the wavelength region of 190 - 1130 nm. Median filter smoothing method was selected to preprocess the obtained spectra data. We computed reflectance difference by subtraction of averaged spectrum from individual spectrum. To estimate correlation at different parts of cabbage and kale leaves, cross - correlation method was used. Differences between cabbage and kale leaves are clearly manifested in the green, red and near - infrared ranges. The percent reflectance of cabbage leaves in the NIR wavelength band was higher than that of kale leaves. Reflectance in the blade part was higher than in the vein part by 18%. Reflectance difference in the different parts of cabbage and kale leaves were clear in all of the wavelength bands. Standard deviation of reflectance difference in the vein part was greater for kale, while the value in the blade part was greater for cabbage leaves. Standard deviation of cross - correlation increased from 0.092 in the first sensor (UV/VIS) and 0.007 in the second sensor (NIR) to 0.099 and 0.015, respectively.

Accuracy Comparison of TOA and TOC Reflectance Products of KOMPSAT-3, WorldView-2 and Pléiades-1A Image Sets Using RadCalNet BTCN and BSCN Data

  • Kim, Kwangseob;Lee, Kiwon
    • Korean Journal of Remote Sensing
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    • v.38 no.1
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    • pp.21-32
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    • 2022
  • The importance of the classical theme of how the Top-of-Atmosphere (TOA) and Top-of-Canopy (TOC) reflectance of high-resolution satellite images match the actual atmospheric reflectance and surface reflectance has been emphasized. Based on the Radiometric Calibration Network (RadCalNet) BTCN and BSCN data, this study compared the accuracy of TOA and TOC reflectance products of the currently available optical satellites, including KOMPSAT-3, WorldView-2, and Pléiades-1A image sets calculated using the absolute atmospheric correction function of the Orfeo Toolbox (OTB) tool. The comparison experiment used data in 2018 and 2019, and the Landsat-8 image sets from the same period were applied together. The experiment results showed that the product of TOA and TOC reflectance obtained from the three sets of images were highly consistent with RadCalNet data. It implies that any imagery may be applied when high-resolution reflectance products are required for a certain application. Meanwhile, the processed results of the OTB tool and those by the Apparent Reflection method of another tool for WorldView-2 images were nearly identical. However, in some cases, the reflectance products of Landsat-8 images provided by USGS sometimes showed relatively low consistency than those computed by the OTB tool, with the reference of RadCalNet BTCN and BSCN data. Continuous experiments on active vegetation areas in addition to the RadCalNet sites are necessary to obtain generalized results.

The phase angle dependences of Reflectance on Asteroid (25143) Itokawa from the Hayabusa Spacecraft Multi-band Imaging Camera(AMICA)

  • Lee, Mingyeong;Ishiguro, Masateru
    • The Bulletin of The Korean Astronomical Society
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    • v.40 no.1
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    • pp.61.3-62
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    • 2015
  • Remote-sensing observation is one of the observation methods that provide valuable information, such as composition and surface physical conditions of solar system objects. The Hayabusa spacecraft succeeded in the first sample returning from a near-Earth asteroid, (25143) Itokawa. It has established a ground truth technique to connect between ordinary chondrite meteorites and S-type asteroids. One of the scientific observation instruments that Hayabusa carried, Asteroid Multi-band Imaging Camera(AMICA) has seven optical-near infrared filters (ul, b, v, w, x, p, and zs), taking more than 1400 images of Itokawa during the rendezvous phase. The reflectance of planetary body can provide valuable information of the surface properties, such as the optical aspect of asteroid surface at near zero phase angle (i.e. Sun-asteroid-observer's angle is nearly zero), light scattering on the surface, and surface roughness. However, only little information of the phase angle dependences of the reflectance of the asteroid is known so far. In this study, we investigated the phase angle dependences of Itokawa's surface to understand the surface properties in the solar phase angle of $0^{\circ}-40^{\circ}$ using AMICA images. About 700 images at the Hayabusa rendezvous phase were used for this study. In addition, we compared our result with those of several photometry models, Minnaert model, Lommel-Seeliger model, and Hapke model. At this conference, we focus on the AMICA's v-band data to compare with previous ground-based observation researches.

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Analysis of Optical Process Depending On Texturing Process of Si Wafer (실리콘 웨이퍼의 표면조직화에 따른 광학적 특성분석)

  • Oh, Teresa
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.15 no.11
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    • pp.2439-2443
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    • 2011
  • To obtain the effect of texturing process in Solar cells, the Si-wafers were textured by using the IPA+DI water mixed etching solution with KOH alkaline. All samples were analyzed by the scanning electron microscopy for the surface images, and it was researched the correlation between the efficiency of optical properties and the effect of texturing. From the results of the surface images obtained by SEM, mc-Si wafer shows a isotropic surface but sc-Si wafers displays the unisotropic surface. The reflectance was improved at the sc-Si wafer textured uniformly, and the reflectance of over etched-samples increased.

A Study on Optical Condition and preprocessing for Input Image Improvement of Dented and Raised Characters of Tires (타이어 음,양각 문자의 입력영상 개선을 위한 전처리와 광학조건에 관한 연구)

  • 류한성;최중경;구본민;박무열;윤경섭
    • Proceedings of the IEEK Conference
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    • 2001.06d
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    • pp.93-96
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    • 2001
  • In this paper, we present a vision algorithm and method for input image improvement and preprocessing of dented and raised characters on the sidewall of tires. we define optical condition between reflect coefficient and reflectance by the physical vector calculate. On the contrary this work will recognize the engraved characters using the computer vision technique. Tire input images have all most same grey levels between the characters and backgrounds. The reflectance is little from a tire surface. therefore, it's very difficult segment the characters from the background. Moreover, one side of the character string is raised and the other is dented. So, the captured images are varied with the angle of camera and illumination. For optimum input images, the angle between camera and illumination was found out to be with in 90。 .In addition, We used complex filtering with low-pass and high-pass band filters to improve input images, for clear input images. Finally we define equation reflect coefficient and reflectance. By doing this, we obtained good images of tires for pattern recognition.

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Porous Si Layer by Electrochemical Etching for Si Solar Cell

  • Lee, Soo-Hong
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.22 no.7
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    • pp.616-621
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    • 2009
  • Reduction of optical losses in crystalline silicon solar cells by surface modification is one of the most important issues of silicon photovoltaics. Porous Si layers on the front surface of textured Si substrates have been investigated with the aim of improving the optical losses of the solar cells, because an anti-reflection coating(ARC) and a surface passivation can be obtained simultaneously in one process. We have demonstrated the feasibility of a very efficient porous Si ARC layer, prepared by a simple, cost effective, electrochemical etching method. Silicon p-type CZ (100) oriented wafers were textured by anisotropic etching in sodium carbonate solution. Then, the porous Si layers were formed by electrochemical etching in HF solutions. After that, the properties of porous Si in terms of morphology, structure and reflectance are summarized. The structure of porous Si layers was investigated with SEM. The formation of a nanoporous Si layer about 100nm thick on the textured silicon wafer result in a reflectance lower than 5% in the wavelength region from 500 to 900nm. Such a surface modification allows improving the Si solar cell characteristics. An efficiency of 13.4% is achieved on a monocrystalline silicon solar cell using the electrochemical technique.