• 한국전기전자재료학회논문지
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• 제15권11호
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• pp.923-932
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• 2002

A stoichiometric mixture of evaporating materials for CdIn$\_$2/S$\_$4/ single crystal thin films was prepared from horizontal furnace. To obtain the single crystal thin films, CdIn$\_$2/S$\_$4/ mixed crystal was deposited on thoroughly etched semi-insulating GaAs(100) substrate by hot wall epitaxy(HWE) system. The source and substrate temperatures were 630 $\^{C}$ and 420 $\^{C}$, respectively. The crystalline structure of single crystal thin films was investigated by the photoluminescence and double crystal X-ray diffraction(DCXD). The carrier density and mobility of CdIn$\_$2/S$\_$4/ single crystal thin films measured from Hall effect by van der Pauw method are 9.01$\times$10$\^$16/ cm$\^$-3/ and 219 ㎠/V$.$s at 293 K, respectively. From the optical absorption measurement, the temperature dependence of energy band gap on CdIn$\_$2/S$\_$4/ single crystal thin films was found to be Eg(T) ＝ 2.7116 eV - (7.74 $\times$ 10$\^$-4/ eV) T$\^$2//(T＋434). After the as-grown CdIn$\_$2/S$\_$4/ single crystal thin films was annealed in Cd-, S-, and In-atmospheres, the origin of point defects of CdIn$\_$2/S$\_$4/ single crystal thin films has been investigated by the photoluminescence(PL) at 10 K. The native defects of V$\_$cd/, V$\_$s/, Cd$\_$int/ and S$\_$int/ obtained by PL measurements were classified as donors or accepters type. And we concluded that the heat-treatment in the S-atmosphere converted CdIn$\_$2/S$\_$4/ single crystal thin films to an optical p-type. Also, we confirmed that In in CdIn$\_$2/S$\_$4/GaAs did not from the native defects because In in CdIn$\_$2/S$\_$4/ single crystal thin films existed in the form of stable bonds.

• 한국전기전자재료학회논문지
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• 제33권3호
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• pp.214-218
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• 2020

In this study, Mg_xZn_1-xO thin films, which can be applied not only to active layers of light-emitting devices (LEDs), such as UV-LEDs, but also to solar cells, high mobility field-effect transistors, and power semiconductor devices, are fabricated using the sol-gel method. ZnO and Mg_0.3Zn_0.7O solution synthesized by the sol-gel method and the thin film were grown by spin coating on a Si (100) substrate and sapphire substrate. The solutions are synthesized by dissolving precursor materials in 2-methoxyethanol (2-ME) solvent, and then monoethanolamine (MEA) was added to the mixed solution as a sol stabilizer. Zinc acetate dihydrate is used as a ZnO precursor, while Mg nitrate hexahydrate and Mg acetate tetrahydrate are used as an MgO precursor. Then, the optical and structural characteristics of the fabricated thin films are compared. The molar concentration of the Zn precursor in the solvent is fixed at 0.3 M, and the amount of the Mg precursor is 30% of Mg²⁺/Zn²⁺. The optical characteristics are measured using an UV-vis spectrophotometer, and the transmittance of each wavelength is measured. Structural characteristics are measured using X-ray diffraction (XRD) and transmission electron microscopy (TEM). Composition analyses are performed using energy dispersive X-ray spectroscopy (EDS). The Mg_0.3Zn_0.7O thin film was well formed at the ratio of the Mg precursor added regardless of the type of Mg precursor, and the c-axis of the thin film was decreased, while the band gap was increased to 3.56 eV.

• 한국안광학회지
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• 제10권3호
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• pp.193-203
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• 2005

Zn-나프텐산염을 출발 원료로 사용하고 스핀코팅 - 열분해법을 이용하여 실리카 유리 위에 c축으로 배향된 나노 결정질 ZnO 박막을 제조하였다. X-선 회절 분석을 행한 결과, 모든 시편에서 ZnO (002) 피크만이 관찰되었으며, 박막의 열처리 온도가 증가함에 따라 (002) 피크 강도가 증가하였다. 박막의 표면 미세 구조는 매우 균질하였으며, 입자들 간의 응집은 관찰되지 않았다. 박막의 topology를 주사형 탐침 현미경으로 분석한 결과에 따르면, 실리카 기판 자체의 불균질한 표면 특성과 ZnO 입자의 c축 배향 특성에 의한 것으로 보이는 3차원적인 입자성장이 모든 열처리 온도 영역에 대해 박막의 표면에서 관찰되었다. 고배향된 박막들 중에서 $800^{\circ}C$로 열처리한 박막의 표면이 가장 균질한 특성을 나타내었다. 박막의 가시영역에서의 투과율은 $1000^{\circ}C$로 열처리한 박막을 제외하고 모든 박막에 있어서 80% 이상의 투과율을 나타냈으며, 380~400nm 영역에서 날카로운 absorption edge가 나타났다. 흡수피크를 이용하여 계산된 오든 박막의 에너지 밴드 캡은 ZnO 단결정 및 다른 연구자들에 의해 보고된 박막과 같은 영역에 존재하였다. 본 연구에서 제조된 ZnO 박막들 중에 치밀한 입자 성장과 균질한 표면 특성을 보이는 $600^{\circ}C{\sim}800^{\circ}C$로 열처리된 박막은 UV차단성 투명전도막 및 렌즈 등의 광학소자에 실질적인 응용이 기대 된다.

• 한국전기전자재료학회논문지
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• 제20권10호
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• pp.829-838
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• 2007

The stochiometric mix of evaporating materials for the $CdGa_2Se_4$ single crystal thin films was prepared from horizontal furnace. To obtain the single crystal thin films, $CdGa_2Se_4$ mixed crystal was deposited on thoroughly etched semi-insulating GaAs(100) substrate by the Hot Wall Epitaxy (HWE) system. The source and substrate temperature were $630^{\circ}C$ and $420^{\circ}C$, respectively. The crystalline structure of single crystal thin films was investigated by the photoluminescence and double crystal X-ray diffraction (DCXD).The carrier density and mobility of $CdGa_2Se_4$ single crystal thin films measured from Hall effect by van der Pauw method are $8.27{\times}10^{17}\;cm^{-3},\;345\;cm^2/V{\cdot}s$ at 293 K. respectively. The temperature dependence of the energy band gap of the $CdGa_2Se_4$ obtained from the absorption spectra was well described by the Varshni's relation, $Eg(T)\;=\;2.6400\;eV\;-\;(7.721{\times}10^{-4}\;eV/K)T^2/(T+399\;K)$. After the as-grown single crystal $CdGa_2Se_4$ thin films were annealed in Cd-, Se-, and Ga -atmospheres, the origin of point defects of single crystal $CdGa_2Se_4$ thin films has been investigated by PL at 10 K. The native defects of $V_{Cd}$, $V_{Se}$, $Cd_{int}$, and $Se_{int}$ obtained by PL measurements were classified as donors or accepters. We concluded that the heat-treatment in the Cd-atmosphere converted single crystal $CdGa_2Se_4$ thin films to an optical p-type. Also, we confirmed that Ga in $CdGa_2Se_4/GaAs$ did not form the native defects because Ga in single crystal $CdGa_2Se_4$ thin films existed in the form of stable bonds.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2008년도 추계학술대회 논문집 Vol.21
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• pp.399-399
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• 2008

Synthesis and characterization of ZnO structure such as nanowires, nanorods, nanotube, nanowall, etc. have been studied to multifunctional application such as optical, nanoscale electronic and chemical devices because it has a room-temperature wide band gap of 3.37eV, large exiton binding energy(60meV) and various properties. Various synthesis methods including chemical vapor deposition (CVD), physical vapor deposition, electrochemical deposition, micro-emulsion, and hydrothermal approach have been reported to fabricate various kinds of ZnO nanostructures. But some of these synthesis methods are expensive and difficult of mass production. Wet chemical method has several advantage such as simple process, mass production, low temperature process, and low cost. In the present work, ZnO nanorods are deposited on ITO/glass substrate by simple wet chemical method. The process is perfomed by two steps. One-step is deposition of ZnO seeds and two-step is growth of ZnO nanorods on substrates. In order to form ZnO seeds on substrates, mixture solution of Zn acetate and Methanol was prepared.(one-step) Seed layers were deposited for control of morpholgy of ZnO seed layers by spin coating process because ZnO seeds is deposited uniformly by centrifugal force of spin coating. The seed-deposited samples were pre-annealed for 30min at $180^{\circ}C$ to enhance adhesion and crystallinnity of ZnO seed layer on substrate. Vertically well-aligned ZnO nanorods were grown by the "dipping-and-holding" process of the substrates into the mixture solution consisting of the mixture solution of DI water, Zinc nitrate and hexamethylenetetramine for 4 hours at $90^{\circ}C$.(two-step) It was found that density and morphology of ZnO nanorods were controlled by manipulation of ZnO seeds through rpm of spin coating. The morphology, crystallinity, optical properties of the grown ZnO nanostructures were carried out by field-emission scanning electron microscopy, high-resolution electron microscopy, photoluminescence, respectively. We are convinced that this method is complementing problems of main techniques of existing reports.

• 대한전자공학회논문지SD
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• 제44권5호
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• pp.1-7
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• 2007

Sol-gel 법으로 quartz 기판 위에 Al 도핑 농도와 열처리 온도에 따른 AZO 박막을 제작하였다. 1 % Al 이 도핑되고 550 $^{\circ}C$ 에서 열처리한 ZnO 박막에서 가장 우수한 (002) 배향성과 가장 평탄한 박막 (1.084 nm) 이 제작되었다. 모든 박막은 가시광 영역에서 약 80 % 이상의 투과율을 보였으며, Al 농도가 증가할수록 에너지 밴드 갭이 넓어지는 Burstein-Moss 효과가 관찰되었다. Hall 측정 결과, 순수한 ZnO 박막보다 Al 이 도핑된 ZnO 박막에서 캐리어 농도의 증가와 비저항 값의 감소가 나타났다. 또, Al 의 도핑 농도가 증가함에 따라 segregation 효과로 인한 캐리어 농도의 감소와 비저항 값의 증가가 관찰되었다. 1% Al 이 도핑되고 550 $^{\circ}C$ 에서 열처리한 ZnO 박막에서 가장 큰 캐리어 농도 ($1.80{\times}10^{19}\;cm^{-3}$) 와 가장 낮은 비저항 (0.84 ${\Omega}cm$) 값을 나타내었다.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2003년도 하계학술대회 논문집 Vol.4 No.1
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• pp.352-356
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• 2003

A stoichiometric mixture of evaporating materials for $CuGaSe_2$ single crystal am films was prepared from horizontal electric furnace. Using extrapolation method of X-ray diffraction patterns for the polycrystal $CuGaSe_2$, it was found tetragonal structure whose lattice constant $a_0$ and $c_0$ were $5.615\;{\AA}\;and\;11.025\;{\AA}$, respectively. To obtain the single crystal thin films, $CuGaSe_2$ mixed crystal was deposited on thoroughly etched semi-insulating GaAs(100) substrate by the hot wall epitaxy (HWE) system. The source and substrate temperatures were $610^{\circ}C$ and $450^{\circ}C$, respectively, The crystalline structure of the single crystal thin films was investigated by the photoluminescence and double crystal X-ray diffraction (DCXD). The carrier density and mobility of $CuGaSe_2$ single crystal thin films measured with Hall effect by van der Pauw method are $9.24{\times}10^{16}\;cm^{-3}$ and $295\;cm^2/V{\cdot}s$ at 293 K, respectively. The temperature dependence of the energy band gap of the $CuGaSe_2$ obtained from the absorption spectra was well described by the Varshni's relation, $E_g(T)\;:\;1.7998\;eV\;-\;(8.7489\;{\times}\;10^{-4}\;eV/K)T^2(T\;+\;335\;K)$. After the as-grown $CuGaSe_2$ single crystal thin films was annealed in Cu-, Se-, and Ga-atmospheres, the origin of point defects of $CuGaSe_2$ single crystal thin films has been investigated by the photoluminescence(PL) at 10 K. The native defects of $V_{CU}$, $V_{Se}$, $CU_{int}$, and $Se_{int}$, obtained by PL measurements were classified as a donors or accepters type. And we concluded that the heat-treatment in the Cu-atmosphere converted $CuGaSe_2$ single crystal thin films to an optical n-type. Also, we confirmed that Ga in $CuGaSe_2/GaAs$ did not form the native defects because Ga in $CuGaSe_2$ single crystal thin films existed in the form of stable bonds.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2005년도 추계학술대회 논문집 Vol.18
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• pp.111-112
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• 2005

To obtain the single crystal thin films, $CuInSe_2$, mixed crystal was deposited on thoroughly etched semi-insulating GaAs(100) substrate by the hot wail epitaxy (HWE) system. The source and substrate temperatures were 620$^{\circ}C$ and 410$^{\circ}C$, respectively. The crystalline structure of the single crystal thin films was investigated by the photoluminescence and double crystal X-ray diffraction (DCXD). The carrier density and mobilily of $CuInSe_2$ single crystal thin films measured with Hall effect by van der Pauw method are $9.62\times10^{16}$ $cm^{-3}$ and $296cm^2/V{\cdot}s$ at 293 K, respectively. The temperature dependence of the energy band gap of the CulnSe$_2$ obtained from the absorption spectra was well described by the Varshni's relation E$_g$(T) = 1.1851 eV - ($8.99\times10^{-4}$ ev/K)T$_2$/(T + 153K). After the as-grown $CuInSe_2$ single crystal thin films was annealed in Cu-, Se-, and In-atmospheres the origin of point defects of $CuInSe_2$ single crystal thin films has been investigated by the photoluminescence(PL) at 10 K. The nat ive defects of V$_{Cu}$, $V_{Se}$, Cu$_{int}$, and $Se_{int}$ obtained by PL measurements were classified as a donors or accepters type. And we concluded that the heat-treatment in the Cu-atmosphere converted $CuInSe_2$ single crystal thin films to an optical n-type. Also, we confirmed that In in $CuInSe_2$/GaAs did not form the native defects because In in $CuInSe_2$ single crystal thin films existed in the form of stable bonds.

• 공업화학
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• 제28권5호
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• pp.547-553
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• 2017

본 연구는 $TiO_2$ 골격에 Pd을 삽입시켰을 때 나타나는 광 촉매 성능의 차이에 초점을 두고, $TiO_2$와 x mol% $Pd-TiO_2$(x = 0.25, 0.5, 0.75 그리고 1.0)의 5가지 촉매를 제안하였다. 전형적인 졸-겔 방법을 사용하여 촉매를 합성하고 각 촉매의 페놀 광 분해 성능을 평가하였다. XRD, TEM, SEM/EDS, UV/Vis 분광법, 광 발광 분광법 등을 이용하여 촉매의 물리화학적 특성을 확인하였고, 광 발광 분광법 및 광 전류 측정으로 광학적 특성을 확인하였다. Pd 이온을 첨가하면 촉매의 밴드 갭이 감소하고, 광 생성된 전자와 정공 사이의 전하 분리가 쉽게 발생한다. 결과적으로, 0.75 mol% $Pd-TiO_2$ 촉매상의 페놀 광 분해 성능은 순수한 $TiO_2$보다 3배 더 높았는데, 이는 광 촉매 반응 중에 Pd 이온이 전자캡쳐 역할을 하여 일어난 결과로 여겨진다.

• 대한전자공학회논문지SD
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• 제47권2호
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• pp.15-20
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• 2010

본 연구에서는 RF magnetron sputtering법으로 기판온도 $200^{\circ}C$에서 공정 압력 (5~20 mTorr)과 산소 가스비 (0~3%)를 변화시켜가며 PES 플라스틱 기판 위에 AZO (Al:3wt%) 박막을 제작하여 광학적 및 전기적 특성을 조사하였다. XRD 측정을 통해 공정 조건에 관계없이 모든 AZO박막이 c 축으로 우선 성장함을 확인할 수 있었다. 박막의 표면을 AFM 으로 조사한 결과, 표면 거칠기 값은 공정압력 5 mTorr, 산소 가스비 3%에서 제작한 박막에서 가장 낮은 값 (3.49 nm) 을 나타내었다. 모든 AZO 박막이 가시광 영역에서 80% 정도의 투과율을 보였으며, 공정 압력과 산소 가스비가 감소할수록 에너지 밴드갭이 증가하는 Burstein-Moss 효과를 관찰할 수 있었다. Hall 측정 결과, 공정 압력 5 mTorr와 산소 가스비 0%에서 제작한 AZO 박막에서 가장 높은 캐리어 농도 $2.63\;{\times}\;10^{20}\;cm^{-3}$ 값과 가장 낮은 비저항 $4.35\;{\times}\;10^{-3}\;{\Omega}cm$ 값을 나타내었다.