• Title/Summary/Keyword: Optical Interferometer

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The Measurements of Vibration Displacement of the Piezoelectric Exciter Using Mach-Zehnder Optical Fiber Interferometer (Mach-Zehnder 광섬유 간섭계를 이용한 압전형 진동발생기의 동특성 조사)

  • Cho, Seung-Il;Kim, Sung-Boo;Lee, Jong-Kyu;Lee, Yong-Bong;Lee, Doo-Hee
    • Transactions of the Korean Society for Noise and Vibration Engineering
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    • v.16 no.10 s.115
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    • pp.1044-1049
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    • 2006
  • The vibration exciter with the accurate calibration requires a low distortion along a single axis over a wide range of frequency. The fabricated piezoelectric exciter was composed of a base, piezoelectric element(Venitron PZT 5A), electrode and seismic mass. Its performance characteristics is evaluated the Mach-Zehnder optical fiber interferometer. The phase of the optical wave passing through the optical fiber around the piezoelectric element was related the vibrational amplitude with a change of the applied sinusoidal voltage on the piezoelectric element. The dynamic characteristics of vibration exciter can be obtained by measuring the vibrational amplitude with a sinusoidal applied voltage on the piezoelectric element. The sensitivity of the fabricated piezoelectric exciter had a 0.4 nm/V which was uniform up to 20 kHz.

Study on Optical Feedback in Optical Fiber Laser (광섬유 레이저에서의 광궤환에 대한 연구)

  • Choi, Kyoo-Nam
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.11 no.5
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    • pp.985-990
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    • 2007
  • The method of enhancing visibility in optical fiber sensor was investigated by improving coherence length of light source. The optical feedback technique is used to enhance coherence length in fiber laser which generates laser in near infrared wavelength region and utilizes low loss characteristics of optical communication grade fiber. In this paper, the effect to coherence length by short and long optical feedback paths are investigated by using Mach-Zehnder interferometer technique. The effect to coherence length by changing optical feedback power and optical modulation are investigated. The spectral drift was calculated by measuring the degree of phase perturbation in unbalanced Mach-Zehnder interferometer having loom path difference. The short optical feedback path was effective to reduce spectral drift to 450kHz/sec and the long optical feedback path in combination with short optical feedback path was found to further reduce spectral drift to 50kHz/sec.

A Study on Assembly and Evaluation of SIL optical Head for surface Recording of SIL based NFR (고체침지렌즈 기반 근접장 표면 기록을 위한 고체침지렌즈 광학 헤드의 조립 및 평가에 대한 연구)

  • Min, Cheol-Ki;Kim, Tae-Seob;Yoon, Yong-Joong;Park, No-Cheol;Park, Young-Pil
    • Transactions of the Society of Information Storage Systems
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    • v.4 no.1
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    • pp.19-22
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    • 2008
  • For the assembly and evaluation of solid immersion lens (SIL) optical head which is the key component of SIL based near field recording (NFR) technology, we modify the Twyman-Green interferometer. Super-hemisphere SIL optical head for the surface recording is assembled and evaluated by the modified Twyman-Green interferometer. In order to verify the optical performance of the assembled SIL optical head, we compare the measured results of the SIL optical head with the simulation ones. Finally, we show the feasibility of applying the assembled SIL optical head to near field recording system by the experiment of the dynamic gap control based on test bed.

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Final Diffraction Patterns of the Beam Splitters used in the Soft XRay Interferometer by a He-Ne Laser

  • Oh, Chul-Han;Choi, Dae-Uk;Park, Sung-Jin;Howells, M.R.;Moller, E.J.
    • Journal of the Optical Society of Korea
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    • v.4 no.1
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    • pp.7-10
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    • 2000
  • The soft x-ray(10nm-100nm) interferometer is a modified Mach-Zehnder type interferometer and it consists of two beam-splitters and four totally reflecting mirrors. The beam-splitters used here are 50% transmission and 50% reflection grating type. The diffraction patterns of beam splitters(1st B.S.) were investigated with a He-Ne laser. The diffraction patterns produced by the soft x-ray interferometer (2nd B.S.) were also investigated in intensities positions. The diffraction patterns of 20 degree grazing incidence on the beam splitters(1st B.S.) show a circular array of spots. Both the reflected and the transmitted beams show the same patterns but symmetric circles on the screen. The maximum intensity appears roughly when n is in the zeroth and odd orders and the suppressed peak(missing order) appears when n is in even orders. Intensities of 3 center fringes(n = 0, $\pm$1) are stronger than others. These results confirm the reduced grating equation and make agree with the intensity distribution function. It was found that the final patterns produced by the soft x-ray interferometer (2nd B.S.) consisted of fine fringes which were caused by two of three diffraction beams that were arrived at the second beam-splitter.

Image Encryption Using Phase-Based Virtual Image and Interferometer

  • Seo, Dong-Hoan;Kim, Soo-Joong
    • Journal of the Optical Society of Korea
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    • v.6 no.4
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    • pp.156-160
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    • 2002
  • In this paper, we propose an improved optical security system using three phase-encoded images and the principle of interference. This optical system based on a Mach-Zehnder interferometer consists of one phase-encoded virtual image to be encrypted and two phase-encoded images, en-crypting image and decrypting image, where every pixel in the three images has a phase value of '0'and'$\pi$'. The proposed encryption is performed by the multiplication of an encrypting image and a phase-encoded virtual image which dose not contain any information from the decrypted im-age. Therefore, even if the unauthorized users steal and analyze the encrypted image, they cannot reconstruct the required image. This virtual image protects the original image from counterfeiting and unauthorized access. The decryption of the original image is simply performed by interfering between a reference wave and a direct pixel-to-pixel mapping image of the en crypted image with a decrypting image. Computer simulations confirmed the effectiveness of the proposed optical technique for optical security applications.

A Possible Application of the Nonuniform Electric Field Measurement Using Laser Interferometer and Pockels Effect (레이저 간섭계와 포켈스 효과를 이용한 불평등 전계 측정)

  • Gang, Won-Jong;Gu, Ja-Yun
    • The Transactions of the Korean Institute of Electrical Engineers C
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    • v.51 no.6
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    • pp.240-245
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    • 2002
  • In this paper, a novel optical measuring system for the measurement of nonuniform electric field was proposed. The electric field distorted by the discharges was detected through proposed optical measuring system based on the Pockets effect and Mach-Zehnder interferometer. In order to produce distorted electric field, corona discharge was generated from needle-plane electrode in air and detected by optical measuring system. This optical measuring system is constructed by He-Ne laser, single mode optical fiber, $2{\times}2$ 50/50 beam splitter, $LiNbO_3$ Pockets cell, photo detector and PC. In this system, output signal of Pockels sensor is measured by digital oscilloscope and transferred to the PC for recording and statistical processing. Through this paper, a promising possibilities of proto-type optical measuring system were evinced.

Precise Measurement of the change n the optical length of a fiber Fabry-Perot interferometer. (광섬유 Fabry-Perot 간섭계를 이용한 위상 변화량의 정밀 측정)

  • 김영준
    • Proceedings of the Optical Society of Korea Conference
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    • 1989.02a
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    • pp.113-118
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    • 1989
  • By using the single mode optical fiber, we fabricated Fiber-optic Fabry-Perot interferometer (FFPI). The change over a wide range in the optical path length of a FFPI is observed. The temporal movement of the interference fringes by external condition to P.Z. T) is converted to circular motion on an oscilloscope display and then recorded with a micro-computer. The two output voltages of the D/A converters are applied to X and Y terminals of oscilloscope to display circular motion on oscilloscope. Thus the direction of phase shift can be determined with observing the direction of circular motion. The variation of the optical length can be measured by calculating the angle of spot of circle with an accuracy of λ/90 wave length due to variation of temperature in this system 2.7x10-4$^{\circ}C$.

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Measurement and Compensation of Nonlinearity in Homodyne Interferometer (Homodyne 간섭계에서의 비선형성 측정과 보정)

  • Kim, Jong-Yun;Eom, Tae-Bong;Jeong, Kyu-Won;Choi, Tae-Young;Lee, Keon-Hee
    • Journal of the Korean Society for Precision Engineering
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    • v.18 no.9
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    • pp.171-178
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    • 2001
  • The nonlinearity of a laser interferometer usually ranges from sub-nanometer to several manometers. This nonlinearity, which has periodic characteristics, limits the accuracy of the interferometer at the sub-nanometer level. The nonlinearity error of the one-frequency homodyne interferometer with quadrature fringe detection results from a number of factors including polarization mixing by imperfect optical elements, unequal gain of photo detectors, lack of quadrature between two signals and misalignment. In this paper, we described a method for measuring and compensating the nonlinearity of homodyne interferometer using the elliptical fitting technique with least-square method. Experimental results demonstrate that $^\pm$3.5 nm nonlinearity can be reduced to $^\pm$0.2 nm level.

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Two Dimensional Atomic Force Microscope (서브나노급 정밀도의 2 차원 원자현미경 개발)

  • Lee, Dong-Yeon;Gweon, Dae-Gab
    • Proceedings of the KSME Conference
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    • 2008.11a
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    • pp.1778-1783
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    • 2008
  • A compact and two-dimensional atomic force microscope (AFM) using an orthogonal sample scanner, a calibrated homodyne laser interferometer and a commercial AFM head was developed for use in the nanometrology field. The x and y position of the sample with respect to the tip are acquired by using the laser interferometer in the open-loop state, when each z data point of the AFM head is taken. The sample scanner which has a motion amplifying mechanism was designed to move a sample up to $100{\times}100{\mu}m^2$ in orthogonal way, which means less crosstalk between axes. Moreover, the rotational errors between axes are measured to ensure the accuracy of the calibrated AFM within the full scanning range. The conventional homodyne laser interferometer was used to measure the x and y displacements of the sample and compensated via an X-ray interferometer to reduce the nonlinearity of the optical interferometer. The repeatability of the calibrated AFM was measured to sub-nm within a few hundred nm scanning range.

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