• Korean Journal of Optics and Photonics
• /
• v.17 no.2
• /
• pp.136-142
• /
• 2006

This paper presents irradiance distribution model of light radiated from a step-index multimode optical fiber. The model is important in analysis of displacement response characteristics for intensity modulation type optical fiber sensors. The induced model was verified by experimental results. And the displacement response analysis result induced by using the irradiance distribution model was verified by experimental results and compared with using existing irradiance distribution models such as the constant model or the gaussian model. The experiment has better agreement with the analysis result using the induced model in this study than with the others models.

• Journal of the Korea Academia-Industrial cooperation Society
• /
• v.15 no.1
• /
• pp.466-474
• /
• 2014

This paper presents the line contention avoidance experiments with an optical switch, which was selected based on the comparison analysis and evaluation of the various characteristics. For example, the function, structure, strengths and weaknesses of the optical switches. After considering the nonblocking, modularity, upgrade ability and optical power loss of the several kind of the switch fabrics, a switch was selected. The selected switch fabric by using wavelength converters was controlled to avoid contention of the optical lines. In this experiment shows an example of three cases. As a result of this experiment, optical signal shows a changed peek of optical power in output. By showing a peak it confirms that the contention was avoided. By analyzing of changed optical power according to the channel setting time and release time to control of the switch could be determined. If this analysis applied to the network design, economical and efficient structures can be formed.

• Transactions of the Korean Society for Noise and Vibration Engineering
• /
• v.15 no.1 s.94
• /
• pp.29-38
• /
• 2005

The track pull-in behavior analysis in an optical disk drive (ODD) using plane phase and the evaluations for effecting parameters of it are discussed. Track pull-in, track capture procedure to do track following control, is a key factor to increase data transfer rate. First, the relative velocity between the beam spot of an optical pick-up and the target track of an optical disk is analyzed during the track pull-in procedure. In this process, it is showed that the track error signal has nonlinear characteristics which are depending on the time. Second, Runge-Kutta method to solve the nonlinear equation is applied to find the track pull-in behavior, and some optimal parameters to get stable and fast pull-in condition are obtained. Then, the phase plane analysis for track pull-in procedure is presented. Finally, some comments for the simulated results are discussed briefly.

• Proceedings of the Korean Society for Noise and Vibration Engineering Conference
• /
• 2008.04a
• /
• pp.622-625
• /
• 2008

SIL-based optical disk drive will be promising candidate of next-generation storage devices. However, a near-field optical disk drive requires the robustness to external shock because of extremely small gap between SIL and media. Especially, high-level shock damages permanently to SIL and it makes difficulties in general application. To study the likelihood of failure, the shock analysis must be performed over all others. This research explores the dynamic characteristics of rotating disk through FEM which is compared to analytical solution and experimental modal analysis. We also develop the finite element model of an optical disk drive, which includes rubber mounts, sled base, rotating disk and pickup assembly, and simulate the shock response.

• Proceedings of the Korean Vacuum Society Conference
• /
• 2011.02a
• /
• pp.32-32
• /
• 2011

Plasma etching is used in microelectronic processing for patterning of micro- and nano-scale devices. Commonly, optical emission spectroscopy (OES) is widely used for real-time endpoint detection for plasma etching. However, if the viewport for optical-emission monitoring becomes blurred by polymer film due to prolonged use of the etching system, optical-emission monitoring becomes impossible. In addition, when the exposed area ratio on the wafer is small, changes in the optical emission are so slight that it is almost impossible to detect the endpoint of etching. For this reason, as a simple method of detecting variations in plasma without contamination of the reaction chamber at low cost, a method of measuring plasma impedance is being examined. The object in this research is to investigate the suitability of using plasma impedance monitoring (PIM) with statistical approach for real-time endpoint detection of $SiO_2$ etching. The endpoint was determined by impedance signal variation from I-V monitor (VI probe). However, the signal variation at the endpoint is too weak to determine endpoint when $SiO_2$ film on Si wafer is etched by fluorocarbon plasma on inductive coupled plasma (ICP) etcher. Therefore, modified principal component analysis (mPCA) is applied to them for increasing sensitivity. For verifying this method, detected endpoint from impedance analysis is compared with optical emission spectroscopy (OES). From impedance data, we tried to analyze physical properties of plasma, and real-time endpoint detection can be achieved.

• Journal of KIISE:Information Networking
• /
• v.29 no.1
• /
• pp.40-47
• /
• 2002

This paper analyzes the performance of an optical line termination system in ATM based Passive Optical Network(PON) using the operational analysis. We analyze it using system parameters such as utilization, throughput and routing frequency based on the buffer structure in each block of ATM-PON. Furthermore, we derive the mean response time and the visit ratio of each block, and then search the bottleneck block that hinders the system performance. We found that the 622Mbps 16x16 switching block is the bottleneck block for ATM-PON. In this bottleneck block, the loss probability increases rapidly when the cell arrival rate increases.

• Proceedings of the KSME Conference
• /
• 2007.05a
• /
• pp.1288-1293
• /
• 2007

The present study covers the design and analysis of a thermionic scanning electron microscope (SEM) column. The SEM column contains an electron optical system in which electrons are emitted and moved to form a focused beam, and this generates secondary electrons from the specimen surfaces, eventually making an image. The electron optical system mainly consists of a thermionic electron gun as the beam source, the lens system, the electron control unit, and the vacuum unit. In the design process, the dimension and capacity of the SEM components need to be optimally determined with the aid of finite element analyses. Considering the geometry of the filament, a three-dimensional (3D) finite element analysis is utilized. Through the analysis, the beam emission characteristics and relevant trajectories are predicted from which a systematic design of the electron optical system is enabled. The validity of the proposed 3D analysis is also discussed by comparing the directional beam spot radius. As a result, a prototype of a thermionic SEM is successfully developed with a relatively short time and low investment costs, which proves the adoptability of the proposed 3D analysis.

• Current Optics and Photonics
• /
• v.2 no.3
• /
• pp.280-285
• /
• 2018

A new method to design a see-through off-axis head-mounted-display (OA-HMD) optical system with an ellipsoidal surface is proposed, in which a tilted ellipsoidal surface is used as the combiner, which yields the benefits of easier fabrication and testing compared to a freeform surface. Moreover, we realize a coaxial structure in the relay lens group, which is simple and has looser tolerance requirements, thus making assembly easier. The OA-HMD optical system we realize has a simple structure and consists of a combiner and 7 pieces of coaxial relay lenses. It has a $48^{\circ}{\times}36^{\circ}$ field of view (FOV) and 12-mm exit pupil diameter.

• Korean Journal of Optics and Photonics
• /
• v.32 no.6
• /
• pp.266-275
• /
• 2021

In this paper, a method for evaluating optical-system performance and an athermal structure through thermal analysis of the Korsch telescope was studied. In the case of an optical system having a complex asymmetrical structure, there is a limit to implementing the satellite structure by applying the coefficient of thermal expansion (CTE) in the optical-design software, so it is difficult to evaluate the performance of the optical system against temperature changes. To solve this problem, using mechanical design software all length changes were implemented in all structures that affect the optical system according to temperature, and the value of the change in distance between optical components due to temperature change was organized. Also, the values of changes in shape and thickness of the optical components against temperature changes are organized in the optical-design software. All changes derived from both software packages were applied in the optical software to evaluate the performance of the optical system. As a result, it was found that the MTF for a spatial resolution of 71.4 cycles/mm was maintained at more than 25% in the range from 9 ℃ to 33 ℃. In addition, the performance of the optical system applying the improved structure was evaluated, by finding the structure that had the most influence on the optical system's performance change, and deriving an athermal structure to reduce the effect. As a result, it was found that the MTF for a resolution of 71.4 cycles/mm was maintained at over 67% in the range from 9 ℃ to 33 ℃.

• ETRI Journal
• /
• v.34 no.6
• /
• pp.954-957
• /
• 2012

Titanium foils for use in photoelectrochemical devices are treated with a $HNO_3$-HF solution. After this treatment, the optical reflection characteristics of the Ti substrates are markedly increased in terms of not only reflectivity but also optimized wavelength. Furthermore, the "multiple beam interference" theory and optical analysis of surface morphologies clearly verify the origin of the optimized optical reflection properties.