• 한국신뢰성학회지:신뢰성응용연구
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• 제17권1호
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• pp.22-27
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• 2017

Purpose: The purpose of this study is to estimate the life time of OLED TV panel through electric current ADT(Accelerated Degradation Test). Methods: We performed accelerated degradation test for OLED TV Panel at the room temperature to avoid high temperature impact on the luminance. Results: we got more accurately the life time of the OLED TV when we applied ADT without temperature factor than including both current and temperature. Conclusion: Until now, the ADT of the OLED TV has been conducted with temperature and current at the same time for reducing test time and costs. We estimate incorrect life time when the temperature is adopted as an accelerated factor. Due to the high temperature impact on the luminance of the OLED TV panel. So as to solve this problem, we discard temperature and use electric current only.

• 한국표면공학회지
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• 제50권5호
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• pp.398-404
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• 2017

In order to study the AC driving mechanism for OLED lighting, the fluorescent OLEDs were fabricated and the electroluminescent characteristics of the OLEDs by AC forward bias were analyzed. In the case of the driving method of OLED by AC forward bias under the same voltage and the same current density, degradation of luminescent characteristics for elapsed time progressed faster than in the case of the driving method by DC bias. These phenomena were caused by the peak voltage of AC forward bias which is ${\sqrt{2}}$ times higher than the DC voltage. In addition, the degradation of the OLED was accelerated because the AC forward bias had come close to the upper limit of the allowable voltage range even though the peak voltage didn't exceed the allowable range of the OLED. However, the fabricated fluorescent OLED showed little degradation of OLED characteristics due to AC forward bias from 0 V to 6.04 V. Therefore, OLED lighting by AC driving will become commercialized if sufficient luminance is realized at a voltage at which the characteristics of the OLED are not degradation by the AC driving method.

• 한국신뢰성학회지:신뢰성응용연구
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• 제16권4호
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• pp.356-363
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• 2016

Purpose: The purpose of this study is to propose efficiency of equipment testing the luminance degradation of OLED. Methods: The degradation model of Exponential model and Stretched exponential model is analyzed by goodness of fit test using calculated R-square. The degradation model having the higher R-square is finally selected. Scale parameter and Shape parameter using the selected degradation model is estimated. The activation energy and current density n using peck model among the accelerated model is estimated. the estimated parameters are analyzed by t-test. Results: The results of t-test show that the estimated parameters on chamber and hotplate are equal statistically. we can know the similarity of the luminance degradation rate and degradation pattern on chamber and hotplate. Conclusion: The result of the degradation test on chamber and hotplate is similar. when the accelerated degradation test on the panel of the OLED TV is performed, hotplate is requiring less samples, time and cost than chamber. so the accelerated degradation test on the panel of the OLED TV using the hoplate is efficient of time and cost.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2008년도 춘계학술대회 및 기술 세미나 논문집 디스플레이 광소자
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• pp.47-48
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• 2008

본 연구는 제작된 OLED 소자에 UV의 조사시간에 따른 PL intensity 의 감소와 UV power에 따른 PL degradation 변화에 따라 적절한 UV의 조사조건을 찾아 OLEO 소자의 사진이미지를 구현하고자 하였다. 이러한 조건들로부터 얻어진 OLED 소자의 사진이미지 구현을 통하여 그동안 문제점으로만 여겨졌던 UV에 의한 PL degradation 현상이 문제점만이 아닌 다른 하나의 장점으로 발전되어 다른 분야에서 적용될 수 있다고 기대해본다.

• 한국전기전자재료학회논문지
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• 제37권3호
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• pp.309-313
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• 2024

The key to determining the lifetime of OLED device is how much brightness can be maintained. It can be said that there are internal and external causes for the degradation of OLED devices. The most important cause of internal degradation is bonding and degradation in the excited state due to the electrochemical instability of organic materials. The structure of OLED modeled in this paper consists of a cathode layer, electron injection layer (EIL), electron transport layer (ETL), light emission layer, hole transport layer (HTL), hole injection layer (HIL), and anode layer on a glass substrate from top to bottom. It was confirmed that the temperature generated in OLED was distributed around the maximum of 343.15 K centered on the emission layer. It can be seen that the heat distribution generated in the presented OLED structure has an asymmetrically high temperature distribution toward the cathode, which is believed to be because the sizes of the cathode and positive electrode are asymmetric. Therefore, when designing OLED, it is believed that designing the structures of the cathode and anode electrodes as symmetrically as possible can ensure uniform heat distribution, maintain uniform luminance of OLED, and extend the lifetime. The thermal distribution of OLED was analyzed using the finite element method according to Comsol 5.2.

• 한국정보디스플레이학회:학술대회논문집
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• 한국정보디스플레이학회 2007년도 7th International Meeting on Information Display 제7권2호
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• pp.1108-1111
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• 2007

OLED driving voltage shift can reduce the OLED display lifetime, especially for digitally driven AMOLED. By operating OLED at high frequency, we were able to suppress OLED voltage shift degradation, expecting improved AMOLED lifetime. We describe frequency dependence of voltage shift obtained from bias stress test of OLED.

• 한국정보디스플레이학회:학술대회논문집
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• 한국정보디스플레이학회 2008년도 International Meeting on Information Display
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• pp.473-476
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• 2008

A simple voltage compensation pixel circuit for AMOLED is produced using low temperature polycrystalline silicon (LTPS) technology. Its operation is verified by AIM-SPICE. Simulation results show that the pixel circuit has high immunity to variation of LTPS-TFT and reduces the drop in luminance due to the degradation of the OLED.

• 한국정보디스플레이학회:학술대회논문집
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• 한국정보디스플레이학회 2008년도 International Meeting on Information Display
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• pp.1022-1025
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• 2008

To the best of our knowledge, for the first time, we applied impedance spectroscopy to analysis on OLED degradation mechanism by monitoring impedance change during constant voltage aging, and modeling OLED with lumped circuit elements. Change in each element value was used to explain charge accumulation and field redistribution in each organic layer.

• Transactions on Electrical and Electronic Materials
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• 제13권2호
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• pp.93-97
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• 2012

In this study, the fabrication and the characteristic analyses of OLED using in-situ passivation are investigated. OLEDs represent a disadvantage in decreasing its life due to the degradation caused by the penetration of moisture and oxygen. After the fabrication of OLED, an in-situ passivation method for inorganic thin films is developed. A process that uses PECVD method which can apply a vapor deposition process at room temperature is also developed. Changes in the degradation and electric characteristics of OLEDs are also analyzed by applying $SiO_2$ and SiNx thin films to OLED as a passivation layer. By applying the fabricated thin film to OLEDs as a passivation layer, the moisture penetration in a single layer film is ensured below $1{\times}10^{-2}\;g/m^2.day$. This leads to the improvement of such degradation characteristics in the application of multilayer films.

• 한국정보디스플레이학회:학술대회논문집
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• 한국정보디스플레이학회 2009년도 9th International Meeting on Information Display
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• pp.466-469
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• 2009

The life time of AMOLED displays has been dependent on OLED materials up to this point. In particular, image sticking (burn-in) has been one of the most critical issues for AMOLEDs. This paper proposes image sticking compensation AMOLED pixel circuits to address the problem without requiring process or material improvements to the OLED itself. We verified the performance of those circuits by simulation and actual panel implementation.