• 제목/요약/키워드: NI-VXI

검색결과 1건 처리시간 0.014초

ROM 데이터 추출을 통한 결함검출 시스템 (Fault Detection System by the Extracting the ROM's Data)

  • 정종구;지민석;홍교영;안동만;홍승범
    • 한국항공운항학회지
    • /
    • 제19권4호
    • /
    • pp.18-23
    • /
    • 2011
  • Generally, the digital circuit card can be tested by automatic test equipment using LASAR(Logic Automated Stimulus and Response). This paper proposes the ROM data extracting algorithm which can test the digital circuit card that consists usually ROMs. We are implemented of the proposed fault detecting program by LabWindow/CVI 8.5 and the digital automatic test instrument with NI-VXI(National Instrument - Versa Bus Modular Europe eXtentions for Instrumentation) card. We also make an interface circuit board connecting the digital test instrument and the digital circuit card. It shows the good performance of getting the data from ROMs.