• The Journal of Korean Institute of Electromagnetic Engineering and Science
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• v.15 no.2
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• pp.121-126
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• 2004

This paper presents an SAR-data calibration technique using a well-calibrated scatterometer. At first a fully-polarimetric antenna pattern(magnitude and phase) of the antenna main-beam using a conducting sphere was measured. Then, this data were used to calibrate polarimetrically an auto-mounted network analyzer-based scatterometer system. This scatterometer system can be used to measure the accurate Mueller matrices of earth surfaces such as grass fields, rice fields and bare soil surfaces; i.e., the phase-difference parameters can be obtained as well as the radar scattering coefficients. If a polarimetrically calibrated scatterometer is operated at the same time with the SAR system, the scatterometer data can be used to correct the SAR data, especially the phase-difference parameters. It was found that the correction effect is remarkable for the degree of correlation ${\alpha}$, which is one of the phase-difference parameter, while the correction effect is negligible for the magnitude parameters(backscattering coefficients).

• Proceedings of the Korean Society Of Semiconductor Equipment Technology
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• 2003.12a
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• pp.12-17
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• 2003

We develop Mueller-matrix spectroscopic ellipsometry based on dual compensator configuration. This technique is very powerful for measuring surface anisotropy in nano-scale, especially when materials show depolarization. Dual-rotating compensator configuration is adopted with the rotational ratio of 5:3 originally developed by Collins et al [1]. The instrument can provide 250-point spectra over the wavelength range from 230 nm to 820 nm in one irradiance waveform with minimum acquisition time of $Tc{\approx}10 s$. In this work, the results obtained in transmission modes are presented for the initial attempt. We present calibration procedures to diagnose the system from the utilize data collected in transmission mode without sample. We expect that the instrument will have important applications in thin films and surfaces that have anisotropy and inhomogeneity.

• Current Optics and Photonics
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• v.7 no.4
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• pp.428-434
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• 2023

The compensators used in spectroscopic ellipsometers are usually assumed to be ideal linear waveplates. In reality, however, they are elliptical waveplates, because they are usually made by bonding two or more linear waveplates of different materials with slight misalignment. This induces systematic error when they are modeled as linear waveplates. We propose an improved calibration method based on an optical model that regards an elliptical waveplate as a combination of a circular waveplate (rotator) and a linear waveplate. The method allows elimination of the systematic error, and the residual error of optic axis measurement is reduced to 0.025 degrees in the spectral range of 450-800 nm.

• Korean Journal of Optics and Photonics
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• v.25 no.1
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• pp.29-37
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• 2014

We have studied and demonstrated general, systematic error-correction methods for a dual rotating quarter-wave plate ellipsometer. To estimate and correct 5 systematic error sources (three offset angles and two unexpected retarder phase delays), we used 11 of the 25 Fourier components of the ellipsometry signal obtained in the absence of an optical sample. Using these 11 Fourier components, we can determine the errors from the 5 sources with nonlinear optimization methods. We found systematic errors ${\epsilon}_3$, ${\epsilon}_4$, ${\epsilon}_5$) are more sensitive to the inverted Mueller matrix than retarder phase delay errors (${\epsilon}_1$, ${\epsilon}_2$) because of their small condition numbers. To correct these systematic errors we have found that error of any variety must be less than 0.05 rad. Finally, we can use the magnitudes of these errors to correct the Mueller matrix of optical components. From our experimental ellipsometry signals, we can measure phase delay and the rotational angular position of its fast axis for a half-wave plate.

• Korean Journal of Optics and Photonics
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• v.26 no.1
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• pp.9-16
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• 2015

We have developed ellipsometry lidar and measured aerosol and ice-cloud characteristics. To measure a full normalized backscattering phase matrix (NBSPM) composed of nine elements, we have designed an optical system with three kinds of transmission and three kinds of reception, composed of ${\lambda}/2$ waveplate, ${\lambda}/4$ waveplate and empty optic. To find systematic optical errors, we used clean day middle-altitude (4-6km) lidar signals for which the aerosol's concentration was small and its orientation chaotic. After calibrating our lidar system, we have calculated NBSPM elements scattered from an aerosol and from an ice cloud. In the case of an aerosol, we found that the off-diagonal values $m_{12},{\ldots},m_{34}$ of the NBSPM are smaller than those for a cirrus cloud. Also, the off-diagonal values of the NBSPM from a cirrus cloud depend on atmospheric conditions.

• Proceedings of the KSRS Conference
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• 2008.10a
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• pp.29-32
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• 2008

In this paper, we propose one unsupervised classification technique using the degree of polarization (DoP) and the co-polarized phase-difference (CPD) statistics, instead of the entropy and alpha. It is shown that the DoP is closely related to the entropy, and the CPD to the alpha. The DoP explains the feature how much the effect of multiple reflections is contained. Hence, the DoP could be used as an important factor for classifying classes. The CPD can also be computed from the measured Mueller matrix elements. For the smooth surface scattering, the CPD is about $0^{\circ}$, and for dihedral-type scattering, the CPD is about $180^{\circ}$. A DoP-CPD diagram with appropriate boundaries between six different classes is developed based on the SAR image. The classification results are compared with the existing Entropy-alpha diagram as well as the IPL-AirSAR polarimetric data. The technique may have capability to classify an SAR image into six major classes; a bare surface, a village, a crown-layer short vegetation canopy, a trunk-layer short vegetation canopy, a crown-layer forest, and a trunk-dominated forest. Based on the DoP and CPD analysis, a simple three-component decomposition technique was also proposed.