The Vertical Field Analysis within the Strong Inversion of MOS FET using the Multi-box Segmentation Technique (다중BOX분할기법을 이용한 MOS FET의 강반전층내에서의 수직전계해석)
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- The Journal of Korean Institute of Communications and Information Sciences
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- v.25 no.8B
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- pp.1469-1476
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- 2000