• Applied Microscopy
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• 제42권4호
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• pp.223-227
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• 2012

Focused Ion Beam (FIB) systems have incorporated versatile nanomanipulators with inherent sophisticated machining capability to characterize the electrical properties of highly miniature components of electronic devices. Carbon fibers were chosen as a model system to test the applicability of nanomanipulators to microscale electronic materials, with special emphasis on the direct current current-voltage characterizations in terms of electrode configuration. The presence of contact resistance affects the electrical characterization. This resistance originates from either i) the so-called "spreading resistance" due to the geometrical constriction near the electrode - material interface or ii) resistive surface layers. An appropriate electrode strategy is proposed herein for the use of FIB-based manipulators.

• 한국수소및신에너지학회논문집
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• 제24권5호
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• pp.401-412
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• 2013

The paper is to study on the simulation of the micro/macroscale thermo-electrochemical model of a single cell of anode-supported SOFC with direct internal reforming. The coupled heat and mass transport, electrochemical and reforming reactions, and fluid flow were simultaneously simulated based on mass, energy, charge conservation. The micro/macroscale model first calculates the detailed electrochemical and direct internal reforming processes in porous electrodes based on the comprehensive microscale model and then solve the macroscale processes such as heat and mass transport, and fluid flow in SOFCs with assumption of fully-developed flow in gas channel. The simulation results evaluate the overall performance by analyzing distributions of mole fraction, current density, temperature and microstructural design in co/counter flow configurations.