• Journal of the Optical Society of Korea
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• v.18 no.6
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• pp.766-771
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• 2014

Single-ring all-pass filters with various coupling ratios are designed, fabricated, and characterized to assess the validity of the split-step time-domain modeling approach, which is considered for direct simulation of time-domain characteristics, such as optical delay, of various ring resonator devices. When the coupling ratio of the single-ring all-pass filter is 0.4 and 0.8, the delay time is measured to be about 145 and 42 ps respectively, which is comparable to the time-domain modeling results of 151 and 47 ps respectively. The measurements for two- and three-ring all-pass filters are also found to agree quite well with the simulation results. With these results it is confirmed that the split-step time-domain model could be efficiently incorporated into an optical-communication simulation module for ring resonator delay components in an all-optical packet switching system.

• 제어로봇시스템학회:학술대회논문집
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• 2005.06a
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• pp.1571-1576
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• 2005

DCS has many processing components and various communication elements. And its communication delay characteristic is affected diverse operating situation and context. Especially, binding signal which traversed from one control-node to another control-node undergo all sort of delay conditions. So its delay value has large deviation with the lapse of time, and the measurement of delay statistics during long time is very difficult by using general oscilloscope or other normal instruments. This thesis introduces the design and implementation of PC-based BDAS(Binding Delay Analysis System) System developed to overcomes these hardships. The system has signal-generator, IO-card, data-acquisition module, delay-calculation and analyzer module, those are implemented on industrial standard PC/Ethernet hardware and Windows/Linux platforms. This system can detect accurate whole-system-wide delay time including io, control processing and network delay, in the resolution of msec unit, and can analyze each channel's delay-historic data which is maintained by realtime database. So, this system has strong points of open system architecture, for example, user-friendly environment, low cost, high compatibility, simplicity of maintenance and high extension ability. Of all things, the measuring capability of long-time delay-statistics obtained through historic-DB make the system more valuable and useful, which function is essential to analyze accurate delay performance of DCS system. Using this system, the verification of delay performance of DCS for nuclear power plants is succeeded in KNICS(Korea Nuclear Instrumentation & Control System) projects

• Journal of Navigation and Port Research
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• v.35 no.8
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• pp.619-624
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• 2011

A significant factor limiting the ranging accuracy of Loran (Long Range Navigation) signal is the additional secondary factor (ASF) in the time of arrival (TOA) measurements. Precise ASF values are essential if Loran deliver the high absolute accuracies demanded for aircraft approach, maritime harbour entrance. We measured the absolute propagation delay between Pohang Loran signal and Loran receiver output signal by comparing with Cesium atomic clock. In this study we measured ASFs between Pohang 9930M station and the 12 measurement points in the Yeongil Bay by using the measurement technique of absolute time delay. The measurement points were spaced at interval of 3 km by 3 km. An E-field antenna and an H-field antenna were used to improve the accuracy of ASF measurements and a DGPS (Differential GPS) receiver was used for accurate positions. We have gotten the result that the measured ASFs were compared with the predicted ASFs through this measurement technique.

• Nuclear Engineering and Technology
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• v.54 no.12
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• pp.4644-4651
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• 2022

Due to its short half-life, thoron gas has been assumed to have negligible health hazards on humans compared to radon. But, one of the decay products with a long half-life can make it to be transported to a long distance and to cause a severe internal dose through respiration. Since most commercial radon detectors can not discriminate thoron signals from radon signals, it is very common to overestimate radon doses which in turn result in biased estimation of lung cancer risk in epidemiological studies. Though some methods had been suggested to measure thoron and radon separately, they could not be used for real-time measurement because of CR-39 or LR-115. In this study, an effective method was suggested to measure radon and thoron separately from the free air. It was observed that the activity of thoron decreases exponentially due to delay time caused by a long pipe between two chambers. Therefore from two ion chambers apart in time, it was demonstrated that thoron and radon could be measured separately and simultaneously. We also developed a collimated alpha source and with this source and an SBD, we could convert the ion chamber reading to count rate in cps.

• Explosives and Blasting
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• v.32 no.3
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• pp.18-25
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• 2014

Ground vibration and noise from blasting operation are known to be the most representative constituents which can cause human and material damage. In this study, the effect of delay time on ground vibration is investigated by adopting seven different delay times in bench blasting. For each delay time, three blasting operations were performed. The prediction equations for blasting vibration are derived from 50 sets of measurement and the time theory of Langefors is evoked in the analysis of the blasting vibrations and frequencies. For the delay times of 8 ms and 28 ms, the average values of ground vibration are 5.76 cm/sec and 5.75 cm/sec, respectively, which are considerably low. Also the cyclic variation in the vibration measurements with the delay time confirms the interference effect. From the application of the measurements of blasting vibration and frequency to the time theory of Langefors, it is concluded that the optimum delay times are 8 ms and 24 ms for the test site.

• Journal of the Korean Society of Safety
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• v.1 no.1
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• pp.33-40
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• 1986

The results from a study on the combustion of the ferrosilicon-miniun delay powder which was examined under the various conditions are as follows. 1. It has been found that in case of these delay powders, decomposition of oxidiging agents occurs first and then reducing agents are oxidized by the gases evolved from the oxidizing agents and by the oxygen in air. Therefore, the main reactions are heterogenous reaction and especially He gas phase plays an important role in combustion reactions of delay Powders. 2. In case the loading pressure is below 100kg per a detonator, the dispresion of burning time is large. 3. Little or no increase in humidity was observed on daily measurement during six month preservation tests. 4. The amperage of electric current for igniting the fuse head has no effect on the burning time of delay conposition itself changed in the detonator.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2016.05a
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• pp.693-695
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• 2016

A random and systematic jitter suppressed DLL is presented. The AC averages the delay time of successive delay stages and equalizes the delay time of all delay stages. Measurement results of the DLL-based clock generator fabricated in a one-poly six-metal $0.18{\mu}m$ CMOS process shows 13.4-ps rms jitter.

• Journal of the Korean Society for Nondestructive Testing
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• v.28 no.6
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• pp.512-518
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• 2008

Guided wave technology is advantageous for fast inspection of pipe wall thinning since the guided wave propagates long distance. In this investigation, the method to evaluate gradual wall thinning in a pipe based on the arrival time delay with magnetostrictive patch transducers is presented. Low frequency A0 Lamb waves were generated and measured by the present transducer and it was applied to arrival time delay measurement experiments on a test pipe having gradual wall thinnings artificially manufactured. From experiments, consistent results that wall thinning increases the arrival time delay of A0 waves were obtained. Consequently, the feasibility of the magnetostrictive patch transducers to evaluate wall thinning was verified.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2001.11b
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• pp.176-180
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• 2001

There are several factors causing re-work in CMP process such as improper polish time calculation by operator. removal rate decline of the polisher, unstable in-suit pad conditioning, slurry supply module problem and wafer carrier rotation inconsistancy. And conclusively those fundimental reason for the re-work rate increasement is mainly from the cycle time delay between wafer polish and post measurement. Therefore, Wafer thickness measurement in wet condition could be able to remove those improper process conditions which may happen during the process in comparison with the conventional dried wafer measurement system and it can be able to reduce the CMP process cycle time. CMP scrap reduction by overpolish, re-work rate reduction, thickness control efficiency also can be easily achieved. CMP Equipment manufacturer also trying to develop integrated system which has multi-head & platen, cleaner, pre & post thickness measure and even control the polish time from the calculated removal rate of each polishing head by software. CMP re-work problem such as over & under polish by target thickness may result in the cycle time delay. By reducing those inefficient factors during the process and establish of the automatic process control, CLC system need to be adopted to maximize the process performance. Wafer to Wafer Polish Time Feed Back Control by measuring the wafer right after the polish shorten the polish time calculation for the next wafer and it lead to the perfact Post CMP target thickness control capability. By Monitoring all of the processed the wafer, CMP process will also be stabilize itself.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2001.11a
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• pp.176-180
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• 2001

There are several factors causing re-work in CMP process such as improper polish time calculation by operator, removal rate decline of the polisher, unstable in-suit pad conditioning, slurry supply module problem and wafer carrier rotation inconsistency. And conclusively those fundimental reason for the re-work rate increasement is mainly from the cycle time delay between wafer polish and post measurement. Therefore, Wafer thickness measurement in wet condition could be able to remove those improper process conditions which may happen during the process in comparison with the conventional dried wafer measurement system and it can be able to reduce the CMP process cycle time. CMP scrap reduction by overpolish, re-work rate reduction, thickness control efficiency also can be easily achieved. CMP Equipment manufacturer also trying to develop integrated system which has multi-head & platen, cleaner, pre & post thickness measure and even control the polish time from the calculated removal rate of each polishing head by software. CMP re-work problem such as over & under polish by target thickness may result in the cycle time delay. By reducing those inefficient factors during the process and establish of the automatic process control, CLC system need to be adopted to maximize the process performance. Wafer to Wafer Polish Time Feed Back Control by measuring the wafer right after the polish shorten the polish time calculation for the next wafer and it lead to the perfect Post CMP target thickness control capability. By Monitoring all of the processed the wafer, CMP process will also be stabilize itself.