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Kim D.I.;Huh Y.H.;Kee C.D.
- Proceedings of the Korean Society of Precision Engineering Conference
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- 2005.06a
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- pp.1442-1445
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- 2005
Several test methods, including micro strain/deformation measurement techniques, have been studied to more reliably measure the micro properties in micro/nano materials. Therefore, in this study, the continuous measurement of in-plane tensile strain in micro-sized specimens of thin film materials was introduced using the micro-ESPI technique. TiN and Au thin films 1 and $0.47\;\mu{m}$ thick, respectively, were deposited on the silicon wafer and fabricated into the micro-sized tensile specimens using the electromachining process. The micro-tensile loading system and micro-ESPI system were developed to measure the tensile strain during micro-tensile test. The micro-tensile stress-strain for these materials was determined using the algorithm for continuous strain measurement. Furthermore, algorithm for enhancing the sensitivity to measurement of in-plane tensile strain was suggested. According to the algorithm for enhancement of sensitivity, micro-tensile strain data between interfringe were calculated. It is shown that the algorithm for enhancement of the sensitivity suggested in this study makes the sensitivity to the in-plane tensile strain increase.
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Yang, Jong-Seok;Lee, Kyoung-Yong;Shin, Dong-Hoon;Park, Dae-Hee
- The Transactions of the Korean Institute of Electrical Engineers C
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- v.55 no.11
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- pp.514-519
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- 2006
To improve the mean-life and the reliability of power cable, we have investigated specific heat (Cp) and thermal conductivity of XLPE insulator and semiconducting materials in 154[kV] underground power transmission cable. Specimens were made of sheet form with the seven of specimens for measurement. Specific heat (Cp) and thermal conductivity were measured by DSC (Differential Scanning Calorimetry) and Nano Flash Diffusivity. Specific-heat measurement temperature ranges of XLPE insulator were from $20[^{\circ}C]\;to\;90[^{\circ}C]$, and the heating rate was $1[^{\circ}C/min]$. And the measurement temperatures of thermal conductivity were $25[^{\circ}C],\;55[^{\circ}C]\;and\;90[^{\circ}C]$. In case of semiconducting materials, the measurement temperature ranges of specific heat were from $20[^{\circ}C]\;to\;60[^{\circ}C]$, and the heating rate was $1[^{\circ}C/min]$. And the measurement temperatures of thermal conductivity were $25[^{\circ}C]\;and\;55[^{\circ}]C$. From these experimental results both specific heat and thermal conductivity were increased by heating rate because volume of materials was expanded according to rise in temperature. We could know that a small amount of CNT has a excellent thermal properties.
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