• Title/Summary/Keyword: Lock-In Thermography

Search Result 49, Processing Time 0.026 seconds

Development of LabVIEW Program for Lock-In Infrared Thermography (위상잠금 열화상장치 제어용 랩뷰 프로그램 개발)

  • Min, Tae-Hoon;Na, Hyung-Chul;Kim, Noh-Yu
    • Journal of the Korean Society for Nondestructive Testing
    • /
    • v.31 no.2
    • /
    • pp.127-133
    • /
    • 2011
  • A LabVIEW program has been developed together with simple infrared thermography(IRT) system to control the lock-in conditions of the system efficiently. The IR imaging software was designed to operate both of infrared camera and halogen lamp by synchronizing them with periodic sine signal based on thyristor(SCR) circuits. LabVIEW software was programmed to provide users with screen-menu functions by which it can change the period and energy of heat source, operate the camera to acquire image, and monitor the state of the system on the computer screen. In experiment, lock-in IR image for a specimen with artificial hole defects was obtained by the developed IRT system and compared with optical image.

Recent Advancement and Development on Infrared thermography Technique (적외선 열화상 기술의 최신 연구 동향과 발전 현황)

  • Kim, Hyo-Jong;Kim, Jeong-Guk;Kim, Nam-Po
    • Proceedings of the KSR Conference
    • /
    • 2011.05a
    • /
    • pp.1109-1117
    • /
    • 2011
  • All objects emit infrared above absolute temperature 0K. Infrared thermography is one of the nondestructive testing technologies to measure the temperature of the object. Infrared thermography shows infrared image which in a longer wavelength than visible light. Infrared technology can be employed regardless of the type or state of the objects. Thus, infrared thermography technique has been used in a wide variety of manufacturing processes in areas such as mechanical, electrical, chemical and medical applications. The advancement of using infrared technology has been increasing. In this paper, the principle of lock-in infrared thermography and its applications were investigated, and the direction of future development was discussed.

  • PDF

Nondestructive Evaluation of Defect Size by Using a Contrast Parameter of Infrared Image (적외선 열화상 이미지 컨트라스트 파라미터를 이용한 결함 크기의 비파괴 평가)

  • Choi, Jungyoung;Choi, Sooyoung;Kim, Jaeyeon;Yoo, Kitae;Park, Jaiwon;Hyun, Changyong;Byeon, Jaiwon
    • Journal of Applied Reliability
    • /
    • v.18 no.1
    • /
    • pp.87-94
    • /
    • 2018
  • Purpose: In this study, the defect quantification of thin metal plate was evaluated by using lock-in infrared thermography. Methods: A STS304 standard specimens, which had the artificial-defects of different size, were used. The focal distance between the infrared camera and the specimen was set to 500mm, and the distance between the lump and the specimen was set to 200mm. One halogen lamp with a maximum capacity of 1kW was used, and phase-lock infrared thermal images with a frequency of 1Hz were captured and analyzed. Result: Objectively quantified data values were obtained by analyzing the contrast ratio and signal-to-noise ratio. Conclusion: The possibility of defect diagnosis for thin metal plate was confirmed by using the lock-in infrared thermography technique.

Study on the Defects Detection in Composites by Using Optical Position and Infrared Thermography

  • Kwon, Koo-Ahn;Park, Hee-Sang;Choi, Man-Yong;Park, Jeong-Hak;Choi, Won Jae
    • Journal of the Korean Society for Nondestructive Testing
    • /
    • v.36 no.2
    • /
    • pp.130-137
    • /
    • 2016
  • Non-destructive testing methods for composite materials (e.g., carbon fiber-reinforced and glass fiber-reinforced plastic) have been widely used to detect damage in the overall industry. This study detects defects using optical infrared thermography. The transient heat transport in a solid body is characterized by two dynamic quantities, namely, thermal diffusivity and thermal effusivity. The first quantity describes the speed with thermal energy diffuses through a material, whereas the second one represents a type of thermal inertia. The defect detection rate is increased by utilizing a lock-in method and performing a comparison of the defect detection rates. The comparison is conducted by dividing the irradiation method into reflection and transmission methods and the irradiation time into 50 mHz and 100 mHz. The experimental results show that detecting defects at 50 mHz is easy using the transmission method. This result implies that low-frequency thermal waves penetrate a material deeper than the high-frequency waves.

Thermal Imaging for Detection of SM45C Subsurface Defects Using Active Infrared Thermography Techniques (능동 적외선 열화상 기법에 의한 SM45C 이면결함 검출 열영상에 관한 연구)

  • Chung, Yoonjae;Ranjit, Shrestha;Kim, Wontae
    • Journal of the Korean Society for Nondestructive Testing
    • /
    • v.35 no.3
    • /
    • pp.193-199
    • /
    • 2015
  • Active thermography techniques have the capability of inspecting a broad range simultaneously. By evaluating the phase difference between the defected area and the healthy area, the technique indicates the qualitative location and size of the defect. Previously, the development of the defect detection method used a variety of materials and the test specimen was done. In this study, the proposed technique of lock-in is verified with artificial specimens that have different size and depth of subsurface defects. Finally, the defect detection capability was evaluated using comparisons of the phase image and the amplitude image according to the size and depth of defects.

Measurement Uncertainty on Subsurface Defects Detection Using Active Infrared Thermographic Technique (능동 적외선열화상 기법을 이용한 이면결함 검출에서의 측정 불확도)

  • Chung, Yoonjae;Kim, Wontae;Choi, Wonjae
    • Journal of the Korean Society for Nondestructive Testing
    • /
    • v.35 no.5
    • /
    • pp.341-348
    • /
    • 2015
  • Active infrared thermography methods have been known to possess good fault detection capabilities for the detection of defects in materials compared to the conventional passive thermal infrared imaging techniques. However, the reliability of the technique has been under scrutiny. This paper proposes the lock-in thermography technique for the detection and estimation of artificial subsurface defect size and depth with uncertainty measurement.

Defect Sizing and Location by Lock-in Photo-Infrared Thermography (위상잠금 광-적외선 열화상 기술을 이용한 내분결함의 위치 및 크기 평가)

  • Choi, Man-Yong;Kang, Ki-Soo;Park, Jeong-Hak;Kim, Won-Tae;Kim, Koung-Suk
    • Journal of the Korean Society for Nondestructive Testing
    • /
    • v.27 no.4
    • /
    • pp.321-327
    • /
    • 2007
  • In lock-in thermography, a phase difference between the defect area and the healthy area indicates the qualitative location and size of the defect. To accurately estimate these parameters, the shearing-phase technique has been employed which gives the shearing-phase distribution. The shearing-phase distribution has maximum, minimum, and zero points that help determine quantitatively the size and location of the subsurface defect. In experiment, the proposed technique is verified with artificial specimen and these related factors are analyzed.

Internal Defect Position Analysis of a Multi-Layer Chip Using Lock-in Infrared Microscopy (위상잠금 적외선 현미경 관찰법을 이용한 다층구조 칩의 내부결함 위치 분석)

  • Kim, Seon-Jin;Lee, Kye-Sung;Hur, Hwan;Lee, Haksun;Bae, Hyun-Cheol;Choi, Kwang-Seong;Kim, Ghiseok;Kim, Geon-Hee
    • Journal of the Korean Society for Nondestructive Testing
    • /
    • v.35 no.3
    • /
    • pp.200-205
    • /
    • 2015
  • An ultra-precise infrared microscope consisting of a high-resolution infrared objective lens and infrared sensors is utilized successfully to obtain location information on the plane and depth of local heat sources causing defects in a semiconductor device. In this study, multi-layer semiconductor chips are analyzed for the positional information of heat sources by using a lock-in infrared microscope. Optimal conditions such as focal position, integration time, current and lock-in frequency for measuring the accurate depth of the heat sources are studied by lock-in thermography. The location indicated by the results of the depth estimate, according to the change in distance between the infrared objective lens and the specimen is analyzed under these optimal conditions.