Nondestructive Evaluation of Defect Size by Using a Contrast Parameter of Infrared Image |
Choi, Jungyoung
(Manufacturing Technology Convergence Program, Seoul National University of Science and Technology)
Choi, Sooyoung (Manufacturing Technology Convergence Program, Seoul National University of Science and Technology) Kim, Jaeyeon (Program of Materials Science & Engineering, Convergence Institute of Biomedical Engineering and Biomaterials, Seoul National University of Science and Technology) Yoo, Kitae (Manufacturing Technology Convergence Program, Seoul National University of Science and Technology) Park, Jaiwon (Department of Non Destructive Inspection, Asea Aviation College) Hyun, Changyong (Manufacturing Technology Convergence Program, Seoul National University of Science and Technology) Byeon, Jaiwon (Manufacturing Technology Convergence Program, Seoul National University of Science and Technology) |
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