• 제목/요약/키워드: LCD Panel

검색결과 605건 처리시간 0.025초

LCD 패널 유리의 마모거동에 관한 연구 (Investigation of Wear Behavior of LCD Panel Glass)

  • 곽지후;신동갑;김대은
    • 정보저장시스템학회논문집
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    • 제10권2호
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    • pp.39-44
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    • 2014
  • LCD panels are used widely in all sorts of devices. Since glass is the main material used to make the panels, scratch resistance is an important issue in acquiring high quality LCD panels. In this work the wear behaviors of three types of commercially available LCD panel glasses were investigated. A pin-on-reciprocating tribotester was used to perform the wear tests using the glass specimens against a stainless steel ball. The hardness of the specimens was initially obtained. It was shown that the wear amount varied with respect to the applied load as well as the type of glass. The wear pattern of the glass specimen was also characterized using confocal microscopy. It is expected that the results of this work will aid in improving the tribological properties of LCD panel glass.

Feasibility into High-end TN Monitor Development

  • Park, C.W.;Kang, D.H.;Choi, H.C.
    • 한국정보디스플레이학회:학술대회논문집
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    • 한국정보디스플레이학회 2006년도 6th International Meeting on Information Display
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    • pp.756-758
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    • 2006
  • Although LCD market has been divided so far into high-end market with S-IPS & SPVA and low-en market with TN mode, TN MNT has been striving towards bigger share in large and high-resolution wide display market as well. LG.Philips LCD has developed 20.1 inch and 22.0 inch WSXGA+ wide monitor mainly focusing on the low cost based on high brightness, fast R/T, high color gamut and wide viewing angle.

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TFT-LCD의 품질검사기준 설정을 위한 픽셀결점 탐지도 평가 (A study on the detection probabilities of pixel defects with respect to their locations on the TFT-LCD)

  • 김상호;양승준
    • 대한안전경영과학회:학술대회논문집
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    • 대한안전경영과학회 2004년도 춘계학술대회
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    • pp.283-289
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    • 2004
  • The number of pixel defects including bright and black dots on a panel is one of the critical factors determining the quality of TFT-LCD. Since pixel defects on the TFT-LCD panels are sometimes unavoidable, manufacturers have to inspect the panels so that any panel with an unacceptable number of defects will not be delivered to the buyers. However, the buyers demand for the manufacturers to meet different pixel defects tolerances (acceptable number of pixel defects on a TFT-LCD panel) around central(tight) and peripheral(loose) inspection zones. The disagreement in quality standard among different buyers also cause confusions in screening non-confirmative products and unstable yield of production. Few research has focused on the effects of defect locations on a TFT-LCD panel on their detection probabilities and the rational division of defect inspection zones. In this research, experiments were conducted to find the detection probabilities of black dot defects with respect to their varying locations on a TFT-LCD. It is proposed a rational division of inspection zone on a TFT-LCD panel on the basis of detection probabilities of the defects. With these division of inspection zones and the mean defect detection probability within each zone, it is expected to establish a more reasonable pixel defects tolerances.

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Development of the new structure of transflective LCD

  • Lee, Dong-Hoon;Chung, Jae-Young;Park, Gui-Bok;Chung, In-Jae
    • 한국정보디스플레이학회:학술대회논문집
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    • 한국정보디스플레이학회 2000년도 제1회 학술대회 논문집
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    • pp.203-204
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    • 2000
  • We have developed 14.1" XGA transflective panel for both transmissive mode and reflective mode. We designed new panel structure, optimized optical films and adopted pixel with high aperture and high transmittance color filter. This can be applied for mobile tool and sub-note without regard to environment.

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Recent Trends in Optical Materials of Backlight for LCD Display

  • Dong, Hyun-Soo;Jeong, O-Yong
    • 한국고분자학회:학술대회논문집
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    • 한국고분자학회 2006년도 IUPAC International Symposium on Advanced Polymers for Emerging Technologies
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    • pp.148-149
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    • 2006
  • TFT-LCD BLU has been remarkably developed for a recent few years as TFT-LCD market is increased. Recently new BLU technologies and components are developed as more aggressively than before since TFT-LCD panel requires higher quality and resolution. Especially Samsung Electronics and LG Philips LCD of Korea are major LCD panel makers and the major optical materials of LCD BLU and panel for Samsung Electronics have been supplied by Samsung Cheil Industries. In this presentation introduction to main components of LCD BLU will be investigated details. Also characteristics and applications of optical polymers such as PMMA, PET etc for LCD display will be included and finally recent trends in optical materials for LCD BLU will be shown briefly.

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2.22-inch qVGA ${\alpha}$-Si TFT-LCD Using a 2.5 um Fine-Patterning Technology by Wet Etch Process

  • Lee, J.B.;Park, S.;Heo, S.K.;You, C.K.;Min, H.K.;Kim, C.W.
    • 한국정보디스플레이학회:학술대회논문집
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    • 한국정보디스플레이학회 2006년도 6th International Meeting on Information Display
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    • pp.1649-1652
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    • 2006
  • 2.22-inch qVGA $(240{\times}320)$ amorphous silicon thin film transistor liquid active matrix crystal display (${\alpha}$- Si TFT-AMLCD) panel has been successfully demonstrated employing a 2.5 um fine-patterning technology by a wet etch process. Higher resolution 2.22-inch qVGA LCD panel with an aperture ratio of 58% can be fabricated because the 2.5 um fine pattern formation technique is combined with high thermal photo-resist (PR) development. In addition, a novel concept of unique ${\alpha}$-Si TFT process architecture, which is advantageous in terms of reliability, was proposed in the fabrication of 2.22-inch qVGA LCD panel. Overall results show that the 2.5 um finepatterning is a considerably significant technology to obtain higher aperture ratio for higher resolution ${\alpha}$-Si TFT-LCD panel realization.

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2.22-inch qVGA a-Si TFT-LCD Using a 2.5 um Fine-Patterning Technology by Wet Etch Process

  • Lee, Jae-Bok;Park, Sun;Heo, Seong-Kweon;You, Chun-Ki;Min, Hoon-Kee;Kim, Chi-Woo
    • Journal of Information Display
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    • 제7권3호
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    • pp.1-4
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    • 2006
  • 2.22-inch qVGA $(240{\times}320)$ amorphous silicon thin film transistor liquid active matrix crystal display (a-Si TFT-AMLCD) panel has been successfully demonstrated employing a 2.5 um fine-patterning technology by a wet etch process. Higher resolution 2.22-inch qVGA LCD panel with an aperture ratio of 58% can be fabricated as the 2.5 um fine pattern formation technique is integrated with high thermal photo-resist (PR) development. In addition, a novel concept of unique a-Si TFT process architecture, which is advantageous in terms of reliability, was proposed in the fabrication of 2.22-inch qVGA LCD panel. Overall results show that the 2.5 um fine-patterning is a considerably significant technology to obtain higher aperture ratio for higher resolution a-Si TFT-LCD panel realization.

폐 LCD 패널유리를 이용한 제올라이트의 합성 (Synthesis of Zeolite from Waste LCD Panel Glass)

  • 이철태
    • 공업화학
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    • 제28권5호
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    • pp.521-528
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    • 2017
  • 폐 LCD 패널유리의 재활용방안을 찾고자, 폐 LCD 패널유리를 원료로 사용하여 수열반응에 의해 이온교환성능을 갖는 제올라이트 합성공정을 조사하였다. 폐 LCD 패널유리는 이온교환성능을 갖는 제올라이트의 제조 원료로 사용될 수 있음을 보여주었다. 이온교환능력을 갖는 제올라이트의 제조를 위한 조건은 폐 LCD 패널유리의 Al성분에 대한 Si성분의 몰비 2.0~2.8, 수열반응온도 $100^{\circ}C$, 수열반응시간 12 h이다. 상기조건에서 Al성분에 대한 Si성분의 몰비(Si/Al mole ratio)를 2.0으로 하는 경우 A형 제올라이트가 합성되며, 몰비를 2.8의 조건으로 유지하는 경우 P형 제올라이트의 생성된다. 폐 LCD 패널유리를 이용하여 제조된 A형 제올라이트는 양호한 이온교환능력 및 중금속 흡착능력을 보여 주었으며, 결정상이 큐빅상으로 안정적으로 성장할수록 이온 교환능력은 우수하다.

TFT LCD 검사용 패널링크 디지털 플랫 패널 디스플레이 수신부 구현 (PanelLink Digital Flat Panel Display Receiver for TFT LCD Test)

  • 백운성;이선복;박창수;홍철호
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 1998년도 추계학술대회 논문집 학회본부 B
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    • pp.618-620
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    • 1998
  • We implemented PanelLink flat panel display receiver which can be used for testing SXGA($1280{\times}1024$) TFT LCD panel. We've got optimal analog input voltage to get stable image according to cable length. And we commented the way to reduce EMI.

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TFT-LCD 채널검사 자동화를 위한 원격 모니터링 시스템 개발 (Development of n Remote Monitoring System for TFT-LCD Panel Test Automation)

  • 박형근;이승대;김선엽
    • 한국산학기술학회논문지
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    • 제8권3호
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    • pp.483-487
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    • 2007
  • 본 연구에서는 TFT-LCD Panel 생산한 후 Panel을 검사하는 공정에서 사용되는 Ti-Con 보드의 동작 상태를 실시간으로 모니터링하고 원격지에 있는 엔지니어에게 TCP/IP를 이용하여 고장 유무를 판별할 수 있는 데이터를 전송함으로써 신속한 대처가 가능할 뿐만 아니라 다중 프로세스가 가능하도록 제어할 수 있는 시스템을 개발하였다.

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