• Journal of Advanced Navigation Technology
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• v.15 no.5
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• pp.850-856
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• 2011

The error diffusion method is one of the digital halftoning methods that diffuses quantization errors of current processing pixel to neighboring pixels and get a high-quality black-white image. This method has the problematic case which partially increase or decrease summation of diffused errors in the process of diffusing the quantization error. In this paper, we analyze Floyd-Steinberg method, Jarvis-Judice-Ninke method, Stucki method, and Shiau-Fan method as a representative case of error diffusion methods and propose a solution method of this problem.

• Asian-Australasian Journal of Animal Sciences
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• v.23 no.9
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• pp.1229-1235
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• 2010

With the increase of human activities since the Industrial Revolution, atmospheric greenhouse gas (GHG) concentration has increased, which is believed the cause of climate change. Methane ($CH_4$) fluxes were measured at two commercial swine barns (Jarvis and Guelph) with a four tower micrometeorological mass balance method. Two and three separate measurements were conducted at Jarvis and at Guelph, respectively. In the Jarvis experiments from May to July, mean $CH_4$ flux ($490.4{\mu}g/m^2/s$) during daytime was lower than that during nighttime ($678.0{\mu}g/m^2/s$) (p<0.05), which would be caused by break of slurry temperature stratification. In the Guelph experiment from January to April, mean $CH_4$ flux ($62.9{\mu}g/m^2/s$) during daytime was higher than that during nighttime ($39.0{\mu}g/m^2/s$) (p<0.05), which would be generated by high slurry temperature at 3 cm depth after April 6. Slurry temperature stratification in the Guelph experiment would happen from January to March.

• Journal of the Korea Institute of Military Science and Technology
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• v.10 no.3
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• pp.114-119
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• 2007

Dielectric properties of quartz glass and $Si_3N_4$ are investigated using the waveguide method from room temperature to $800^{\circ}C$. For the case of dielectric constant, $Si_3N_4$ showed similar increase with quartz glass up to $300^{\circ}C$, but less increase from $300^{\circ}C$ to $800^{\circ}C$. For the case of loss tangent, those showed gradual increase with temperature except of some temperature points. The loss tangent of $Si_3N_4$ and quartz glass increased up to 18.2% and 12.5% respectively. Through these researches, high temperature dielectric properties of silicon nitride materials are characterized.