• 제목/요약/키워드: Ion recombination

Search Result 54, Processing Time 0.023 seconds

Photoluminescence Properties of $CuGaSe_2$ Single Crystal ($CuGaSe_2$ 단결정의 Photoluminescence 특성)

  • 진문석;김화택
    • Journal of the Korean Vacuum Society
    • /
    • v.2 no.3
    • /
    • pp.294-298
    • /
    • 1993
  • CuGaSe2 단결정을 고순도(99.9999%)의 Cu, Se 원소를 화학조성비로 칭량한 후 Se을 3mole% 과잉으로 첨가하여 합성된 ingot를 사용하여 iodine(99.9999%)을 수송매체로 한 화학수송법으로 성장시켰다. 성장된 단결정은 검정색을 띠고 있었으며, 10K에서 optical energy gap이 1.755eV로 주어졌다. Ar-ion laser로 여기시켜 측정한 photoluminescence(PL) 스펙트럼으로부터 1.667eV, 1.085eV, 1.025eV에 위치한 세 개의 PL peak를 얻었다. Thermally stimulated current(TSC) 측정에서 0.660eV, 0.720eV의 deep donor level을 관측하였으며, PL peak intensity의 thermal quenching으로 구한 activation energy는 0.010eV이었다. CuGaSe2 단결정에서 PL mechanism은 edge emission 및 donor-acceptor pair recombination임을 규명했다.

  • PDF

Anodic Growth of Vanadium Oxide Nanostructures (Vanadium Oxide 나노구조 형성)

  • Lee, Hyeon-Gwon;Lee, Gi-Yeong
    • Proceedings of the Korean Institute of Surface Engineering Conference
    • /
    • 2018.06a
    • /
    • pp.68-68
    • /
    • 2018
  • Nanoporous or nanotubular metal oxide can be fabricated by anodization of metal substrate in fluoride contained electrolytes. The approach allows various transition metals such as Zr, Hf, Nb, Ta to form highly ordered oxide nanostructures. These oxide nanostructures have various advantages such as high surface area, fast electron transport rate and slow recombination in semiconductive materials. Recently, vanadium oxide nanostructures have been drawn attentions due to their superior electronic, catalytic and ion insertion properties. However, anodization of vanadium metal to form oxide layers is relatively difficult due to ease formation of highly soluble complex in water contained electrolyte during anodization. Yang et al. reported $[TiF_6]^{2-}$ or $[BF_4]^-$ in electrolyte helps to formation of stable oxide layer [1, 2]. However, the reported approaches are very sensitive in other parameters. In this presentation, we deal with the other important key parameters to form ordered anodic vanadium oxide such as pH, temperatures and applied potential.

  • PDF

Monte Carlo Simulation of Thermionic Low Pressure Discharge Plasma (저압 열전자 방전 플라즈마의 Monte Carlo 시뮬레이션)

  • Koh, Wook Hee
    • The Transactions of The Korean Institute of Electrical Engineers
    • /
    • v.61 no.12
    • /
    • pp.1880-1885
    • /
    • 2012
  • Nonlinear dynamical behaviors in thermionic low pressure discharge are investigated using a particle-in-cell(PIC) simulation. An electrostatic PIC code is developed to model the plasma discharge system including the kinetic effects. The elastic collision, excitation collision, ionization collision, and electron-ion recombination collision are considered in this code. The generated electrons and ions are traced to analyze physical characteristics of the plasma. The simulation results show that the nonlinear oscillation structures are observed for cold plasma in the system and the similar structures are observed for warm plasma with a shift in values of the bifurcation parameter. The detailed oscillation process can be subdivided into three distinct mode; anode-glow, temperature-limited, and double-layer modes.

Exposure Measurements of Co-60 Gamma rays (Co-60 감마선의 조사선량 측정)

  • Hah, Suck-Ho;Kim, Hyun-Moon
    • Journal of Radiation Protection and Research
    • /
    • v.16 no.2
    • /
    • pp.7-16
    • /
    • 1991
  • Measurement of Co-60 gamma rays has been made for establishment of exposure standard and analyze it's overall uncertainties. Exposure rate determined by the charge mode method using vibrating reed amplifier with cylinderical type cavity chamber. The values of a variety of physical constants and the correction factors are evaluated. The resulting exposure rate is 690.81 R/h at the distance of 1m from the source and the related uncertainties is ${\pm}0.8%$

  • PDF

Cathodoluminescence Enhancement of CaTiO3:Pr3+ by Ga Addition

  • Kang, Seung-Youl;Byun, Jung-Woo;Kim, Jin-Young;Suh, Kyung-Soo;Kang, Seong-Gu
    • Bulletin of the Korean Chemical Society
    • /
    • v.24 no.5
    • /
    • pp.566-568
    • /
    • 2003
  • The phosphor $CaTiO_3:Pr^{3+}$ attracts much attention as a low-voltage red phosphor because of its good chromaticity and intrinsic conductivity. The addition of Ga into this CaTiO₃:Pr led the luminance intensity to greatly enhance without the change of the wavelength for the electronic transition and the peak shape of it. The increase of the recombination rate of electron-hole pairs through the Ga ion doping, which was expected to play a role of a hole-trap center, is proposed to be one of the reasons for the enhancement of the cathodoluminescence intensity.

Neodymium doped mixed metal oxide derived from CoAl-layered double hydroxide: Considerable enhancement in visible light photocatalytic activity

  • Khodam, Fatemeh;Amani-Ghadim, Hamid Reza;Aber, Soheil;Amani-Ghadim, Ali Reza;Ahadzadeh, Iraj
    • Journal of Industrial and Engineering Chemistry
    • /
    • v.68
    • /
    • pp.311-324
    • /
    • 2018
  • Herein,the Neodymium ion ($Nd^{3+}$) doped CoAl-LDH have been successfully prepared via co-precipitation method and was used as a precursor of Nd-doped CoAl-mixed metal oxides (MMO). The photocatalytic activity of doped LDH and MMO was investigated in the degradation of an azo dye, C.I. Acid Red 14, under visible light irradiation. DRS and PL analysis demonstrated decreasing in the band gap energy and recombination of photo-induced charge carriers of Nd-doped LDH and MMO compared with the pristine CoAL-LDH. Due to significant difference in photocatalytic performance. A power law empirical kinetic model was obtained for predicting the photocatalytic degradation efficiency.

Investigation of the observed solar coronal plasma in EUV and X-rays in non-equilibrium ionization state

  • Lee, Jin-Yi;Raymond, John C.;Reeves, Katharine K.;Shen, Chengcai;Moon, Yong-Jae
    • The Bulletin of The Korean Astronomical Society
    • /
    • v.43 no.1
    • /
    • pp.53.1-53.1
    • /
    • 2018
  • During a major solar eruption, the erupting plasma is possibly out of the equilibrium ionization state because of its rapid heating or cooling. The non-equilibrium ionization process is important in a rapidly evolving system where the thermodynamical time scale is shorter than the ionization or recombination time scales. We investigate the effects of non-equilibrium ionization on EUV and X-ray observations by the Atmospheric Imaging Assembly (AIA) on board Solar Dynamic Observatory and X-ray Telescope (XRT) on board Hinode. For the investigation, first, we find the emissivities for all the lines of ions of elements using CHIANTI 8.07, and then we find the temperature responses multiplying the emissivities by the effective area for each AIA and XRT passband. Second, we obtain the ion fractions using a time-dependent ionization model (Shen et al. 2015), which uses an eigenvalue method, for all the lines of ion, as a function of temperature, and a characteristic time scale, $n_et$, where $n_e$ and t are density and time, respectively. Lastly, the ion fractions are multiplied to the temperature response for each passband, which results in a 2D grid for each combination of temperature and the characteristic time scale. This is the set of passband responses for plasma that is rapidly ionized in a current sheet or a shock. We investigate an observed event which has a relatively large uncertainty in an analysis using a differential emission measure method assuming equilibrium ionization state. We verify whether the observed coronal plasmas are in non-equilibrium or equilibrium ionization state using the passband responses.

  • PDF

A study on the characteristics and crystal growth of GaSb (GaSb결정 성장과 특성에 관한 연구)

  • 이재구;오장섭;정성훈;송복식;문동찬;김선태
    • Electrical & Electronic Materials
    • /
    • v.9 no.9
    • /
    • pp.885-890
    • /
    • 1996
  • Undoped p-type and Te doped n-type GaSb crystals were grown by the vertical Bridgman method. The lattice constant of the GaSb crystals was 6.096.+-.000373.angs.. The carrier concentration, the resistivity, and the carrier mobility measured by the van der Pauw method were p.iden.8*10$^{16}$ c $m^{-3}$ , .rho..iden.0.20 .ohm.-cm, .mu.$_{p}$ .iden.400c $m^{2}$ $V^{-1}$ se $c^{-1}$ for p-type, n.iden.1*10$^{17}$ c $m^{-3}$ , .rho..iden.0.15 .ohm.-cm, .mu.$_{n}$ .iden.500c $m^{2}$ $V^{-1}$ se $c^{-1}$ for n-type at 300K. In case of treatment with metal ion of R $u^{+3}$, P $t^{+4}$, the carrier concentration, resistivity and carrier mobility of the GaSb crystals were p.iden.2*10$^{17}$ c $m^{-3}$ , .rho..iden.0.08.ohm.-cm, .mu.$_{p}$ .iden.420c $m^{2}$ $V^{-1}$ se $c^{-1}$ for p-type, n.iden.2.5*10$^{17}$ c $m^{-3}$ , .rho..iden.0.07.ohm.-cm, .mu.$_{n}$ .iden.520c $m^{2}$ $V^{-1}$ se $c^{-1}$ for n-type respectively. GaSb crystals had a tendency to lower resistivity and higher mobility, for surface treatment with metal ion effectively diminished surface recombination centers.s.

  • PDF

High energy swift heavy ion irradiation and annealing effects on DC electrical characteristics of 200 GHz SiGe HBTs

  • Hegde, Vinayakprasanna N.;Praveen, K.C.;Pradeep, T.M.;Pushpa, N.;Cressler, John D.;Tripathi, Ambuj;Asokan, K.;Prakash, A.P. Gnana
    • Nuclear Engineering and Technology
    • /
    • v.51 no.5
    • /
    • pp.1428-1435
    • /
    • 2019
  • The total ionizing dose (TID) and non ionizing energy loss (NIEL) effects of 100 MeV phosphorous ($P^{7+}$) and 80 MeV nitrogen ($N^{6+}$) ions on 200 GHz silicon-germanium heterojunction bipolar transistors (SiGe HBTs) were examined in the total dose range from 1 to 100 Mrad(Si). The in-situ I-V characteristics like Gummel characteristics, excess base current (${\Delta}I_B$), net oxide trapped charge ($N_{OX}$), current gain ($h_{FE}$), avalanche multiplication (M-1), neutral base recombination (NBR) and output characteristics ($I_C-V_{CE}$) were analysed before and after irradiation. The significant degradation in device parameters was observed after $100MeV\;P^{7+}$ and $80MeV\;N^{6+}$ ion irradiation. The $100MeV\;P^{7+}$ ions create more damage in the SiGe HBT structure and in turn degrade the electrical characteristics of SiGe HBTs more when compared to $80MeV\;N^{6+}$. The SiGe HBTs irradiated up to 100 Mrad of total dose were annealed from $50^{\circ}C$ to $400^{\circ}C$ in different steps for 30 min duration in order to study the recovery of electrical characteristics. The recovery factors (RFs) are employed to analyse the contribution of room temperature and isochronal annealing in total recovery.

A study of electrical characteristic of MOSFET device (고에너지 이온주입에 따른 격자 결함 발생 및 거동에 관한 열처리 최적화방안에 관한 연구)

  • Song, Young-Doo;Kwack, Kae-Dal
    • Proceedings of the KIEE Conference
    • /
    • 1999.07d
    • /
    • pp.1830-1832
    • /
    • 1999
  • 고에너지 이온주입(1)에 기인한 격자 손상 발생 및 열처리에 따라 이들의 회복이 어느정도 가능한지에 대하여 측정 및 분석방법을 통하여 조사하였다. 그리고 본 실험에서는 이온주입시 형성되는 빈자리 결함(Vacancy defect)과 격자간 결함(interstitial defect)의 재결할(recombination)을 이용 점결합(point defect)를 감소 시킬 수 있는 effective RTA조건을 설정하여 well 특성을 개선하고자 하였다. 8inch p-type Si(100)기판에 pad oxide 100A을 형성한 후 NMOS 형성하기 위해 vtn${\sim}$p-well과 PMOS 형성을 위해 vtp$\sim$n-well을 이온주입 하였다. Mev damage anneal은 RTA(2)(Rapid Thermal Anneal)로 $1000\sim1150C$ 온도에서 $15\sim60$초간 spilt 하여 실험후 suprem-4 simulation data를 이용하여 실제 SIMS측정 분석결과를 비교하였으며 이온주입에 의해 발생된 격자손상이 열처리후 damage 정도를 알아보기 위해 T.W(Therma-Wave)을 이용하였으며 열처리후 면저항값은 4-point probe를 사용하였다. 이온주입후 열처리 전,후에 따른 불순물 분포를 SIMS(Secondary ion Mass Spectrometry)를 이용하여 살펴보았다. SIMS 결과로는 열처리 온도 및 시간의 증가에 따라서 dopant확산 및 활성화는 큰차이는 보이지 않고 오히려 감소하는 경향을 볼 수 있으며 또한 접합깊이와 농도가 약간 낮아지는 것을 볼 수 있었다. 결점(defect)을 감소시키기 위해서 diffusivity가 빠른 임계온도영역($1150^{\circ}C$-60sec)에서 RTA를 실시하여 dopant확산을 억제하고 점결점(point defect)의 재결합(recombination)을 이용하여 전위 (dislocation)밀도를 감소시켜 이온주입 Damage 및 면저항을 감소 시켰다. 이와 같은 특성을 process simulation(3)(silvaco)을 통하여 비교검토 하였다.

  • PDF