• Title/Summary/Keyword: Intervalley scattering rate

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A study on the transient electron transport in GaAs bulk (GaAs 벌크에서 전자의 과도 전송 특성)

  • 임행삼;황의성;심재훈;이정일;홍순석
    • Electrical & Electronic Materials
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    • v.10 no.3
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    • pp.268-273
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    • 1997
  • In this paper the transient electron transport in GaAs bulk is simulated by using ensemble Monte Carlo method. To analyze the transient electron transport the 10000 electrons in the .GAMMA. valley are simulated simultaneously for 10 picoseconds. The electric field-velocity relation is obtained. The high impurity density reduces the negative differential resistance effect. The result of transient average velocity shows the electron velocity in the transient state is faster than that in the steady state. This transient velocity overshoot is caused by the intervalley scattering mechanism. And we confirmed the fact that the energy relaxation time is longer than the momentum relaxation time.

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Simulation of Two-Dimensional Intervalley Scattering Rate in HEMT Device (HEMT 소자의 2차원 계곡간 산란율 시뮬레이션)

  • 이준하;이흥주
    • Journal of the Korea Academia-Industrial cooperation Society
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    • v.5 no.4
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    • pp.336-339
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    • 2004
  • In this paper the two-dimensional scattering rates were calculated in pseudomorphic Al/sub x//Ga/sub 1-x//As/Ga/sub y/In/sub l -y//As/GaAs heterostructure systems. The electronic states of the square quantum well were determined by the numerical self-consistent solution of Poisson's and Schrodinger's equations. The numerically obtained wave functions and energy levels were used to obtain the major two-dimensional scattering rates in this structure. Polar optical- and acoustic-phonon scattering, piezoelectric, ionized impurity and alloy scattering were considered for the first two sub-bands. The results were compared to the three-dimensional scattering rates also calculated in the same region.

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A Study of Two-Dimensional Intervalley Scattering Rate in HEMT Device (HEMT 소자내 계곡간 산란율의 2차원적 해석에 관한 연구)

  • Lee Jun-Ha;Lee Hoong-Joo
    • Proceedings of the KAIS Fall Conference
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    • 2004.06a
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    • pp.162-164
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    • 2004
  • 슈뢰딩거와 포아송 방정식의 연계풀이에 의해 수치해석적으로 구한 파동함수와 에너지 준위를 이용하여 $300^{\circ}$K에서 사각우물을 형성하는 $Al_xGa_{1-x}As/Ga_yIn_{l-y}As/GaAs$ HEMT 소자 채널 영역에서의 극성광학 포논, 음향 포논, 압전 산란, 이은화된 불순물 산란, 그리고 합금 산란에 대한 2차원 산란율을 계산하여, 같은 영역에서의 3차원 산란율과 비교하였다. 그 결과 bulk영역에서 가장 우세한 이온화된 불순물 산란이, 2-DEG 시스템에서 크게 감소되었음을 알 수 있었는데, 이는 변조 도핑에 의하여 이온화된 불순물을 2-DEG가 존재하는 채널영역의 불순물 양을 감소시켰기 때문으로 해석된다.

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