• 한국전기전자재료학회논문지
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• 제23권2호
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• pp.169-173
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• 2010

Because of power consumption increase, global warming, and limitation of installation, not only high reliability and interruption capability but also compact and light power apparatuses are needed. In this paper, E field calculation and experiment were processed to identify the influence of the shape of end shield and gap distance. It is expected that the results of FEM simulation and experiments could be the basic data to develop VI. the results of FEM simulation and experiments are as following. Firstly, maximum E fields were compared by means of finite element method as a function of the shape of end shield. 3 types of models were used to analyze maximum E field of each model and the influence of shape of shield could be identified. As a result, proposed L type shield could reduce the maximum E field by 20%. Secondly, the influence of the gap distance between end shields on E field was analyzed. As the gap distance become short the gap distance between inner walls of ceramic also become short. And the maximum E field concentrated on inner wall of ceramic finally increased. Thirdly, the experiment was conducted by fabricating each prototype. As a result, no creepage occurred in shieldless model. In other words, creepage occurred in the shield-installed models. And creepage inception voltages were different from each other because of the difference of maximum E field. Fourthly, The equation that shows relation between calculated E field and measured creepage inception voltage was proposed as a result of FEM analysis and experiment. It is concluded that when designing VI this equation could be important data to reduce time and cost by identifying indirectly the optimal gap distance and the shape of shield required to prevent creepage.