• Title/Summary/Keyword: IncP

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Double Side SMT and Molding Process Development for mPossum Package

  • Kim, ByongJin;Cho, EunNaRa;Kim, ChoongHoe;Lee, YoungWoo;Lee, JaeUng;Ryu, DongSu;Jung, GyuIck;Kang, DaeByoung;Khim, JinYoung;Yoon, JuHoon;Kim, Sun-Joong
    • Journal of the Microelectronics and Packaging Society
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    • v.23 no.4
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    • pp.43-48
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    • 2016
  • 3-Dimensional System in Package (3-D SiP) structure (Amkor calls it mPossum-molded Possum) using double side Surface Mount Technology (SMT) and double side molding was evaluated in order to achieve small/thin form factor as well as good functionality by integration and double side layout. As the new platform on laminate substrate basis, molding process was challenge in mold flow balance at top and bottom side and package warpage control over the overall assembly process. There were two types of different molding process evaluated with 1) 1-step molding which was done at both side at the same time and 2) 2-step molding which was done at the conventional molding process twice. Mold simulation helped to narrow down the material selections and parameters available before actual sample build. There were many challenges for this first trial in design/ parameter and material types but optimized them to enable this structure.

Construction of L-Threonine Overproducing Escherichia coli by Cloning of the Threonine Operon

  • Lee, Jin-Ho;Oh, Jong-Won;Noh, Kap-Soo;Lee, Hyune-Hwan;Lee, Jae-Heung
    • Journal of Microbiology and Biotechnology
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    • v.2 no.4
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    • pp.243-247
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    • 1992
  • The thr operon of Escherichia coli TF427, an $\alpha$-amino-$\beta$-hydroxyvaleric acid (AHV)-resistant threonine overproducer, was cloned in a pBluescriptII $KS^+$ plasmid by complementation of E. coli mutants. All clones contained a common 8.8 kb HindIII-generated DNA fragment and complemented the thrA, thrB, and thrC mutants by showing that these clones contained the whole thr operon. This thr operon was subcloned in the plasmid vectors pBR322, pUC18, and pECCG117, an E. coli/Corynebacterium glutamicum shuttle vector, to form recombinant plasmids pBTF11, pUTF25 and pGTF18, respectively. The subcloned thr operon was shown to be present in a 6.0 kb insert. A transformant of E. coli TF125 with pBTF11 showed an 8~11 fold higher aspartokinase I activity, and 15~20 fold higher L-threonine production than TF125, an AHV-sensitive methionine auxotroph. Also, it was found that the aspartokinase I activity of E. coli TF125 harboring pBTF11 was not inhibited by threonine and its synthesis was not repressed by threonine plus isoleucine.

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Effects of Solder Composition on Ball Fatigue Strength (솔더볼 피로강도에 대한 조성의 영향)

  • 김보성;고근우;김영철;김근식;이구홍
    • Proceedings of the International Microelectronics And Packaging Society Conference
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    • 2001.07a
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    • pp.127-133
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    • 2001
  • Package reliability test was conducted to investigate the effect of solder composition on ball fatigue strength. The specimens are first assembled using eutectic Composition S $n_{62}$P $b_{36}$A $g_2$, S $n_{63}$P $b_{34.5}$A $g_2$S $b_{0.5}$ solder and Pre-conditioned at MRT Lv 2a and then conducted under Temperature Cycle test(TC). For each case, the ball shear strength is obtained and micro structure photos are taken. SEM and EDX are used to analyze failure mechanism. The degradation of shear strength of solder balls after reliability test is discussed.d.

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Replication of the Association between Copy Number Variation on 8p23.1 and Autism by Using ASD-specific BAC Array

  • Woo, Jung-Hoon;Yang, Song-Ju;Yim, Seon-Hee;Hu, Hae-Jin;Shin, Myung-Ju;Oh, Eun-Hee;Kang, Hyun-Woong;Park, Seon-Yang;Chung, Yeun-Jun
    • Genomics & Informatics
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    • v.8 no.1
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    • pp.19-27
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    • 2010
  • To discover genetic markers for autism spectrum disorder (ASD), we previously applied genome-wide BAC array comparative genomic hybridization (array-CGH) to 28 autistic patients and 62 normal controls in Korean population, and identified that chromosomal losses on 8p23.1 and on 17p11.2 are significantly associated with autism. In this study, we developed an 8.5K ASD-specific BAC array covering 27 previously reported ASD-associated CNV loci including ours and examined whether the associations would be replicated in 8 ASD patient cell lines of four different ethnic groups and 10 Korean normal controls. As a result, a CNV-loss on 8p23.1 was found to be significantly more frequent in patients regardless of ethnicity (p<0.0001). This CNV region contains two coding genes, DEFA1 and DEFA3, which are members of DEFENSIN gene family. Two other CNVs on 17p11.2 and Xp22.31 were also distributed differently between ASDs and controls, but not significant (p=0.069 and 0.092, respectively). All the other loci did not show significant association. When these evidences are considered, the association between ASD and CNV of DEFENSIN gene seems worthy of further exploration to elucidate the pathogenesis of ASD. Validation studies with a larger sample size will be required to verify its biological implication.

Improved Rs Monitoring for Robust Process Control of High Energy Well Implants

  • Kim, J.H.;Kim, S.;Ra, G.J.;Reece, R.N.;Bae, S.Y.
    • Proceedings of the Korean Society Of Semiconductor Equipment Technology
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    • 2007.06a
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    • pp.109-112
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    • 2007
  • In this paper we describe a robust method of improving precision in monitoring high energy ion implantation processes. Ion implant energy accuracy was measured in the device manufacturing process using an unpatterned implanted layer on an intrinsic p-type silicon wafer. To increase Rs sensitivity to energy at the well implant process, a PN junction structure was formed by P-well and deep N-well implants into the p-type Si wafer. It was observed that the depletion layer formed by the PN junction was very sensitive to energy variation of the well implant. Conclusively, it can be recommended to monitor well implant processes using the Rs measurement method described herein, i.e., a PN junction diode structure since it shows excellent Rs sensitivity to variation caused by energy difference at the well implant step.

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A Novel Maximum Power Point Tracking Control Algorithm for Photovoltaic System (태양광 발전 시스템을 위한 새로운 최대 출력점 추종 제어 알고리즘)

  • Kim, Tae-Yeop;Lee, Yun-Gyu;An, Ho-Gyun;Park, Seung-Gyu
    • The Transactions of the Korean Institute of Electrical Engineers B
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    • v.51 no.3
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    • pp.133-141
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    • 2002
  • Most maximum power point tracking(MPPT) control algorithm is based on Perturb and Observe(P&O) and Incremental Conductance(IncCond). In comparison with P&O and IncCond algorithm, the dynamic and tracking characteristic of IncCond algorithm is better than P&O algorithm in condition of rapidly changing solar radiation. But in the case of digital implementation, the InCond algorithm has error en decision of maximum power operation point(MPOP). To solve this problem, this paper proposes a improved IncCond algorithm, which can determine the MPOP correctly by inserting the test signal in control input. This paper proposes a novel MPPT control algorithm for the digitally implemented photovoltaic system in condition of rapidly changing solar radiation. To verify the validity of the proposed control algorithm. the computer simulation and experiment are carried out.

Thermal Performance Analysis for Cu Block and Dense Via-cluster Design of Organic Substrate in Package-On-Package

  • Lim, HoJeong;Jung, GyuIk;Kim, JiHyun;Fuentes, Ruben
    • Journal of the Microelectronics and Packaging Society
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    • v.24 no.4
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    • pp.91-95
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    • 2017
  • Package-On-Package (PoP) technology is developing toward smaller form factors with high-speed data transfer capabilities to cope with high DDR4x memory capacity. The common application processor (AP) used for PoP devices in smartphones has the bottom package as logic and the top package as memory, which requires both thermally and electrically enhanced functions. Therefore, it is imperative that PoP designs consider both thermal and power distribution network (PDN) issues. Stacked packages have poorer thermal dissipation than single packages. Since the bottom package usually has higher power consumption than the top package, the bottom package impacts the thermal budget of the top package (memory). This paper investigates the thermal and electrical characteristics of PoP designs, particularly the bottom package. Findings include that via and dense via-cluster volume have an important role to lower thermal resistance to the motherboard, which can be an effective way to manage chip hot spots and reduce the thermal impact on the memory package. A Cu block and dense via-cluster layout with an optimal location are proposed to drain the heat from the chip hot spots to motherboard which will enhance thermal and electrical performance at the design stage. The analytical thermal results can be used for design guidelines in 3D packaging.