• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 1998년도 춘계학술대회 논문집
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• pp.121-124
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• 1998

Generally the structure of powder electroluminescent devices (PELDs) on ITO-film was makeup of the ZnS:Cu phosphor layer and BaTiO$_3$ insulating layer. The active layer, which consists of a suitably doped ZnS powder mixed in a dielectric, is sandwiched between two electrodes; one of which are ITO film and the other is aluminum. In this paper, three kinds of powder eleotroluminescent devices (PELDs) : WK-A(ITO/BaTiO$_3$/ZnS:Cu/Silver paste). WK-B(ITO/BaTiO$_3$+ZnS:Cu/Silver paste) and WK-C(ITO/BaTiO$_3$/ZnS:Cu/BaTiO$_3$/Silver paste), fabricated by spin coating method, were investigated. To evaluate the luminescence properties of three kinds of PELDs, EL emission spectroscopy, transferred charge density and time response of EL emission intensity under square wave voltage driving were measured.

• 한국분말재료학회지
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• 제11권1호
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• pp.22-27
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• 2004

The Indium Tin Oxide(ITO) nano powders were prepared by spray drying and heat treatment process. The liquid solution dissolved Indium and Tin salts was first spray dried to prepare chemically homogeneous recursor powders at the optimum spray drying conditions. Subsequently, the precursor powders were subjected to eat treatment process. The nano size ITO powders was synthesized from the previous precursor powders and the npuities also were decreased with increasing heat treatment temperature. Furthermore, the lattice parameter of TO nano powders was increased by doping Tin into Indium with increasing heat treatment temperature. The par icle size of the resultant ITO powders was about 20∼50nm and chemical composition was composed of In:Sn =86:10 wt.％ at 80$0^{\circ}C$.

• 한국분말재료학회지
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• 제15권6호
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• pp.450-457
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• 2008

The objectives of this study were the development of a synthesis technique for highly active nanosized ITO powder and the understanding of the reaction mechanisms of the ITO precursors. The precipitation and agglomeration phenomena in ITO and $In_{2}O_{3}$ precursors are very sensitive to reaction temperature, pH, and coexisting ion species. Excessive $Cl^-$ ion and $Sn^{+4}$ ions had a negative effect an synthesizing highly active powders. However, with a relevant stabilizing treatment the shape and size of ITO and $In_{2}O_{3}$ precursors could be controlled and high density sintered products of ITO were obtained. By applying the reprecipitation process (or stabilization technique), highly active ITO and $In_{2}O_{3}$ powders were synthesized. Sintering these powders at $1500^{\circ}C$ for 5 hours produced 97% dense ITO bodies.

• 대한전기학회:학술대회논문집
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• 대한전기학회 2009년도 제40회 하계학술대회
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• pp.1328_1329
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• 2009

Nano porous indium tin oxide (ITO) powder was synthesized employing a new route sol-gel combustion hybrid method using Ketjen Black as a fuel. The nano porous ITO powder was composed of $SnCl_4$-98.0% and $In(NO_3)_3{\cdot}XH_2O$-99.999%, produce with a $NH_4OH$ with sol-gel method as a catalyst [1,2]. Crystal structures were examined by powder X-ray diffraction (XRD), and those results show shaper intensity peak at $25.6^{\circ}(2{\Theta})$ of $SnO_2$ by increased sintering temperature. A particle morphology as well as crystal size was investigated by scanning electron microscopy(FE-SEM), and the size of the nano porous powder was found to be in the range of 20~30nm. ITO films could controlled by nano porous powder at various sintering temperature in this paper[3,4]. The sol-gel combustion method was offered simple and effective route for the synthesis of nano porous ITO powder[5].

• 대한금속재료학회지
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• 제48권9호
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• pp.831-841
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• 2010

Indium tin oxide (ITO) nanopowders were synthesized by coprecipitation and the sol-gel method to prepare a stable dispersion of ITO nano-colloid for antistatic coating of a display panel. The colloidal dispersions were prepared by attrition process with a vibratory milling apparatus using a suitable dispersant in organic solvent. The ITO coating solution was spin-coated on a glass panel followed by the deposition of partially hydrolyzed alkyl silicate as an over-coat layer. The double-layered coating films were characterized by measuring the sheet resistance and reflectance spectrum for antistatic and antireflective properties.

• 자원리싸이클링
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• 제16권1호
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• pp.28-36
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• 2007

폐 ITO 타겟을 염산에 용해시킨 복합 산용액을 원료로 하여 자체기술에 의해 개발한 분무열분해 반응장치를 통하여 평균입도가 50nm이하인 나노 ITO 분말을 제조하였으며, 반응온도 및 원료용액의 농도 등의 반응인자들의 변화에 따른 ITO 분말의 특성을 파악하였다. 반응온도가 $800^{\circ}C$로부터 $1100^{\circ}C$로 변화함에 따라 생성된 ITO 분말의 평균 입도는 40nm로부터 100nm정도까지 증가하고 있었으며, 조직도 점점 치밀화되면서 각각의 입자들이 독립된 다각형 형태를 나타내었으며, 입도분포는 더욱 불균일하게 나타나고 있었다. 또한 반응온도 증가에 따라 XRD 피크의 강도는 증가하였으며 비표면적은 감소하고 있었다. 원료용액 내의 인듐 성분의 농도가 50g/l로부터 400g/l로 증가됨에 따라 생성된 ITO 분말의 평균입도는 점점 증가하는 반면 입도분포는 더욱 불균일 하였다. 농도가 50g/l인 경우에는 ITO 분말의 평균입도는 30nm 이하이면서 입도분포는 비교적 균일하게 나타나고 있었다. 반면 농도가 포화농도에 가까운 400g/l인 경우에는 분말들의 입도분포는 20nm 정도부터 100nm 이상까지 공존하는 매우 불균일한 형태를 나타내고 있었다. 농도가 증가함에 따라 XRD 피크의 강도는 점점 증가하였으며 비표면적은 점점 감소하였다.

• 자원리싸이클링
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• 제27권2호
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• pp.24-31
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• 2018

본 연구에서는 폐 ITO 타겟을 염산에 용해시킴으로써 인듐-주석 복합 산 용액을 제조하여 원료용액으로 사용하였다. 이 원료용액으로부터 분무열분해 공정에 의하여 평균입도 30 nm 이하의 ITO 분체를 제조하였다. 또한 본 연구에서는 인듐-주석 산화물(ITO) 형성을 위한 열역학적 수식들을 확립하였다. 반응온도가 $800^{\circ}C$로부터 $900^{\circ}C$로 증가됨에 따라 평균입도 30 nm 이하인 나노입자들이 응집되어 있는 액적 형태의 비율 및 크기는 감소하는 반면 표면 조직은 더욱 치밀해짐을 알 수 있었다. 반응온도가 $800^{\circ}C$인 경우에는 생성된 분체의 평균입도는 약 20 nm이었으며, 현저한 소결 현상은 나타나지 않았다. 한편, 반응온도가 $900^{\circ}C$인 경우에는 노즐에 의하여 미립화되는 액적의 분열 현상은 $800^{\circ}C$의 경우보다 심하게 나타났으며 액적 형태의 비율은 현저하게 감소하였다. 형성된 입자들의 평균 입도는 약 25 nm로서 $800^{\circ}C$의 경우보다 약간 증가하였다. 반응온도에 관계없이 ITO 입자들은 단결정으로 구성되어 있었다. XRD 분석 결과 분무열분해 공정에 의하여 염화물 상은 전혀 존재하지 않았으며 오직 ITO 상만이 형성되었음을 알 수 있었다. 반응온도가 $800^{\circ}C$로부터 $900^{\circ}C$로 증가함에 따라 비표면적은 약 30% 감소하였다.

• 한국표면공학회지
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• 제33권5호
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• pp.349-355
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• 2000

Indium tin oxide (ITO) thin films have been deposited on PET (polyethylene terephthalate) and glass substrates by a do magnetron sputter method of powder target without heat treatments such as substrate heater and post heat treatment. During the sputtering deposition, sputtering parameters such as sputtering power, working pressure, oxygen gas mixture, film thickness and substrate-target distance are important factors for the high quality of ITO thin films. The structural, electrical and optical properties of as-deposited ITO oxide films are investigated by sputtering power, oxygen partial pressure and films thickness among the several sputtering conditions. XRD patterns of ITO films are affected by sputtering power and pressure. As the power and pressure are increased, (411) and (422) peaks of ITO films are grown strongly. Electrical resistivity is also increased, as the sputtering power and pressure are increased. Transmittance of ITO thin films in the visible light ranges is lowered with an increase of sputtering power and film thickness. Reflectance of ITO films in infra-red region is decreased, as the power and pressure is increased.

• 한국전기전자재료학회논문지
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• 제19권2호
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• pp.109-115
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• 2006

Indium tin oxide (ITO) films have been prepared by DC magnetron sputtering. In order to improve the utilization efficiency of the target and reduce the cost of the film deposition processes, the powder target was used instead of the conventional ceramic target. As-deposited films were annealed at temperatures between $200^{\circ}C$ and $500^{\circ}C$ for 30 min in air. Also, the film was annealed in various atmospheres such as air, $O_2,\;H_2,\;N_2$, and vacuum at $400^{\circ}C$C for 30 min. Effects of the heat treatment conditions on structural, electrical, and optical properties of ITO films were investigated. The annealing temperature of $400^{\circ}C$ and atmospheres of $H_2$ and $N_2$ seem to be the most suitable conditions for post processing.

• Transactions on Electrical and Electronic Materials
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• 제2권1호
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• pp.22-26
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• 2001

ITO (Indium-tin-oxide) thin films were deposited on glass substrates by a dc magnetron sputtering system using ITO powder target. The methods of heat treatment are important factor to obtain high quality ITO films with low electrical resistivity and good optical transmittance. Therefore, both methods of the substrate temperature and post-deposition annealing temperature have been compared on the film structural, electrical and optical properties. A preferred orientations shifts from (411) to (222) peak at annealing temperature of 200$\^{C}$. Minimum resistivity of ITO film is approximately 8.7$\times$10$\^$-4/ Ωcm at substrate temperature of 450$\^{C}$. Optical transmittances at post annealing temperature above 200$\^{C}$ are 90%. As a result, the minimum value of annealing temperature that is required for the recrystallization of as-deposited ITo thin films is 200$\^{C}$.