• Journal of IKEEE
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• v.25 no.3
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• pp.571-577
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• 2021

This paper describes ISO/TR 4804, an international standard to describe how to design and verify autonomous cars to ensure safety and cybersecurity. Goals of ISO/TR 4804 are (1) positive risk balance and (2) avoidance of unreasonable risk. It also 12 principles of safety and cybersecurity to achieve these goals. In the design procedures, it describes (1) 13 capabilities to achieve these safety and cybersecurity principles, (2) hardware and software elements to achieve these capabilities, and (3) a generic logical architecture to combine these elements. In the verification procedures, it describes (1) 5 challenges to ensure safety and cybersecurity, (2) test goals, platforms, and solutions to achieve these challenges, (3) simulation and field operation methods, and (4) verification methods for hardware and software elements. Especially, it regards deep neural network as a software component and it describe design and verification methods of autonomous cars.

• Journal of IKEEE
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• v.25 no.3
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• pp.578-583
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• 2021

This paper describes acceleration tests for reliability of semiconductors. It also describes AEC-Q100, international test standard for reliability of automotive semiconductors. Semiconductors can be used for dozens of years. So acceleration tests are essential to test potential problems over whole period of product where test time is minimized by applying intensive stresses. AEC-Q100 is a typical acceleration test in automotive semiconductors, and it is designed to find various failures in semiconductors and to analyze their causes of occurance. So it finds many problems in design and fabrication as well as it predicts lifetime and reliability of semiconductors. AEC-Q100 consists of 7 test groups such as accelerated environmental stress tests, accelerated lifetime simulation tests, package assembly integrity tests, die fabrication reliability tests, electrical verification tests, defect screening tests, and cavity package integrity tests. It has 4 grades from grade 0 to grade 3 based on operational temperature. AEC-Q101, Q102, Q103, Q104, and Q200 are applied to discrete semiconductors, optoelectronic semiconductors, sensors, multichip modules, and passive components, respectively.