• The Sea:JOURNAL OF THE KOREAN SOCIETY OF OCEANOGRAPHY
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• v.24 no.2
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• pp.187-207
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• 2019

In order to develop a high performance ocean model, we used Julia, a Just-In-Time compile language, and to obtain the solution of the momentum equation, we made the code to solve the Poisson equation by the Successive Over-Relaxation method. And then we made two models to test Julia calculation codes. First, a simple channel form is modeled to test constant source/sink conditions. Second, the simplified Yellow Sea was modeled to test tidal forcing, Coriolis forces, and the effect of vertical eddy diffusivity coefficients. The model has been tested with a total of eight cases in the two scenarios. As a result of the test, the depth-averaged current speed of the three cases in Scenario 1 converged perfectly to the theoretical value, and that showed well a vertical flow velocity gradient due to the bottom friction. Also, the result of Scenario 2 represented well the amphidromic points of Yellow Sea and the tidal characteristics of mid-western and southwestern coast of Korea. Therefore, it is considered that the ocean model using Julia language has developed successfully, this suggests that the ocean model has come to the stage of successful transition from a classical compile language to a Just-In-Time compile language.

• Journal of the Microelectronics and Packaging Society
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• v.31 no.2
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• pp.54-62
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• 2024

SICM (Scanning Ion Conductivity Microscopy) is a technique for measuring surface topography in an environment where electrochemical reactions occur, by detecting changes in ion conductivity as a nanopipette tip approaches the sample. This study includes an investigation of the current response curve, known as the approach curve, according to the distance between the tip and the sample. First, a simulation analysis was conducted on the approach curves. Based on the simulation results, then, several measuring experiments were conducted concurrently to analyze the difference between the simulated and measured approach curves. The simulation analysis confirms that the current squeezing effect occurs as the distance between the tip and the sample approaches half the inner radius of the tip. However, through the calculations, the decrease in current density due to the simple reduction in ion channels was found to be much smaller compared to the current squeezing effect measured through actual experiments. This suggests that ion conductivity in nano-scale narrow channels does not simply follow the Nernst-Einstein relationship based on the diffusion coefficients, but also takes into account the fluidic hydrodynamic resistance at the interface created by the tip and the sample. It is expected that SICM can be combined with SECM (Scanning Electrochemical Microscopy) to overcome the limitations of SECM through consecutive measurement of the two techniques, thereby to strengthen the analysis of electrochemical surface reactivity. This could potentially provide groundbreaking help in understanding the local catalytic reactions in electroless plating and the behaviors of organic additives in electroplating for various kinds of patterns used in semiconductor damascene processes and packaging processes.