• Proceedings of the Korean Society of Precision Engineering Conference
• /
• 2007.11a
• /
• pp.87-88
• /
• 2007

• Journal of the Institute of Electronics and Information Engineers
• /
• v.50 no.3
• /
• pp.16-22
• /
• 2013

A general characterization procedure based on the extraction of a 2n-port admittance matrix corresponding to n uniform coupled lines on the multi-layered substrate using the Finite-Difference Time-Domain (FDTD) technique is presented. In this paper, the frequency-dependent normal mode parameters are obtained from the 2n-port admittance matrix to analyze multi-layered asymmetric coupled line structure, which in turn provides the frequency-dependent propagation constant, effective dielectric constant, and line-mode characteristic impedances. To illustrate the technique, several practical coupled line structures on multi-layered substrate have been simulated. Especially, embedded conductor structures have been simulated. Comparisons with Spectral Domain Method are given, and their results agree well. It is shown that the FDTD based time domain characterization procedure is an excellent broadband simulation tool for the design of multiconductor coupled lines on multilayered PCBs as well as thick or thin hybrid structures.