• 제목/요약/키워드: Hong-Eun

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이차이온질량분석기의 원리와 분석법 동향 (Secondary Ion Mass Spectrometry : Theory and Recent trends)

  • 변미랑;김다영;홍태은
    • 세라미스트
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    • 제22권4호
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    • pp.357-367
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    • 2019

  • Secondary Ion Mass Spectrometry(SIMS) is an analytical method that measures the distribution and concentration of elements or compounds by analyzing the mass of secondary ions released by irradiating ion beams with energy of hundreds eV to 20 keV on the sample surface. Unlike other similar analytical instruments, SIMS directly detect the elemental ions that constitute a sample, allowing you to accurately identify components and obtain concentration information in the depth direction. It is also a great feature for measuring isotopes and analyzing light elements, especially hydrogen. In particular, with the development of materials science, there is an increasing demand for trace concentration analysis and isotope measurements in the micro-regions of various materials. SIMS has a short history compared to other similar methods; nevertheless, SIMS is still advancing in hardware and is expected to contribute to the development of materials science through research and development of advanced analytical techniques.

  • https://doi.org/10.31613/ceramist.2019.22.4.08 인용 PDF

재생불량성 빈혈환자의 삶의 질

  • 송병은;김광성;임정혜;홍은영;박경순;노유자
    • 대한종양간호학회:학술대회논문집
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    • 대한종양간호학회 2001년도 제2회 추계학술대회
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    • pp.126-127
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    • 2001

  • PDF