• Journal of the Korea Institute of Information Security & Cryptology
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• v.19 no.5
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• pp.195-200
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• 2009

CRT-based RSA algorithm, which was implemented on smartcard, microcontroller and so on, leakages secret primes p and q by fault attacks using laser injection, EM radiation, ion beam injection, voltage glitch injection and so on. Among the many fault injection methods, voltage glitch can be injected to target device without any modification, so more practical. In this paper, we made an experiment on the fault injection attack using abnormal source voltage. As a result, CRT-RSA's secret prime p and q are disclosed by fault attack with voltage glitch injection which was introduced by several previous papers, and also succeed the fault attack with source voltage blocking for proper period.

• Journal of the Korea Institute of Information Security & Cryptology
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• v.24 no.1
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• pp.221-227
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• 2014

When implementing cryptographic algorithms in mobile devices like smart cards, the security against side-channel attacks should be considered. Side-channel attacks try to find critical information from the side-channel infromation obtained from the underlying cryptographic devices' execution. Especially, the power analysis attack uses the power consumption profile of the devices as the side-channel information. This paper proposes a new gate-level countermeasure against the power analysis attack and the glitch attack and suggests how to apply the measure to securely implement AES.