• Korean Journal of Materials Research
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• v.29 no.9
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• pp.547-552
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• 2019

In the present study, the thermal conductivity of a silicon nitride($Si_3N_4$) thin-film is evaluated using the dual-wavelength pump-probe technique. A 100-nm thick $Si_3N_4$ film is deposited on a silicon (100) wafer using the radio frequency plasma enhanced chemical vapor deposition technique and film structural characteristics are observed using the X-ray reflectivity technique. The film's thermal conductivity is measured using a pump-probe setup powered by a femtosecond laser system of which pump-beam wavelength is frequency-doubled using a beta barium borate crystal. A multilayer transient heat conduction equation is numerically solved to quantify the film property. A finite difference method based on the Crank-Nicolson scheme is employed for the computation so that the experimental data can be curve-fitted. Results show that the thermal conductivity value of the film is lower than that of its bulk status by an order of magnitude. This investigation offers an effective way to evaluate thermophysical properties of nanoscale ceramic and dielectric materials with high temporal and spatial resolutions.

• Journal of the Korean Chemical Society
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• v.7 no.1
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• pp.58-64
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• 1963

Authors propose a new technique using polyethylene film instead of sodium chloride window as a cell material. Nujol mulls, liquids and aqueous solutions are sandwitched between two pieces of polyethylene film which are held between cardboards. Ordinary lead or stainless steel spacers could be used if exact cell thickness is desired. A more elaborate cell can be assembled by injecting samples between two pieces of polyethylene film which are placed between sodium chloride windows of ordinary demountable liquid cell. The absorption bands due to polyethylene and Nujol are compensated by placing the polyethylene film of suitable thickness in the reference beam. The absorption bands due to solvents such as water can also be compensated by the polyethylene film cell sandwitched solvent of suitable thickness in the reference beam. This method would be a simple new technique. Especially this technique may offer a new helpful way for the investigation of the state of substances in aqueous system. Using this technique, authors have observed the appearance of an absorption bands at 3.2 micron, in the spectrum of phenol in aqueous solution, that is absent in the spectrum of phenol in benzene solution. The same absorption band also has been observed in the spectra of aqueous formaldehyde solution and aqueous polyvinyl alcohol solution, where the absorption bands due to polyethylene and water are compensated. Although it may be regarded that this absorption band is related to the intermolecular interaction between water and the solute having OH group, that is hydrogen bonding. The exact assignment of this absorption band is out of this work.

• Tribology and Lubricants
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• v.11 no.5
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• pp.71-77
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• 1995

The capacitance technique was used to measure the minimum oil film thickness in engine bearing and the central oil film thickness between cam and tappet. This method is based on the measurement of total capacitance of oil film. For the measurement of the oil film thickness between cam and tappet, two surfaces were assumed to be flat and parallel within the Hertzian region and all the measured capacitance originated from this region. Shear rates from the measured minimum oil film thickness are over 10$^{6}$ sec$^{-1}$ in the greater part in both two cases. The minimum oil film thickness in engine bearing is larger than the surface roughness. Between cam and tappet it is mostly smaller than the surface roughness. In spite of the awkward restriction of the reliability of measured oil film thickness, it was known that the capacitance technique makes it possible to measure the oil film thickness in elastohydrodynamic and mixed lubrication regimes as well as in hydrodynamic regime. Therefore, it is also possible to classify the lubrication regimes based on the oil film thickness.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2010.06a
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• pp.250-250
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• 2010

We have prepared CIGS thin film absorber layers with simple solution spray deposition technique and thin film were synthesized with different atomic ratio. CIGS thin films were synthesized using non-vacuum solution deposition method on pre-heated sodalime glass substrates and Mo-coated soadlime glass substrate. In precursor solution were Cu : In : Ga: S ratio 4 : 3 : 2 : 8 and the crystal type of sprayed thin film were CIGS chalcopyrite structures. This structure was identified as typical chalcopyrite tetragonal structure with XRD analysis. This result showed that CIGS solution deposition technique has potential for the one step synthesis and low cost fabrication process for CIS or CIGS thin film absorber layer.

• Mass Spectrometry Letters
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• v.12 no.1
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• pp.26-30
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• 2021

The impurity concentration is a crucial parameter for semiconductor thin films. Evaluating the impurity distribution in silicon thin film is another challenge. In this study, we have investigated the doping concentration of boron in silicon thin film using time of flight secondary ion mass spectrometry in dynamic mode of operation. Boron doped silicon film was grown on i) p-type silicon wafer and ii) borosilicate glass using hot wire chemical vapor deposition technique for possible applications in optoelectronic devices. Using well-tuned SIMS measurement recipe, we have detected the boron counts 101~104 along with the silicon matrix element. The secondary ion beam sputtering area, sputtering duration and mass analyser analysing duration were used as key variables for the tuning of the recipe. The quantitative analysis of counts to concentration conversion was done following standard relative sensitivity factor. The concentration of boron in silicon was determined 1017~1021 atoms/㎤. The technique will be useful for evaluating distributions of various dopants (arsenic, phosphorous, bismuth etc.) in silicon thin film efficiently.

• Proceedings of the Korean Vacuum Society Conference
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• 2013.08a
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• pp.264.2-264.2
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• 2013

Molecular layer deposition (MLD) is sequential, self-limiting surface reaction to form conformal and ultrathin polymer film. This technique generally uses bifunctional precursors for stepwise sequential surface reaction and entirely organic polymer films. Also, in comparison with solution-based technique, because MLD is vapor-phase deposition based on ALD, it allows epitaxial growth of molecular layer on substrate and is especially good for surface reaction or coating of nanostructure such as nanopore, nanochannel, nanwire array and so on. In this study, polyurea film that consisted of phenylenediisocyanate and phenylenediamine was formed by MLD technique. In situ Fourier Transform Infrared (FTIR) measurement on high surface area SiO2 substrate was used to monitor the growth of polyurethane and polyurea film. Also, to investigate orientation of chemical bonding formed polymer film, plan-polarized grazing angle FTIR spectroscopy was used and it showed epitaxial growth and uniform orientation of chemical bones of polyurea films.

• Corrosion Science and Technology
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• v.3 no.6
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• pp.240-244
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• 2004

Recently a variety of electrochemical techniques have been used for the measurement of under-film corrosion of coated steel. Each method has its own characteristic and is suitable to determine some kinds of anti-corrosive mechanisms of coating film. We developed a new under-film corrosion tester (UFCT) which adoped current interrupter technique in principle. Electrochemical parameters can be measured by UFCT. It is possible for the novel under-film corrosion tester to evaluate under-film corrosion of steel covered with high electric resistance coating film which has no defect and is not easy to evaluate it by other methods. Finally some experimental results of protective coating performance obtained by UFCT were discussed.

• Proceedings of the KSME Conference
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• 2001.06d
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• pp.25-30
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• 2001

The liquid fuel film on the cylinder liner is believed to be a major source of engine-out hydrocarbon emissions in SI engines, especially during cold start and warm-up period. Quantifying the liquid fuel film on the cylinder liner is essential to understand the engine-out hydrocarbon emissions formation in SI engines. In this research, two-dimensional visualization was carried out to quantify liquid fuel film on the quartz liner in an SI engine test rig. The visualization was based on laser-induced fluorescence and total reflection. Using a quartz liner and a special lens, only the liquid fuel on the liner was visualized. The calibration technique was developed to quantify the fluorescence signal with the thickness gage and the calibration device. The fluorescence intensity increases linearly with increase in the fuel film thickness on the quartz liner. Using this technique, the distribution of the fuel film thickness on the cylinder liner was measured quantitatively for different valve lifts and injected fuel mass in the test rig.

• Proceedings of the KSME Conference
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• 2001.06a
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• pp.237-242
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• 2001

Residual stress is a dominant obstacle to efficient production and safe usage of products by reducing the mechanical strength and failure properties. Especially, it causes interfacial failure and substrate deflection in the case of thin film. So, the exact evaluation and optimum control of thin film residual stress is indispensable. However, hole drilling or X-ray diffraction techniques have some limits in application to thin film. And, curvature technique for thin film materials cannot give the information about local stress variation. Therefore, we applied the nanoindentation technique in evaluating the thin film residual stress. In this study, we modeled the change of indentation loading curve for residually stressed and stress-free thin films during stress relaxation. The value of residual stress was directly related to the indentation depth change by relaxation. The residual stress from nanoindentation analysis was consistent with the result from curvature technique.

• Imaging Science in Dentistry
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• v.41 no.4
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• pp.161-165
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• 2011

It is difficult to take intraoral radiographs in some patients who are intolerable to place the film in their mouth. For these patients, Newman and Friedman recommended a new technique of extraoral film placement. Here we report various cases that diagnostic imaging was performed in patients using the extraoral periapical technique. This technique was used to obtain the radiographs for the patients with severe gag reflex, pediatric dental patients, and patients with restricted mouth opening. This technique can be recommended as an alternative to conventional intraoral periapical technique in cases where intraoral film placement is difficult to achieve.