• Journal of the Institute of Electronics Engineers of Korea SD
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• v.46 no.3
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• pp.32-40
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• 2009

In order to reduce time-to-market, the demand for fast fault diagnosis has been increased. In this paper, a fault dropping technique with fault candidate ordering and test pattern ordering for fast fault diagnosis is proposed. Experimental results using the full-scanned ISCAS 89 benchmark circuits show the efficiency of the fault dropping technique with fault candidate ordering and test pattern ordering.