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A Fault Dropping Technique with Fault Candidate Ordering and Test Pattern Ordering for Fast Fault Diagnosis  

Lee, Joo-Hwan (Department of Electrical and Electronic Engineering, Yonsei University)
Lim, Yo-Seop (Department of Electrical and Electronic Engineering, Yonsei University)
Kim, Hong-Sik (Department of Electrical and Electronic Engineering, Yonsei University)
Kang, Sung-Ho (Department of Electrical and Electronic Engineering, Yonsei University)
Publication Information
Journal of the Institute of Electronics Engineers of Korea SD / v.46, no.3, 2009 , pp. 32-40 More about this Journal
Abstract
In order to reduce time-to-market, the demand for fast fault diagnosis has been increased. In this paper, a fault dropping technique with fault candidate ordering and test pattern ordering for fast fault diagnosis is proposed. Experimental results using the full-scanned ISCAS 89 benchmark circuits show the efficiency of the fault dropping technique with fault candidate ordering and test pattern ordering.
Keywords
Fault dropping; Fault candidate ordering; Test pattern ordering; Fault diagnosis; Fault simulation;
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