• Title/Summary/Keyword: Failure process

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Numerical simulation on the coupled chemo-mechanical damage of underground concrete pipe

  • Xiang-nan Li;Xiao-bao Zuo;Yu-xiao Zou;Yu-juan Tang
    • Structural Engineering and Mechanics
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    • v.86 no.6
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    • pp.779-791
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    • 2023
  • Long-termly used in water supply, an underground concrete pipe is easily subjected to the coupled action of pressure loading and flowing water, which can cause the chemo-mechanical damage of the pipe, resulting in its premature failure and lifetime reduction. Based on the leaching characteristics and damage mechanism of concrete pipe, this paper proposes a coupled chemo-mechanical damage and failure model of underground concrete pipe for water supply, including a calcium leaching model, mechanical damage equation and a failure criterion. By using the model, a numerical simulation is performed to analyze the failure process of underground concrete pipe, such as the time-varying calcium concentration in concrete, the thickness variation of pipe wall, the evolution of chemo-mechanical damage, the distribution of concrete stress on the pipe and the lifetime of the pipe. Results show that, the failure of the pipe is a coupled chemo-mechanical damage process companied with calcium leaching. During its damage and failure, the concentrations of calcium phase in concrete decrease obviously with the time, and it can cause an increase in the chemo-mechanical damage of the pipe, while the leaching and abrasion induced by flowing water can lead to the boundary movement and wall thickness reduction of the pipe, and it results in the stress redistribution on the pipe section, a premature failure and lifetime reduction of the pipe.

COST TABLE을 이용한 품질코스트 계산에 관한 연구

  • Gang, Gyeong-Sik;Kim, Tae-Ho;Hwang, Gyeong-Su
    • Journal of Korean Society for Quality Management
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    • v.21 no.2
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    • pp.35-47
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    • 1993
  • This study was performed to obtain the internal failure cost in the failure and rework using cost table. The manufacturing cost is different according to each production process. Thierefore, it is difficult to calculate of the manufacturing cost. Using the cost table internal failure cost can be calculated easily in each process.

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The Study for Process Capability Analysis of Software Failure Interval Time (소프트웨어 고장 간격 시간에 대한 공정능력분석에 관한 연구)

  • Kim, Hee-Cheul;Shin, Hyun-Cheul
    • Convergence Security Journal
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    • v.7 no.2
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    • pp.49-55
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    • 2007
  • Software failure time presented in the literature exhibit either constant, monotonic increasing or monotonic decreasing. For data analysis of software reliability model, data scale tools of trend analysis are developed. The methods of trend analysis are arithmetic mean test and Laplace trend test. Trend analysis only offer information of outline content. From the subdivision of this analysis, new attemp needs the side of the quality control. In this paper, we discuss process capability analysis using process capability indexs. Because of software failure interval time is pattern of nonnegative value, instead of capability analysis of suppose to normal distribution, capability analysis of process distribution using to Box-Cox transformation is attermpted. The used software failure time data for capability analysis of process is SS3, the result of analysis listed on this chapter 4 and 5. The practical use is presented.

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Process Evaluation for Reliability Insurance: An Industrial Case Study

  • Hong, Yeon-Woong
    • Journal of the Korean Data and Information Science Society
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    • v.16 no.2
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    • pp.401-410
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    • 2005
  • In this paper, we calculate the premium rate of reliability insurance policy for brake pads for automobiles using real failure data obtained from use-condition. We try process capability analysis for the manufacturing process of brake-system. We describe the performance factors which have an effect on failure characteristics of brake pads. We also obtain the maximum likelihood estimates of shape and scale parameters of the fitted Weibull distribution for brake pads.

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A Technique for Analyzing LSI Failures Using Wafer-level Emission Analysis System

  • Higuchi, Yasuhisa;Kawaguchi, Yasumasa;Sakazume, Tatsumi
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.1 no.1
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    • pp.15-19
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    • 2001
  • Current leakage is the major failure mode of semiconductor device characteristic failures. Conventionally, failures such as short circuit breaks and gate breakdowns have been analyzed and the detected causes have been reflected in the fabrication process. By using a wafer-level emission-leakage failure analysis method (in-line QC), we analyzed leakage mode failure, which is the major failure detected during the probe inspection process for LSIs, typically DRAMs and CMOS logic LSIs. We have thus developed a new technique that copes with the critical structural failures and random failures that directly affect probe yields.

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Study on the Failure Criterion for Finite Element Analysis of Precise Shearing (정밀전단시의 유한요소 해석을 위한 파단기준 연구)

  • 강대철
    • Journal of the Korean Society of Manufacturing Technology Engineers
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    • v.9 no.5
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    • pp.80-86
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    • 2000
  • The Tailor Welded Blanks(TWB) are using various materials (different thickness, strength and different materials) can be welded together prior to the forming process. Therefore, TWB applications have become little by little important in automobile industries, because it has more light weight and process reduction. A burnish area is very important for TWB using laser welding. In this paper, evaluated failure criterion, effect of clearance and distance of between pad and punch by computer simulation. We used element separation method for fracture. And applied a plastic strain to failure criterion. According to the analysis results, we obtain failure criterion, when plastic strain is 2.0. The burnish area and clearance were inverse proportional.

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Detection of Tool Failure by Wavelet Transform (Wavelet 변환을 이용한 공구파손 검출)

  • Yang, J.Y.;Ha, M.K.;Koo, Y.;Yoon, M.C.;Kwak, J.S.;Jung, J.S.
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 2002.05a
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    • pp.1063-1066
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    • 2002
  • The wavelet transform is a popular tool for studying intermittent and localized phenomena in signals. In this study the wavelet transform of cutting force signals was conducted for the detection of a tool failure in turning process. We used the Daubechies wavelet analyzing function to detect a sudden change in cutting signal level. A preliminary stepped workpiece which had intentionally a hard condition was cut by the inserted cermet tool and a tool dynamometer obtained cutting force signals. From the results of the wavelet transform, the obtained signals were divided into approximation terms and detailed terms. At tool failure, the approximation signals were suddenly increased and the detailed signals were extremely oscillated just before tool failure.

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MTBF Estimator in Reliability Growth Model with Application to Weibull Process (와이블과정을 응용한 신뢰성 성장 모형에서의 MTBF 추정$^+$)

  • 이현우;김재주;박성현
    • Journal of Korean Society for Quality Management
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    • v.26 no.3
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    • pp.71-81
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    • 1998
  • In reliability analysis, the time difference between the expected next failure time and the current failure time or the Mean Time Between Failure(MTBF) is of significant interest. Until recently, in reliability growth studies, the reciprocal of the intensity function at current failure time has been used as being equal to MTBE($t_n$)at the n-th failure time $t_n$. That is MTBF($t_n$)=l/$\lambda (t_n)$. However, such a relationship is only true for Homogeneous Poisson Process(HPP). Tsokos(1995) obtained the upper bound and lower bound for the MTBF($t_n$) and proposed an estimator for the MTBF($t_n$) as the mean of the two bounds. In this paper, we provide the estimator for the MTBF($t_n$) which does not depend on the value of the shape parameter. The result of the Monte Carlo simulation shows that the proposed estimator has better efficiency than Tsokos's estimator.

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A Study on the Reliability and Maintainability Analysis Process for Aircraft Hydraulic System (항공기용 유압 시스템 신뢰도 및 정비도 분석 프로세스 고찰)

  • Han, ChangHwan;Kim, KeunBae
    • Journal of the Korean Society of Systems Engineering
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    • v.12 no.1
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    • pp.105-112
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    • 2016
  • An aircraft must be designed to minimize system failure rate for obtaining the aircraft safety, because the aircraft system failure causes a fatal accident. The safety of the aircraft system can be predicted by analyzing availability, reliability, and maintainability of the system. In this study, the reliability and the maintainability of the hydraulic system are analysed except the availability, and therefore the reliability and the maintainability analysis process and the results are presented for a helicopter hydraulic system. For prediction of the system reliability, the failure rate model presented in MIL-HDBK-217F is used, and MTBF is calculated by using the Part Stress Analysis Prediction and quality/temperature/environmental factors described in NPRD-95 and MIL-HDBK-338B. The maintainability is predicted by FMECA(Failure Mode, Effect & Criticality Analysis) based on MIL-STD-1629A.

Automatic Classification of Failure Patterns in Semiconductor EDS Test for Yield Improvement (수율향상을 위한 반도체 EDS공정에서의 불량유형 자동분류)

  • Han Young Shin;Lee Chil Gee
    • Journal of the Korea Society for Simulation
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    • v.14 no.1
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    • pp.1-8
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    • 2005
  • In the semiconductor manufacturing, yield enhancement is an urgent issue. It is ideal to prevent all the failures. However, when a failure occurs, it is important to quickly specify the cause stage and take countermeasure. Reviewing wafer level and composite lot level yield patterns has always been an effective way of identifying yield inhibitors and driving process improvement. This process is very time consuming and as such generally occurs only when the overall yield of a device has dropped significantly enough to warrant investigation. The automatic method of failure pattern extraction from fail bit map provides reduced time to analysis and facilitates yield enhancement. The automatic method of failure pattern extraction from fail bit map provides reduced time to analysis and facilitates yield enhancement. This paper describes the techniques to automatically classifies a failure pattern using a fail bit map.

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