• 한국세라믹학회지
• /
• 제35권5호
• /
• pp.505-511
• /
• 1998

단결정 Si 기판 위에 증착한 Co/Hf과 Co/Nb 이중층으로부터 형성된 Co 실리사이드의 성장기구에 대하여 조사하였다. 두 경우 모두 500$^{\circ}C$ 이상에서 CoSi2가 주로 형성되었으나 그 결정방위의 성장양상은 서로 달랐다. Co/Hf/(100)Si 구조에서는 Si 기판과 에피텍셜 관계를 갖는 결정립과 그렇지 않은 결정립이 서로 혼합되어 성장하였다. 그러나 Co/Nb/(100)Si에서는 처음부터 에피텍셜 관계를 갖지 않는 결정립들만이 형성되었다. 동일한 구조임에도 불구하고 이렇게 내열금속 중간층에 따라 성장된 실리사이드의 결정방위가 달라지는 것으 안정한 반응제어층의 형성 및 고온에서의 그 분해과정과 관련이 있었다. 여러 구성원소들로 이루어진 반응제어층이 고온까지 안정할 경우에는 Co의 확산이동을 균일하게 제어하여 실리사이드의 에피텍셜 성장이 가능하다.

• 한국전기전자재료학회:학술대회논문집
• /
• 한국전기전자재료학회 2001년도 추계학술대회 논문집 Vol.14 No.1
• /
• pp.480-483
• /
• 2001

Epitaxial rutile-$TiO_2$ and anatase-$TiO_2$ films were grown at $800^{\circ}C$ on $Al_2O_3$ (1102) and $LaAlO_3$ (001), respectively, using pulsed laser deposition. The formation of different phases on different substrates could be qualitatively explained by the atomic arrangements at the interfaces. We also successfully deposited epitaxial rutile-$TiO_2$ and anatase-$TiO_2$ films on conductive $RuO_2$ and $La_{0.5}Sr_{0.5}CoO_{3}$ electrodes, respectively. Using a Kelvin probe, we measured the photovoltaic properties of these multilayer structures. A rutile-$TiO_2$ film grown on $RuO_2$ showed a very broad peak in the visible light region. An epitaxial anatase-$TiO_2$ film grown on $La_{0.5}Sr_{0.5}CoO_{3}$ showed a strong peak with a threshold energy of 3.05 eV.

• 한국자기학회지
• /
• 제2권1호
• /
• pp.8-14
• /
• 1992

${\gamma}-Fe_{2}O_{3}$ 입자의 보자력 특성을 향상시키기 위해 ${\gamma}-Fe_{2}O_{3}$ 입자표면상에 코발트 훼라이트를 결정화시켜 코발트 에피탁시얼 ${\gamma}-Fe_{2}O_{3}$ 입자를 제조하 였다. 피착층인 $Co_{x}Fe_{3-x}O_{4}$의 보자력은 x=1인 조성에서 가장 우수한 특성을 나타내었다. 반응 분위기를 초기 비산화성에서 산화성 분위기로 제어하여 제조한 시료의 자기 특성이 가장 우수하였으며 반응온도 $90^{\circ}C$에서 30분간 반응하면 ${\gamma}-Fe_{2}O_{3}$ 입자표면상에서의 코발트 훼라이트 피착 반응이 완료되었다.

• 한국표면공학회지
• /
• 제43권4호
• /
• pp.170-175
• /
• 2010

The GaAs epitaxial layers were grown on Si(100) substrates by molecular beam epitaxy(MBE) using the two-step method. The Si(100) substrates were cleaned with different surface cleaning method of vacuum heating, As-beam, and Ga-beam at the substrate temperature of $800^{\circ}C$. Growth temperature and thickness of the GaAs epitaxial layer were $800^{\circ}C$ and 1 ${\mu}m$, respectively. The surface structure and epitaxial growth were observed by reflection high-energy electron diffraction(RHEED) and scanning electron microscope(SEM). Just surface structure of the Si(100) substrate cleaned by Ga-beam at $800^{\circ}C$ shows double domain ($2{\times}1$). RHEED patterns of the GaAs epitaxial layers grown on Si(100) substrates with cleaning method of vacuum heating, As-beam, and Ga-beam show spot-like, ($2{\times}4$) with spot, and clear ($2{\times}4$). From SEM, it is found that the GaAs epitaxial layers grown on Si(100) substrates with Ga-beam cleaning has a high quality.

• 한국결정성장학회지
• /
• 제9권5호
• /
• pp.504-509
• /
• 1999

In-situ cleaning and subsequent silicon epitaxial film growth were performed in a load-locked reactor equipped with Hg-grid UV lamp and PBN heater to obtain the smooth and contaminant-free underlying surface and develop low-temperature epitaxial film growth process. The removals of organic and native oxide were investigated using UV-excited $O_2$ and $NF_{3}/H_{2}$, and the effect of the surface condition was examined on the quality of silicon epitaxial film grown at temperature as low as $750^{\circ}C$. UV-excited gas phase cleaning was found to be effective in removing the organic and native oxide successfully providing a smooth surface with RMS roughness of 0.5$\AA$ at optimal condition. Crystalline quality of epitaxial film was determined by smoothness of cleaned surface and the presence of native oxide and impurity. Crystalline defects such as dislocation loops or voids due to the surface roughness were observed by XTEM.

• 한국전기전자재료학회:학술대회논문집
• /
• 한국전기전자재료학회 2001년도 추계학술대회 논문집
• /
• pp.480-483
• /
• 2001

Epitaxial rutile-TiO$_2$ and anatase-TiO$_2$ films were grown at 80$0^{\circ}C$ on $Al_2$O$_3$ (1102) and LaAlO$_3$ (001), respectively, using pulsed laser deposition. The formation of different phases on different substrates could be qualitatively explained by the atomic arrangements at the interfaces. We also successfully deposited epitaxial rutile-TiO$_2$ and anatase-TiO$_2$ films on conductive RuO$_2$ and La$_{0.5}$Sr$_{0.5}$CoO$_3$ electrodes, respectively Using a Kelvin probe, we measured the photovoltaic properties of these multilayer structures. A rutile-TiO$_2$ film grown on RuO$_2$ showed a very broad peak in the visible light region. An epitaxial anatase-TiO$_2$ film grown on La$_{0.5}$Sr$_{0.5}$CoO$_3$ showed a strong peak with a threshold energy of 3.05 eV 3.05 eV

• E2M - 전기 전자와 첨단 소재
• /
• 제16권9호
• /
• pp.63.2-64
• /
• 2003

Epitaxial yttrium-stabilized HfO$_2$ thin films were deposited on p-type (100) Si substrates by pulsed laser deposition at a relatively lower substrate temperature of 550. Transmission electron microscopy observation revealed a fixed orientation relationship between the epitaxial film and Si; that is, (100)Si.(100)HfO$_2$ and [001]Si/[001]HfO$_2$. The film/Si interface is not atomically flat, suggesting possible interfacial reaction and diffusion, X-ray photoelectron spectrum analysis also revealed the interfacial reaction and diffusion evidenced by Hf silicate and Hf-Si bond formation at the interface. The epitaxial growth of the yttrium stabilized HfO$_2$ thin film on bare Si is via a direct growth mechanism without involoving the reaction between Hf atoms and SiO$_2$ layer. High-frequency capacitance-voltage measurement on an as-grown 40-A yttrium-stabilized HfO$_2$ epitaxial film yielded an dielectric constant of about 14 and equivalent oxide thickness to SiO$_2$ of 12 A. The leakage current density is 7.0${\times}$ 10e-2 A/$\textrm{cm}^2$ at 1V gate bias voltage.

• 한국결정성장학회지
• /
• 제11권5호
• /
• pp.207-210
• /
• 2001

Metal-organic VPE (MOVPE) epitaxial growth procedure and related device fabrication technique are reported for GaInP-based epitaxial materials and devices. For GaInP/GaInAs two-dimensional electron-gas field-effect transistor (TEGFET), a promising epitaxial stacking structure resulting in enhanced electron mobility is given. In conjunction with this, a new device fabrication technique to improve luminous intensity of GaInP-based LED is also shown.

• 한국표면공학회지
• /
• 제14권3호
• /
• pp.137-141
• /
• 1981

니켈 도금의 표면 조직과 두께에 따른 조직의 변화를 투과 전자 현미경을 사용하여 관찰하였다. epitaxial deposit층의 두께는 도금 용액 속에 들어있는 외부 물질에 따라 변화하게 되며, substrate의 결정 방향에 따라 또한 변화한다. (110)면 보다는 (100)면에 도금했을 때 epitaxial deposit 층의 두께가 더 큰 것을 알 수 있었다. non-epitaxial 층으로 변화되는 과정은 hillock의 생성과 계속되는 Twinning에 의해 이루어졌다.

• 대한전기학회:학술대회논문집
• /
• 대한전기학회 1987년도 전기.전자공학 학술대회 논문집(I)
• /
• pp.532-535
• /
• 1987

A laser interferometry of very high spatial resolution was built to study the solid phase epitaxial regrowth of furnace-annealed silicon wafers. As boron concentration increases up to $1.0E20/cm^3$, regrowth rate increases, but pre-exponential term and activation energy are decreased.