• Proceedings of the Safety Management and Science Conference
• /
• 2007.11a
• /
• pp.275-298
• /
• 2007

Recently, all kind of 21C-typed electronic goods show the tendency of hightechnology and digital convergence rapidly. Also, failure mechanism which differs from original goods concept presents. Today, failure mechanism which differs from one that was happened by restricted harmful environment material before adapted the raw of environment material is changing the paradigm of reliability engineering. Thus, when applied the environment matter of original and secondary material at the electronic goods were removed, reliability assessment method and prediction stay into low level. This study suggests as solution to overcome these phenomenon. The study on the management method of environmental restriction substances which is recognized as important element in the reliability assessment about environment material of electronic goods and the study on reliability assessment method of PWB without environment material are progressed.

• Journal of the Korea Safety Management & Science
• /
• v.9 no.6
• /
• pp.55-68
• /
• 2007

Recently, all kind of 21C-typed electronic goods show the tendency of hightechnology and digital convergence rapidly. Also, failure mechanism which differs from original goods concept presents. Today, failure mechanism which differs from one that was happened by restricted harmful environment material before adapted the raw of environment material is changing the paradigm of reliability engineering. Thus, when applied the environment matter of original and secondary material at the electronic goods were removed, reliability assessment method and prediction stay into low level. This study suggests as solution to overcome these phenomenon. The study on the management method of environmental restriction substances which is recognized as important element in the reliability assessment about environment material of electronic goods and the study on reliability assessment method of PWB without environment material are progressed.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
• /
• 2001.07a
• /
• pp.11-14
• /
• 2001

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
• /
• 2001.05b
• /
• pp.1-7
• /
• 2001

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
• /
• 2002.07a
• /
• pp.9-12
• /
• 2002

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
• /
• 1989.06a
• /
• pp.1-1
• /
• 1989

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
• /
• 1989.06a
• /
• pp.6-7
• /
• 1989

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
• /
• 1989.06a
• /
• pp.62-62
• /
• 1989

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
• /
• 2003.07a
• /
• pp.5-11
• /
• 2003

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
• /
• 2003.07a
• /
• pp.12-15
• /
• 2003