• Journal of the Korean Ceramic Society
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• v.37 no.11
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• pp.1126-1129
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• 2000

The crystallographic orientations of $Ba_{0.6}$S $r_{0.4}$Ti $O_3$(BST) thin film deposited by a metal-organic chemical vapor deposition on (111) textured Pt electrode were studied with a transmission electron microscopy. The fully crystallized BST thin film (50nm) has (100) and (110) preferred orientations. A high resolution transmission electron microscopy study has revealed the crystallographic orientation relationships between BST thin film and Pt electrode. These relationships explained the preferred orientation of BST film on (111) textured Pt electrode. With these results, we could represent the atomic arrangement at the BST/Pt interface.e.e.

• Proceedings of the Korean Powder Metallurgy Institute Conference
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• 2006.09a
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• pp.472-473
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• 2006

Maghemite and hematite nanospheres were synthesized by using the Sol-gel technique. The structural properties of these nanosphere powders were characterized by X-ray diffraction (XRD), transmission electron microscopy (TEM), field emission scanning electron microscopy (FESEM), and pore size distribution. Hematite phase shows crystalline structures. The mean particle size that resulted from BET and XRD analyses were 4.9 nm and 2 nm. It can be seen from transmission electron microscopy that the size of the particles are very small which is in good agreement with the FESEM and the X-ray diffraction. The BET and pore size method were employed for specific surface area determination.

• Korean Journal of Metals and Materials
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• v.47 no.5
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• pp.311-315
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• 2009

2-dimensional (2D) dopant profiling in semiconductor device was carried out by electron holography and scanning capacitance microscopy methods with the same multi-layered p-n junction sample. The dopant profiles obtained from two methods are in good agreement with each other. It demonstrates that reliability of dopant profile measurement can be increased through precise comparison of 2D profiles obtained from various techniques.

• Applied Microscopy
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• v.50
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• pp.15.1-15.6
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• 2020

Sample preparation including dehydration and drying of samples is the most intricate part of scanning electron microscopy. Most current sample preparation protocols use critical-point drying with liquid carbon dioxide. Very few studies have reported samples that were dried using chemical reagents. In this study, we used hexamethyldisilazane, a chemical drying reagent, to prepare plant samples. As glandular trichomes are among the most fragile and sensitive surface structures found on plants, we used Millingtonia hortensis leaf samples as our study materials because they contain abundant glandular trichomes. The results obtained using this new method are identical to those produced via critical-point drying.

• Applied Microscopy
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• v.50
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• pp.8.1-8.7
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• 2020

Two thickness measurement methods using an electron energy loss spectroscopy (EELS) and 10a convergent beam electron diffraction (CBED) were compared in an Fe-18Mn-0.7C alloy. The thin foil specimen was firstly tilted to satisfy 10a two-beam condition. Low loss spectra of EELS and CBED patterns were acquired in scanning transmission electron microscopy (STEM) and TEM-CBED modes under the two-beam condition. The log-ratio method was used for measuring the thin foil thickness. Kossel-Möllenstedt (K-M) fringe of the $13{\ba{1}}$ diffracted disk of austenite was analyzed to evaluate the thickness. The results prove the good coherency between both methods in the thickness range of 72 ~ 113 nm with a difference of less than 5%.

• 한국전자현미경학회:학술대회논문집
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• 1992.05a
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• pp.24-25
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• 1992

• Proceedings of the Petrological Society of Korea Conference
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• 2009.05a
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• pp.9-9
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• 2009

• Applied Microscopy
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• v.25 no.2
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• pp.80-87
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• 1995

An analytical electron microscope system has been widely used in biology, medicine, veterinary medicine, agriculture, and materials, etc. nowadays in Korea Market since mid of 1980's. How to install and to choose the equipments? The answers are which prerequisites are needed to us. The purpose is going to introduce the prerequisites of the pre-installation and installation of Philips analytical electron microscope(CM 12/STEM and SEM 515, Philips, The Netherlands) in the National Institute of Safety Research, Seoul and to discuss the check-subjects. The check-subjects in the pre-installation and installation are more than 24. The influence of magnetic fields, mechanical vibrations, earth is crucial factor for decision of installation site. The areas of our electron microscope center are $105.6m^2$ and have the Automatic Image Analyzer System(IBAS, Kontron Co., Germany) connecting to the SEM mode. Water temperature was controlled by the NESLAB recirculatory chillers(NESLAB Co., U.S.A.).

• Journal of the Korean Crystal Growth and Crystal Technology
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• v.6 no.4
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• pp.543-551
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• 1996

The use of reflection high energy electron diffraction and reflection electron microscopy technique has been increased with increasing number of studieds on surfaces of single crystals and epitaxial growth layers. Here, the speciment preparation techniques are summerized for these two techniques which are not so polular in the country. The panoramic reflection high energy electron diffraction maps have been completed and an example of Pt(111) surface was demonstrated.

• Applied Microscopy
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• v.46 no.4
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• pp.244-252
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• 2016

This paper describes a new design of carbon nanotube tip. $Nanocly^{TM}$ NC 7000 Thin Multiwall Carbon Nanotubes of carbon purity (90%) and average diameter tube 9.5 nm with a high aspect-ratio (>150) were used. These tips were manufactured by employing a drawing technique using a glass puller. The glass microemitters with internal carbon nanotubes show a switch-on effect to a high current level (1 to $20{\mu}A$). A field electron microscope with a tip (cathode)-screen (anode) separation at ~10 mm was used to characterize the electron emitters. The system was evacuated down to a base pressure of ${\sim}10^{-9}$ mbar when baked at up to ${\sim}200^{\circ}C$ overnight. This allowed measurements of typical Field Electron Emission characteristics; namely the current-voltage (I-V) characteristics and the emission images on a conductive phosphorus screen (the anode). Fowler-Nordheim plots of the current-voltage characteristics show current switch-on for each of these emitters.