• Title/Summary/Keyword: Electro-static chuck

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Synthesis of Electro-conducting Macroporous Aluminosilicate-Carbon Nanocomposite (전기전도성을 가지는 매크로다공성 알루미노실리케이트-탄소 복합체 제조)

  • Choi, Kwang Min;Cho, Woo-Seok;Kim, Jong-Young;Jung, Jong-Yeol;Baik, Seung-Woo;Lee, Kyu Hyoung
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.30 no.2
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    • pp.67-73
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    • 2017
  • Recently, macroporous ceramic materials with high electrical conductivity and mechanical strength are urgently needed for semiconductor and display manufacturing devices. In this work, we obtained electro-conducting macroporous aluminosilicate ceramics having surface resistivity of 108~1,010 ohm by dispersing electro-conducting carbon in ceramic matrix. By addition of 0.5~3.0 wt% frit glass, chemical bonding between grains was strengthened, and flexural strength was enhanced up to 160 MPa as a result. We evaluated the characteristics of present ceramics as vacuum chuck module for liquid crystal display display manufacturing devices.

Plasma Dechucking Process를 이용한 Dynamic Alignment Error 개선

  • Yu, Jin-Gyun;Chae, Min-Cheol;Yun, Jeong-Bong;Kim, Jong-Geuk
    • Proceedings of the Korean Vacuum Society Conference
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    • 2016.02a
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    • pp.203.1-203.1
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    • 2016
  • Poly etch 설비에서 발생하는 dechuck 불량에 의한 Dynamic Alignment(DA) error는 poly etch 설비에서의 고질 적인 문제이다. 발생 원인은 ElectroStatic Chuck(ESC)의 노후화 혹은process plasma에 의한 attack 등으로 ESC와 wafer간 dechucking이 진행될 때 wafer내의 전하가 완전히 discharge되지 못하여 wafer Sticking에 의한 sliding이 발생되며 심해지면 Dynamic Alignment(DA) Error가 발생한다. DA error 발생 되면 particle down으로 wafer는 scrap 되며 DA error가 지속적으로 발생하는 설비는 ESC 교체를 하고 있다. ESC 교체비용도 매우 크며 교체 전까지 설비가 멈추어있는 시간적인 손실이 발생하게 된다. Dechucking을 진행할 때 Wafer에 잔존하는 전하를 제거 하여 Wafer의 sticking을 줄여 DA error를 근원적으로 방지하기 위해 plasma를 이용하여 wafer와 ESC를 하나의 electric circuit으로 연결시키는 방법으로 wafer에 잔존하는 전하를 제거 시키고자 하였다.

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Structural characterization of $Al_2O_3$ layer coated with plasma sprayed method (플라즈마 스프레이 방법으로 코팅 된 $Al_2O_3$막의 구조적 특성)

  • Kim, Jwa-Yeon;Yu, Jae-Keun;Sul, Yong-Tae
    • Journal of the Korean Crystal Growth and Crystal Technology
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    • v.16 no.3
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    • pp.116-120
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    • 2006
  • We have investigated plasma spray coated $Al_2O_3$ layers on Al-60 series substrates for development of wafer electrostatic chuck in semiconductor dry etching system. Samples were prepared without/with cooling bar on backside of samples, at various distances, and with different powder feed rates. There were many cracks and pores in the $Al_2O_3$ layers coated on Al-60 series substrates without cooling bar on the backside of samples. But the cracks and pores were almost disappeared in the $Al_2O_3$ layers on Al-60 series substrates coated with cooling bar on the back side of samples, 15 g/min. powder feed rate and various 60, 70, 80 mm working distances. Then the surface morphology was not changed with various working distances of 60, 70, 80 mm. When the powder feed rate was changed from 15 g/min to 20 g/min, the crack did not appear, but few pores appeared. Also the $Al_2O_3$ layer was coated with many small splats compared with $Al_2O_3$ layer coated with 15 g/min powder feed rate. The deposited rate of $Al_2O_3$ layer was higher when the process was done without cooling bar on the back side of sample than that with cooling bar on the back side of sample.