• Title/Summary/Keyword: Edge Pattern Recognition

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The Performance Advancement of Test Algorithm for Inner Defects in Semiconductor Packages (반도체 패키지의 내부 결함 검사용 알고리즘 성능 향상)

  • 김재열;윤성운;한재호;김창현;양동조;송경석
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 2002.10a
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    • pp.345-350
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    • 2002
  • In this study, researchers classifying the artificial flaws in semiconductor packages are performed by pattern recognition technology. For this purposes, image pattern recognition package including the user made software was developed and total procedure including ultrasonic image acquisition, equalization filtration, binary process, edge detection and classifier design is treated by Backpropagation Neural Network. Specially, it is compared with various weights of Backpropagation Neural Network and it is compared with threshold level of edge detection in preprocessing method fur entrance into Multi-Layer Perceptron(Backpropagation Neural network). Also, the pattern recognition techniques is applied to the classification problem of defects in semiconductor packages as normal, crack, delamination. According to this results, it is possible to acquire the recognition rate of 100% for Backpropagation Neural Network.

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The Performance Advancement of Test Algorithm for Inner Defects In Semiconductor Packages (반도체 패키지의 내부 결함 검사용 알고리즘 성능 향상)

  • Kim J.Y.;Kim C.H.;Yoon S.U.
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 2005.10a
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    • pp.721-726
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    • 2005
  • In this study, researchers classifying the artificial flaws in semiconductor. packages are performed by pattern recognition technology. For this purposes, image pattern recognition package including the user made software was developed and total procedure including ultrasonic image acquisition, equalization filtration, binary process, edge detection and classifier design is treated by Backpropagation Neural Network. Specially, it is compared with various weights of Backpropagation Neural Network and it is compared with threshold level of edge detection in preprocessing method for entrance into Multi-Layer Perceptron(Backpropagation Neural network). Also, the pattern recognition techniques is applied to the classification problem of defects in semiconductor packages as normal, crack, delamination. According to this results, it is possible to acquire the recognition rate of 100% for Backpropagation Neural Network.

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A Survey of Shape Descriptors in Computer Vision (컴퓨터비전에서 사용되는 모양표시자의 현황)

  • 유헌우;장동식
    • Journal of Institute of Control, Robotics and Systems
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    • v.9 no.2
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    • pp.131-139
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    • 2003
  • Shape descriptors play an important role in systems for object recognition, retrieval, registration, and analysis. Seven well-known descriptors including MPEG-7 visual descriptors arebriefly reviewed and a new robust pattern recognition descriptor is proposed. Performance comparison among descriptors are presented. Experiments show that the newly proposed descriptor yields better performance results than Fourier, invariant moment, and edge histogram descriptors.

A Study of Improving LDP Code Using Edge Directional Information (에지 방향 정보를 이용한 LDP 코드 개선에 관한 연구)

  • Lee, Tae Hwan;Cho, Young Tak;Ahn, Yong Hak;Chae, Ok Sam
    • Journal of the Institute of Electronics and Information Engineers
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    • v.52 no.7
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    • pp.86-92
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    • 2015
  • This study proposes new LDP code to improve facial expression recognition rate by including local directional number(LDN), edge magnitudes and differences of neighborhood edge intensity. LDP is less sensitive on the change of intensity and stronger about noise than LBP. But LDP is difficult to express the smooth area without changing of intensity and if background image has the similar pattern with a face, the facial expression recognition rate of LDP is low. Therefore, we make the LDP code has the local directional number and the edge strength and experiment the facial expression recognition rate of changed LDP code.

Face Detection in Near Infra-red for Human Recognition (휴먼 인지를 위한 근적외선 영상에서의 얼굴 검출)

  • Lee, Kyung-Sook;Kim, Hyun-Deok
    • Journal of Digital Contents Society
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    • v.13 no.2
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    • pp.189-195
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    • 2012
  • In this paper, face detection method in NIR(Near-InfraRed) images for human recognition is proposed. Edge histogram based on edge intensity and its direction, has been used to detect effectively faces on NIR image. The edge histogram descripts and discriminates face effectively because it is strong in environment of lighting change. SVM(Support Vector Machine) has been used as a classifier to detect face and the proposed method showed better performance with smaller features than in ULBP(Uniform Local Binary Pattern) based method.

Development and Characterization of Pattern Recognition Algorithm for Defects in Semiconductor Packages

  • Kim, Jae-Yeol;Yoon, Sung-Un;Kim, Chang-Hyun
    • International Journal of Precision Engineering and Manufacturing
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    • v.5 no.3
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    • pp.11-18
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    • 2004
  • In this paper, the classification of artificial defects in semiconductor packages is studied by using pattern recognition technology. For this purpose, the pattern recognition algorithm includes the user made MATLAB code. And preprocess is made of the image process and self-organizing map, which is the input of the back-propagation neural network and the dimensionality reduction method, The image process steps are data acquisition, equalization, binary and edge detection. Image process and self-organizing map are compared to the preprocess method. Also the pattern recognition technology is applied to classify two kinds of defects in semiconductor packages: cracks and delaminations.

Chip type discrimination by pattern recognition technique (패턴인식 기술에 의한 칩형태 판별)

  • Kang, Jong-Pyo;Choi, Man-Sung;Song, Ji-Bok
    • Journal of the Korean Society for Precision Engineering
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    • v.5 no.4
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    • pp.32-38
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    • 1988
  • Apaptive cintrol of machine tool is aimed to change cutting state satis- factorily without aid of a machine operator, if the cuting state is abnomal such as formation of tangled ribbon type chip, built-up edge and generation of chattering and so on. Among these the recognition of chip type is one of the most important since it has imlications relate to : 1. Safety of operator 2. Stoppage of work due to entanglment in tool and workpiece of chip 3. Problem of producted chip control In this paper the chip type is discriminatied by the pattern recognition technique. It is found that the power spectrum of cutting force for each chip type has it's own special pattern. Linear discriminant function for the recognition of the chip type is obtained by learning process. The discriminant function can be the basis of adaptive control for the rate of success of recognition by pattern recognition technique is at leasthigher than 83%.

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Robust Facial Expression Recognition Based on Local Directional Pattern

  • Jabid, Taskeed;Kabir, Md. Hasanul;Chae, Oksam
    • ETRI Journal
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    • v.32 no.5
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    • pp.784-794
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    • 2010
  • Automatic facial expression recognition has many potential applications in different areas of human computer interaction. However, they are not yet fully realized due to the lack of an effective facial feature descriptor. In this paper, we present a new appearance-based feature descriptor, the local directional pattern (LDP), to represent facial geometry and analyze its performance in expression recognition. An LDP feature is obtained by computing the edge response values in 8 directions at each pixel and encoding them into an 8 bit binary number using the relative strength of these edge responses. The LDP descriptor, a distribution of LDP codes within an image or image patch, is used to describe each expression image. The effectiveness of dimensionality reduction techniques, such as principal component analysis and AdaBoost, is also analyzed in terms of computational cost saving and classification accuracy. Two well-known machine learning methods, template matching and support vector machine, are used for classification using the Cohn-Kanade and Japanese female facial expression databases. Better classification accuracy shows the superiority of LDP descriptor against other appearance-based feature descriptors.

Optical Pattern Recognition System using a $BaTiO_3$ Single Crystal ($BaTiO_3$ 단결정을 이용한 광패턴인식)

  • 권원현;이권연;오창석;박한규
    • The Journal of Korean Institute of Communications and Information Sciences
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    • v.14 no.4
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    • pp.398-404
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    • 1989
  • Optical pattern recognition system using real-time hologram mechanism in a photorefractive $BaTiO_2$ single crystal is analyzed and experimented. Edge enhancement technique is introduced for enhancing pattern discrimination capability, and patterns can be recognized within 8 sec with 5.5mW low incident light intensity.

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Improved Edge Detection Algorithm Using Ant Colony System (개미 군락 시스템을 이용한 개선된 에지 검색 알고리즘)

  • Kim In-Kyeom;Yun Min-Young
    • The KIPS Transactions:PartB
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    • v.13B no.3 s.106
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    • pp.315-322
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    • 2006
  • Ant Colony System(ACS) is easily applicable to the traveling salesman problem(TSP) and it has demonstrated good performance on TSP. Recently, ACS has been emerged as the useful tool for the pattern recognition, feature extraction, and edge detection. The edge detection is wifely utilized in the area of document analysis, character recognition, and face recognition. However, the conventional operator-based edge detection approaches require additional postprocessing steps for the application. In the present study, in order to overcome this shortcoming, we have proposed the new ACS-based edge detection algorithm. The experimental results indicate that this proposed algorithm has the excellent performance in terms of robustness and flexibility.