• Journal of the Korean Society of Hazard Mitigation
• /
• v.8 no.6
• /
• pp.1-5
• /
• 2008

As bare Fiber Bragg Grating (FBG) sensors are very fragile, bare FBG without encapsulation is not properly applied in practical infrastructures directly due to the harsh environment in practical engineering. Steel sleeve packaged FBG strain sensor is widely used in civil engineering. Since FBG senses both strain and temperature simultaneously, for accurate measurement of strain, temperature compensation for FBG strain sensors is indispensable. In this paper, based on the FBG's strain and temperature sensing principles, the temperature compensation techniques for steel sleeve packaged FBG sensors are brought forward. And the experiment of concrete early-age shrinkage monitoring by dual FBG sensors is carried out to test the feasibility of the temperature compensation technique.

• Korean Journal of Optics and Photonics
• /
• v.8 no.4
• /
• pp.333-339
• /
• 1997

We fabricated a sensor head which consists of spliced different-diameter fiber gratings for discrimination between strain and temperature. Because the fibers were drawn from the same preform, their temperature characteristics were the same but not for strain sensitivities which are inversely proportional to fibers cross-sectional areas. In measurement range of 0-1500$\mu$strain and 20-10$0^{\circ}C$, we could obtain, by using the matrix calculation, the unknown physical quantities within 10% of calculation error compared with the micrometer and thermocouple values. To improve the strain measurement accuracy, we suggest a new, novel method which deploys an unbalanced fiber Mach-Zehnder interferometer. This new signal processing technique converts the strain information to interference signal amplitude variation, temperature-independently. we obtained measurement accuracy nearly 80 times better than that obtainable with the conventional optical spectrum analyzer usage.

• Publications of The Korean Astronomical Society
• /
• v.26 no.1
• /
• pp.45-54
• /
• 2011

KASI and Seoul National University developed the Fast Imaging Solar Spectrograph (FISS) as one of major scientific instruments for the 1.6 m New Solar Telescope (NST) and installed it in the Coude room of the NST at Big Bear Solar Observatory (BBSO) in May, 2010. The major objective of the FISS is to study the fine-scale structures and dynamics of plasma in the photosphere and chromosphere. To achieve it, the FISS is required to take data with a spectral resolution higher than $10^5$ at the spectrograph mode and a temporal resolution less than 10 seconds at the imaging mode. The FISS is a spectrograph using Echelle grating and has characteristics that can observe dual bands (H${\alpha}$ and CaII 8542) simultaneously and perform fast imaging using fast raster scan and two fast CCD cameras. In this paper, we introduce briefly the whole process of FISS development from the requirement analysis to the first observations.

• Korean Journal of Optics and Photonics
• /
• v.4 no.1
• /
• pp.15-21
• /
• 1993

This paper describes the design and development of a KrF excimer laser stepper and discusses the detailed system parameters and characterization data obtained from the performance test. We have developed a deep UV step-and-repeat system, operating at 248 nm, by retrofitting a commercial modules such as KrF excimer laser, precision wafer stage and fused silica illumination and 5X projection optics of numerical aperture 0.42. What we have developed, to the basic structure, are wafer alignment optics, reticle alignment system, autofocusing/leveling mechanisms and environment chamber. Finally, all these subsystem were integrated under the control of microprocessor-based controllers and computer. The wafer alignment system comprises the OFF-AXIS and the TTL alignment. The OFF-AXIS alignment system was realized with two kinds of optics. One is the magnification system with the image processing technique and the other is He-Ne laser diffraction type system using the alignment grating on the wafer. 'The TTL alignment system employs a dual beam inteferometric method, which takes advantages of higher diffraction efficiency compared with other TTL type alignment systems. As the results, alignment accuracy for OFF-AXIS and TTL alignment system were obtained within 0.1 $\mu\textrm{m}$/ 3 $\sigma$ for the various substrate on the wafers. The wafer focusing and leveling system is modified version of the conventional systems using position sensitive detectors (PSD). This type of detection method showed focusing and leveling accuracies of about $\pm$ 0.1 $\mu\textrm{m}$ and $\pm$ 0.5 arcsec, respectively. From the CD measurement, we obtained 0.4 $\mu\textrm{m}$ resolution features over the full field with routine use, and 0.3 $\mu\textrm{m}$ resolution was attainable under more strict conditions.