• 제목/요약/키워드: Digial IF

검색결과 3건 처리시간 0.019초

SDR-Platform 구현을 위한 Digital IF Up/Down Converter 설계 (Design Digital IF Up/Down Converter for SDR Platform Implementation)

  • 이용철;오창헌
    • 한국정보통신학회:학술대회논문집
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    • 한국해양정보통신학회 2006년도 춘계종합학술대회
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    • pp.961-965
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    • 2006
  • 본 논문에서는 Digital IF(Intermediate Frequency) 기술을 이용한 Up/Down 변환기를 설계하고, 이에 대한 성능을 평가하였다. Digital IF 기술을 사용하는 이유는 passive 소자로 구성되어진 IF주파수 영역은 고정되어진 한 주파수 밖에 사용하지 못하지만, Digital IF로 구성되어지면 보드의 외형적인 변경 없이 다양한 통신 주파수 영역에서 유연성 있게 사용이 가능하게 된다. 이러한 구성은 기존의 아날로그 헤테로다인 방식에 비하여 높은 유연성을 가지며, 우수한 성능향상을 보여준다.

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지상 방송용 고선명 텔레비젼을 위한 전 디지탈 모뎀 (An all-digial HDTV modem for terrestrial broadcasting)

  • 한동석;신현수;최양석;송동일
    • 한국통신학회논문지
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    • 제21권7호
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    • pp.1777-1786
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    • 1996
  • This paper describes theories and implementation techniques of a digital high-definition television(HDTV) modem based on 32-QAM for terrestrial broadcasting. We proposed a digital demodulation scheme and a symbol timing recovery structure based on the band edge component maximization(BECM) method. The adaptive equalizer has 256 complex taps to remove the multipath of delays ranging from -2.mu.s~+24.mu.s with a new T/2-spaced blind equalization algorithm. computer simulation results reveal that the proposed algorithm outperforms other conventional blind equalization algorithm a digital HDTV modem with 4.91MHz symobol rate is implemented by utilizing the proposed algorithms. All processings for modem operations such as demodulation, estimation of symbol timing phase error, adaptive equalization, and carrier recovery except IF signal processing and sampling phase control part of the AD converter are done in digital domain. Especially, the carrier recovery loop can track a carrier offset of upto .+-.350KHz.

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전류 센서를 이용한 디지탈 논리회로의 고장 검출 (On the detection of faults on digital logic circuits using current sensor)

  • 신재흥;임인칠
    • 전자공학회논문지A
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    • 제33A권2호
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    • pp.173-183
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    • 1996
  • In this paper, a new structure that can do fault detection and location of digial logic circuits more efficiently using current testing techniques is proposed. In the conventional method, observation point for steady state power supply current was only one, but in the proposed method more fault classes are divided for fault detection and location through the ovservation of steady state power supply current at two points. Also, it is shown that this structure can be easily applied in detection of stuck-open fault which is not easy to do testing with conventional current testing techniques. In the presented mehtod, an extra trasnistor is used, and current path is made compulsorily in the CMOS circuits in which no current path can be established in steady state, then it can be known that stuck-open tault is in the MOS transistor on the considering current path, if this path disappears due to stuck-open fault. The validity and the effectiveness is shwon, thorugh the SPICE simulation of circuits with fault and the current path search experiment using current path search program based on transistor short model wirtten in C language on SUN sparc workstation.

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