• Transactions of the Korean Society of Mechanical Engineers A
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• v.39 no.12
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• pp.1245-1249
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• 2015

This study investigated the reflection spectra of wrinkled metal/polymer multilayers. A wavy surface was self-assembled by annealing an aluminum-coated poly(methyl metacrylate) layer on a silicon substrate. The total and diffuse reflectance characteristics of the sample with additional metal coatings(aluminum or silver) were evaluated in the visible wavelength(400~800 nm) using a spectrophotometer. The results showed that the wrinkled surface enhanced the diffuse reflectance up to 40~50% in the lower-wavelength range, demonstrating its potential for applications to optical thin-film devices.

• Journal of Mechanical Science and Technology
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• v.16 no.10
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• pp.1346-1354
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• 2002

The purpose of this work is to study the effects of specularly reflecting wall under the combined radiative and laminar free convective heat transfer in an infinite square duct. An absorbing and emitting gray medium is enclosed by the opaque and diffusely emitting walls. The walls may reflect diffusely or specularly. Boussinesq approximation is used for the buoyancy term. The radiative heat transfer is evaluated using the direct discrete ordinates method. The parameters under considerations are Rayleigh number, conduction to radiation parameter, optical thickness, wall emissivity and reflection mode. The differences caused by the reflection mode on the stream line, and temperature distribution and wall heat fluxes are studied. Some differences are observed for the categories mentioned above if the order of the conduction to radiation parameter is less than order of 10$\^$-3/ fer the range of Rayleigh number studied. The differences at the side wall heat flux distributions are observed as long as the medium is optically thin. As the top wall emissivity decreases, the differences between these two modes are increased. As the optical thickness decreases at the fixed wall emissivity, the differences also increase. The difference of the streamlines or the temperature contours is not as distinct as the side wall heat flux distributions. The specular reflection may alter the fluid motion.

• Journal of Information Display
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• v.12 no.4
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• pp.167-171
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• 2011

The angular distribution of the luminance on each optical component of 40-inch light-emitting diode backlight was measured and studied, using the optical-simulation method. Several scattering functions were investigated as the reflection distribution function of the scattering dots printed on the bottom surface of the light guide plate (LGP). It was found that both the diffuse Lambertian and near-specular Gaussian scattering functions were necessary for the successful reproduction of the experimental angular distribution of the luminance. The optimization of the scattering parameters included in these scattering functions led to almost the same luminance distribution as that obtained from the experiment. This approach may be an effective way of indirectly estimating the reflection distribution function of the scattering dots of the LGP, which cannot be made accessible through any other experimental method.

• Transactions of the Korean Society of Mechanical Engineers B
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• v.25 no.10
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• pp.1451-1458
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• 2001

The effects of a specularly reflecting surface on the wall heat flux and medium temperature distribution are studied. The system is an infinite square duct enclosing an absorbing and emitting medium. The walls are opaque, and black or gray. The walls emit diffusely but reflect diffusely or speculary. Heat is transferred by the combined effect of conduction and radiation. The radiative heat transfer is analyzed using direct discrete-ordinates method. The parameters under study are conduction, to radiation parameter, optical depth, wall emissivity, and reflection characteristics. The specular reflection and diffuse reflection show sizeable differences when the conduction to radiation parameter is less than around 0.01. The differences appear only either on the side wall heat flux or on the medium temperature profiles for the range of this study. The differences on the side wall heat flux are observed for optical thickness less than around 0.1 However the differences on the medium temperate profiles are found for optical thickness greater than around 1. The difference increase with increasing reflectance. The specular reflection increases the well heat flux gradient along the side wall.

• Journal of the Korean Crystal Growth and Crystal Technology
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• v.8 no.4
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• pp.581-586
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• 1998

We investigated the effect of mechanical back side damage in Czochralski grown silicon wafer. The intensity of mechanical damage was evaluated by minority carrier recombination lifetime by laser excitation/microwave reflection photoconductivity decay method, degree of X-ray diffuse scattering, X-ray section topography, and wet oxidation/preferential etching methods. The data indicate that the higher the mechanical damage intensity, the lower the minority carrier lifetime, and the magnitude of diffuse scattering and X-ray excess intensity increased proportionally, and it was at Grade 1:Grade 2:Grade 3=1:7:18.4 that the normalized relative quantization ratio of excess intensity in damaged wafer was calculated, which are normalized to the excess intensity from sample Grade 1.

• The Bulletin of The Korean Astronomical Society
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• v.44 no.2
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• pp.48.1-48.1
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• 2019

We found a diffuse Hα feature with a large size of ~2' around a Herbig star, MWC 1080. It shows a strong correlation with the elongated outflow cavity centered on the star. To investigate the diffuse Hα source and the molecular cavity in detail, we carried out the high-resolution NIR spectroscopy using IGRINS. We detected six hydrogen Brackett line series, seven H2 lines, and an [Fe II] forbidden line. With the obtained spatial, kinematic, and line ratio results, we discuss the characteristics of the central MWC 1080A, the NE outflow cavity, and the SE molecular cloud regions separately. Most of the bright Brγ sources around MWC 1080A were found to be reflection nebulae, but a point-like Brγ source close to another young star, MWC 1080E, was identified as a distinct source due to MWC 1080E itself. The narrow components of the H2 lines observed around MWC 1080A were found to trace PDRs located on the wall of the main outflow cavity. Based on the shock-excited H2 and [Fe II] lines detected just inside a bow-shock shape Hα feature, we suggest that it represents the actual shock at the head of the NE outflow from MWC 1080A. Also, we newly detected the shock-excited H2 and [Fe II] lines with highly blueshifted velocities in the SE molecular cloud region. They could be related to unrevealed outflows from other young stars existing around MWC 1080A.

• Proceedings of the Korea Association of Crystal Growth Conference
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• 1998.06a
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• pp.45-48
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• 1998

For the single crystal growth of silicon, a global analysis of heat transfer in a CZ furnace was carried out using the finite element method, where the radiative heat transfer between the surfaces that possess both specular and/or diffuse reflectance components was taken into account, and then the effect of the specular reflection of the crystal and/or melt on the CZ crystal growth was numerically investigated.

• Journal of the Korean Institute of Telematics and Electronics S
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• v.34S no.6
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• pp.21-29
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• 1997

In this paper, we propose a new approach for recovering 3-D shape and extracting the reflectance properties of surface from intensity images. Photometric stereo method(PSM) is genrally based on the direct illumination. In this paper, the reflectance function is derived by interoduceing the indirect diffuse illumination in PSM and then applied to hybrid reflectance model which consists of two components; the lambertian and the specular reflectance. Under the hybrid reflectance model and the indirect diffuse illumination circumstance, the reflectance properties of sample surface can be extracting by normal sampler and then 3-D shape of an object can be recovered based on extracting reflectance properties. This method is rapid because of using the reference table and simplifies the restriction condition about the reflectance function existing in prior studies. Th erecovery efficiency in our method is better than that in prior studies. Also, this method is applied to various types of surfaces by defining general reflectance function.

• The Journal of Korean Institute of Communications and Information Sciences
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• v.21 no.7
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• pp.1633-1641
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• 1996

In this paper we propose a new method for anlayzing the properties of surface reflectance and reconstructing the shape of object using estimated reflectance parameters. We have investigated the hybrid reflectance surface which has specularreflection and diffuse reflection, which can be explained by Torrance-Sparrow model. Sample sphere made on one maerial is used to estimate the reflectance properties by using LMS algorithm. We can make the reference image which consists of surface normal and brightness value using estimated reflectance parameters, and thenarbitrary shape object made of the same material as sample can be reconstructed by matching with reference image. Photometric matching method proposed in this paper is robust because it mateches object image with the reference imageconsidering its neighbor brightness distribution. Also, in this paper plate diffuse illumination is used to remove intensity disparity with simple scheme. It is expected that the proposed algorithm can be applied to 3D recognition, vision inspection system and other fields.

• Proceedings of the Korea Multimedia Society Conference
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• 2000.11a
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• pp.224-227
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• 2000

본 논문에서는 기준 영상으로부터 면의 반사특성을 검출하고, 구해진 반사특성을 임의의 물체에 적용하여 3매의 명암영상을 얻는다. 이 영상을 측광입체시법(photometric stereo method)에 적용하여 3차원 형상인식하는 방법을 제시한다. 본 연구에서 목적으로 하는 물체의 반사특성은 난반사(diffuse reflection)성분과 전반사(specular reflection)성분이 혼합된 혼합 반사면(hybrid reflectance surface)을 그 대상으로 하며, 이러한 면의 반사특성은 Torrance-sparrow모델로 가정하여 문제를 해결해 나간다. 본 연구에서 목적으로 하는 대상 물체는 동일한 재질로 이루어졌다는 가정 하에서 몇개의 표본점들을 취해 반복수치 계산하기 때문에 계산속도가 빠르며, 각 표본점들로부터 계산된 면특성 파라메터들의 평균값을 취해서 다시 Torrance-sparrow모델에 적용함으로써 측광입체시법의 해석을 가능토록 한다. 즉, 3차원 형상인식 과정시 계산된 면특성 파라메터를 사용해 생성한 참조표와 명암영상과의 비교에 의해 빠른 면방향 복구를 행할 수 있다.