Global analysis of heat transfer in Si CZ furnace with specular and diffuse surfaces

  • Hahn, S.H. (Institue for Chemical Reaction Science, Tohoku University) ;
  • Tsukada, T. (Institue for Chemical Reaction Science, Tohoku University) ;
  • Hozawa, M. (Institute for Chemical Reaction Science, Tohoku University) ;
  • Maruyama, S. (Institute of Fluid Science, Tohoku University) ;
  • Imaishi, N. (Institute of Advanced Material Study, Kyushu University)
  • Published : 1998.06.01

Abstract

For the single crystal growth of silicon, a global analysis of heat transfer in a CZ furnace was carried out using the finite element method, where the radiative heat transfer between the surfaces that possess both specular and/or diffuse reflectance components was taken into account, and then the effect of the specular reflection of the crystal and/or melt on the CZ crystal growth was numerically investigated.

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