• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 1998.06a
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• pp.173-176
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• 1998

We experimentally investigated the dielectric relaxation phenomena of a liquid crystal monolayers by the Displacement current techique and displacement current flowing across monolayers is analyzed using rod-like molecular model. It is revealed that the dielectric reaxation time $\tau$ of monolaters in the isotropic polar orientational phase is determined using a linear relashionship between the monolayers compression speed $\alpha$ and the molecular area. The dielectric relaxation time of phospholipid monolayers was examined on the basis of the analysis developed here.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2004.05c
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• pp.9-13
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• 2004

In this paper, evaluation of physical properties about dielectric relaxation phenomena by the detection of the surface pressures and displacements current on the monolayer films of phospolipid monomolecular DLPC, DMPC using pressure stimulus. As a result, the changed surface pressure, displacement current and the transition forms of dipole moment of phospolipid monomolecular in area per molecular by pressure stimulus were conformed well. It was known that the monolayers by linear relationship for decision of dielectric relaxation time between compressure speed and molecule area By according to the linear relationship relation get that frictional constant, DLPC was $1.89{\times}10^{-19}$[Js] and DMPC was $0.722{\times}10^{-19}$[Js]. It is found that the phospolipid monolayer of dielectric relaxation takes a little time and depend on the molecular area.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2003.11a
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• pp.431-434
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• 2003

In this paper, We introduced that the method for deforming the dielectric relaxation time $\tau$ of floating monolayers on water interface. Displacement current flowing across monolayer is analyzed using a rod-like molecular model. It is revealed that the dielectric relaxation time $\tau$ of monolayers in the isotropic polar orientational phase is determined using a linear relashionship between the monolayer compression speed a and the molecular area $A_m$. A displacement current gives a peak at A=$A_m$. The dielectric relaxation time $\tau$ of phospolipid monolayers was examined on the basis of the analysis developed here.

• The Transactions of The Korean Institute of Electrical Engineers
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• v.56 no.1
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• pp.117-122
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• 2007

LB method is one of the most interesting technique to arrange certain molecular groups at precise position relative to others. Also, the LB deposition technique can fabricate extremely thin organic films with a high degree of control over their thickness and molecular architecture. In this way, new thin film materials can be built up at the molecular level, and the relationship between these artificial structures and the properties of materials can be explored. In this paper, evaluation of physical properties was made for dielectric relaxation phenomena by the detection of the surface pressures and displacements current on the monolayer films of phospolipid monomolecular DLPC. Lipid thin films were manufacture by detecting deposition for the accumulation and the current was measured after the electric bias was applied across the manufactured MIM device. It is found that the phospolipid monolayer of dielectric relaxation takes a little time and depend on the molecular area. When electric bias is applied across the manufactured MIM device by the deposition condition of phospolipid mono-layer, it wasn't breakdown when the higher electric field to impress by increase of deposition layers.

• Journal of the Korean Institute of Telematics and Electronics D
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• v.34D no.5
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• pp.1-6
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• 1997

An analysis method for the electromagnetic scattering of a tE polarized plane wave from a periodic strip grating over a grounded dielectric slab is consisered from the viewpoint of reflectio ngraing problem. The strip gratings showing bragg and off-bragg balzing phenomena at the frequency of 10GHz are designed, respectively. The strip grating structure is implemented using aluminum plate (hround conductor), paraffin(dielectric material ; .xi.$_{\gamma}$=2.24) and copper (strip conductor ; 0.08mm thickness). The experimental results (reflection power) for bragg as well as off-bragg blazing phenomenon have been compared with the theoretical results and fairly good agreements between theory and experiment have been observed.ed.

• The Journal of Korean Institute of Electromagnetic Engineering and Science
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• v.10 no.4
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• pp.594-606
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• 1999

The electromagnetic scattering characteristics by a periodic strip grating on a grounded dielectric slab for TE polarization case is examined from the viewpoints of both the reflection grating and the leaky wave antenna problems. Numerical results for two kinds of Bragg blazing (resonance type and non-resonance type) phenomena are given and some discussions on the properties such as complex propagation constants, scattering characteristics, and distributions of strip current density are presented.

• The Journal of Korean Institute of Electromagnetic Engineering and Science
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• v.9 no.2
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• pp.238-252
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• 1998

Diffraction anomalies in the periodic strip grating over a grounded dielectric layer are investigated for the plane wave incidence case of both arbitrary(oblique) incidence angle and arbitrary polarization by use of the spectral domain method combined with the sampling theorem. Some numerical results for the Bragg and Off-Bragg blazing phenomena for the cases of arbitrary incidence angle and polarization as well as TE and TM polarization are presented along with discussions on those phenomena.

• The Journal of Korean Institute of Electromagnetic Engineering and Science
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• v.11 no.8
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• pp.1363-1375
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• 2000

The electromagnetic scattering characteristics by a periodic strip grating on a grounded dielectric slab for TM polarization case are examined from the viewpoints of both the reflection grating and the leaky wave antenna problems. Numerical results far two kinds of Bragg blazing (resonance type and non-resonance type) phenomena are given and some discussions on the properties(complex propagation constants, scattering characteristics, and distributions of strip current density) are presented. The comparison of the Bragg blazing phenomena between TM and TE polarization cases are also given in detail.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.11 no.11
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• pp.984-989
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• 1998

The ($Sr_{1-x}Ca_x)TiO_3$(SCT) thin films are deposited on Pt-coated electrode($Pt/TiN/SiO_2/Si$) using RF sputtering method with substitutional contents of Ca. The maximum grain of thin films is obtained by substitution of Ca at 15[mol%]. All SCT thin films had (111) preferred orientation. The dielectric constant was increased with increasing the substitutional contents of Ca, while it was decreased if the substitutional contents of Ca exceeded over 15[mol%]. The dielectric constant changes almost linearly in temperature ranges of -80~+90[$^{\circ}C$]. The temperature properties of the dielectric loss have a stable value within 0.02 independent of the substitutional contents of Ca. All SCT thin films used in this study show the phenomena of dielectric relaxation with the increase of frequency, and the relaxation frequency is observed above 200[kHz].

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2000.04b
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• pp.92-95
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• 2000

The $(Sr_{1-x}Ca_x)TiO_3$(SCT) thin films are deposited on Pt-coated electrode(Pt/TiN/$SiO_2$/Si) using RF sputtering method with substitutional contents of Ca. The maximum grain of thin films is obtained at SCT15 thin film. The dielectric constant was increased with increasing the substitutional contents of Ca, while it was decreased if the substitutional contents of Ca exceeded over 15[mol%]. The dielectric constant changes almost linearly in temperature ranges of -80~+90$[^{\circ}C]$. The temperature properties of the dielectric loss have a stable value within 0.02 independent of the substitutional contents of Ca. All SCT thin films used in this study show the phenomena of dielectric relaxation with the increase of frequency, and the relaxation frequency is observed above 200[kHz].