• 제목/요약/키워드: Deterioration of film capacitor

검색결과 4건 처리시간 0.057초

A Capacitance Estimation of Film Capacitors in an LCL-Filter of Grid-Connected PWM Converters

  • Heo, Hong-Jun;Im, Won-Sang;Kim, Jang-Sik;Kim, Jang-Mok
    • Journal of Power Electronics
    • /
    • 제13권1호
    • /
    • pp.94-103
    • /
    • 2013
  • A capacitor deterioration of LCL-filter grid-connected PWM converters is progressed by the self-healing mechanism. It leads to the degradation of the filter performance and drop of power factor. Thus, it is required to diagnose fault-point of capacitors and determine the replacement time. Typically, the fault of capacitors is determined when the capacitance is reduced up to 80% from initial value. This paper proposes algorithm to the determine capacitor replacement time of an LCL filter. The algorithm takes the advantage of change of the response on the injected resonant frequency corresponding to 80% value from the initial capacitance. The results of the algorithm are demonstrated through simulations and experiments.

MPPF 커패시터의 전기적, 열적 열화시 소체의 화학적특성에 관한 연구 (A Study on Chemical Characteristic of Electrically and Thermally Treated MPPF Capacitor Elements)

  • 구교선;송현석;이동준;곽희로;송길목
    • 대한전기학회:학술대회논문집
    • /
    • 대한전기학회 2001년도 추계학술대회 논문집 전기물성,응용부문
    • /
    • pp.227-230
    • /
    • 2001
  • This paper divides the factors of an accident into two parts, that are electrical deterioration and thermal deterioration, to analyze a characteristic of the factor of an accident which can break out in the capacitor of metal vaporized polypropylene film. For the purpose of creating capacitor which is caused by electric deterioration, we applied DC overvoltage, induced self-healing and breakdown from element. We applied gradual heat to get an element which is cause by thermal deterioration. The chemical structure of the shape and surface is analyzed by thermogravimetric analyzer (TGA), Scanning Electron Microscope (SEM) and Fourier Transform Infrared Spectrometer(FT-IR). As a result, the peak of methylene group came out, in case of electrical deterioration, as observing the self-healing point. However, the peak is disappeared in the heat treated element by 500[$^{\circ}C$], and the peak of carbonyl group which has C=O came out in case of thermal deterioration.

  • PDF

필름 Capacitor의 전기적Damage에 관한 연구 (electrical Damage of Metallized Film Capacitors)

  • 서광석
    • 대한전기학회논문지
    • /
    • 제40권6호
    • /
    • pp.574-581
    • /
    • 1991
  • Damage in film capacitors has been investigated, using FTIR and ESCA, aiming to elucidate the nature of electrode removal and the possibility of base films to be damaged. Also, tests were conducted to investigate the effect of a long-term thermal aging at elevated temperatures. Unsuccessful clearing or grape-clustering processes can induce a long-term degradation which involves the chemical and morphological changes. Major changes are the oxidation and the decrease in surface crystallinity possibly arising from the corona discharge. An immediate deterioration of BOPP film may occur when the air entrapped between the film layers induces an extensive autocatalytic oxidative degradation. This type of immediate damage may result in a premature failure at an early stage of qualification test. As far as the nature of electrode removal is concerned, a permanent removal of electrode materials was observed in the main erosion area.

  • PDF

계통연계형 3상 PWM 컨버터에서 LCL필터의 필름 커패시터 열화 진단 (Deterioration Diagnostic of Film Capacitor included LCL Filter in Grid-connected Three-phase PWM Converter)

  • 김장식;임원상;김장목;오형식;최철
    • 전력전자학회:학술대회논문집
    • /
    • 전력전자학회 2011년도 전력전자학술대회
    • /
    • pp.186-187
    • /
    • 2011
  • 3상 PWM 컨버터에서 LCL필터 필름 커패시터는 Self-healing 메커니즘에 의해 열화가 진행되며, 이는 시스템의 필터성능과 역률 저하로 이어진다. 따라서 계통측 커패시터의 고장을 판단하고 교체시기를 결정하는 것이 필요하다. 본 논문에서는 정전용량의 80%에 해당하는 공진주파수를 한 주기 동안 주입하였을 때 나타나는 응답의 변화를 통해 커패시터의 열화고장진단 알고리즘을 제안하였다.

  • PDF