• 제목/요약/키워드: Defocus

검색결과 70건 처리시간 0.014초

웨이블릿 변환을 이용한 Depth From Defocus (Depth From Defocus using Wavelet Transform)

  • 최창민;최태선
    • 전자공학회논문지SC
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    • 제42권5호
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    • pp.19-26
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    • 2005
  • 본 논문에서는 CCD 카메라를 이용하여 획득된 영상들 간의 상대적인 열화(Blur)를 이용하여 물체의 3차원 형상 및 거리 정보를 얻을 수 있는 Depth From Defocus(DFD) 방법을 제안한다. 기존 논문의 주파수 영역에서 디포커스(Defocus) 연산자를 구하는 역필터링(Inverse filtering) 방법은 정확도가 떨어지고, 윈도우 효과(Windowing effects) 및 영상의 경계 효과(Border effect)와 같은 단점이 있었다. 또한 일반적인 영상은 비정체성 (Nonstationary)이기 때문에, 임의의 텍스처에 대한 가우시안(Gaussian) 및 라플라시안(Laplacian) 연산자 등의 필터를 이용하는 디포커스 방법의 추정값은 결과가 좋지 않다. 이러한 문제점들을 해결하기 위해 지역적 분석과 함께 다양한 크기의 윈도우를 제공하는 웨이블릿 변환을 이용한 DFD 방법을 제안한다. 복잡한 텍스처 특성을 갖는 영상의 깊이 추정을 위해서는 웨이블릿 분석을 사용하는 것이 효과적이다. Parseval의 정리에 의해 영상 간의 웨이블릿 에너지의 비율이 열화 계수(Blur parameter) 및 거리와 관련 있음을 증명하였다. 제안된 DFD 알고리즘의 성능을 계산하기 위해 실험은 종합적이며 실제적인 영상을 이용하여 행하였다. 본 논문의 DFD 방식은 기존의 DFD 방법보다 RMS 에러 측면에서 정확한 결과를 보였다.

Defocus Study of a Novel Optical Antenna Illuminated by a Radial Radiation Fiber Laser

  • Jiang, Ping;Yang, Huajun;Xie, Kang;Yu, Mingyin;Mao, Shengqian
    • Journal of the Optical Society of Korea
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    • 제18권5호
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    • pp.485-494
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    • 2014
  • A novel antenna with ellipsoid-paraboloid surfaces configuration is designed for matching the incident radial radiation fiber laser distribution for maximum transmission efficiency. The on-axial and off-axial defocus effects on the optical antenna system, resulting in energy loss, are analyzed in detail. Knowledge of the effects of those defocuses on beam divergence, aberration and antenna transmission efficiency is of great importance to the long range communication systems.

흐린 초점의 단일영상에서 깊이맵 생성 알고리즘 (Depth Map Generation Algorithm from Single Defocused Image)

  • 이용환;김영섭
    • 반도체디스플레이기술학회지
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    • 제15권3호
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    • pp.67-71
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    • 2016
  • This paper addresses a problem of defocus map recovery from single image. We describe a simple effective approach to estimate the spatial value of defocus blur at the edge location of the image. At first, we perform a re-blurring process using Gaussian function with input image, and calculate a gradient magnitude ratio with blurring amount between input image and re-blurred image. Then we get a full defocus map by propagating the blur amount at the edge location. Experimental result reveals that our method outperforms a reliable estimation of depth map, and shows that our algorithm is robust to noise, inaccurate edge location and interferences of neighboring edges within input image.

단일 영상에서 디포커스 맵을 활용한 보케 효과 알고리즘 (Bokeh Effect Algorithm using Defocus Map in Single Image)

  • 이용환;김흥준
    • 반도체디스플레이기술학회지
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    • 제21권3호
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    • pp.87-91
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    • 2022
  • Bokeh effect is a stylistic technique that can produce blurring the background of photos. This paper implements to produce a bokeh effect with a single image by post processing. Generating depth map is a key process of bokeh effect, and depth map is an image that contains information relating to the distance of the surfaces of scene objects from a viewpoint. First, this work presents algorithms to determine the depth map from a single input image. Then, we obtain a sparse defocus map with gradient ratio from input image and blurred image. Defocus map is obtained by propagating threshold values from edges using matting Laplacian. Finally, we obtain the blurred image on foreground and background segmentation with bokeh effect achieved. With the experimental results, an efficient image processing method with bokeh effect applied using a single image is presented.

Analysis of Laser-protection Performance of Asymmetric-phase-mask Wavefront-coding Imaging Systems

  • Yangliang, Li;Qing, Ye;Lei, Wang;Hao, Zhang;Yunlong, Wu;Xian'an, Dou;Xiaoquan, Sun
    • Current Optics and Photonics
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    • 제7권1호
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    • pp.1-14
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    • 2023
  • Wavefront-coding imaging can achieve high-quality imaging along with a wide range of defocus. In this paper, the anti-laser detection and damage performance of wavefront-coding imaging systems using different asymmetric phase masks are studied, through modeling and simulation. Based on FresnelKirchhoff diffraction theory, the laser-propagation model of the wavefront-coding imaging system is established. The model uses defocus distance rather than wave aberration to characterize the degree of defocus of an imaging system. Then, based on a given defocus range, an optimization method based on Fisher information is used to determine the optimal phase-mask parameters. Finally, the anti-laser detection and damage performance of asymmetric phase masks at different defocus distances and propagation distances are simulated and analyzed. When studying the influence of defocus distance, compared to conventional imaging, the maximum single-pixel receiving power and echo-detection receiving power of asymmetric phase masks are reduced by about one and two orders of magnitude respectively. When exploring the influence of propagation distance, the maximum single-pixel receiving power of asymmetric phase masks decreases by about one order of magnitude and remains stable, and the echodetection receiving power gradually decreases with increasing propagation distance, until it approaches zero.

광학적으로 유발된 망막흐림의 정도에 따른 시력감소의 개인차와 인식 대비도의 변화 (Individual Difference in the Decrease of Visual Acuity and the Change in Contrast Threshold According to the Level of Optically Induced Retinal Defocus)

  • 김상엽;문병연;조현국
    • 한국안광학회지
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    • 제19권1호
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    • pp.93-98
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    • 2014
  • 목적: 광학적으로 유발된 망막흐림의 정도에 따른 시력감소의 개인차와 대비도의 변화에 따른 개인차를 알아보았다. 방법: 전체 69안을 대상으로 소수시력 각 단계별로 10단계의 다른 대비도로 구성된 시표를 사용하였다. 대상자들의 굴절이상을 완전교정한 후 눈 앞에 +0.25 D씩 순차적으로 증가시켜 망막흐림을 유발한 다음 각 시표에 대한 단안시력과 인식대비도를 측정하였다. 결과: 유발된 망막상의 흐림이 증가됨에 따라 시력은 점차적으로 감소되었다. +0.25 D 부가하여 유발된 망막흐림에서 시력저하의 개인차는 1.2~0.6의 범위로 나타났다. +0.50 D와 +0.75 D 부가되었을 경우 각각 1.0~0.3과 0.9~0.1 범위의 개인차를 보였다. +1.00 D가 부가되었을 때 일부 0.1 시표를 인식하지 못하는 대상안이 나타났고, +1.75 D 부가된 경우 모든 대상안들이 0.1 시표를 인식하지 못하였다. 그리고 망막흐림의 정도가 증가할수록 인식 대비도는 점진적으로 감소하였다. 결론: 최종적인 굴절이상 교정값을 결정할 때 잔여굴절이상의 정도에 따른 시력감소의 개인차를 고려해야 할 것이다.

정확한 위상정보를 얻기 위한 탈초점 영상들의 이미지 처리기법 (Image Processing of Defocus Series TEM Images for Extracting Reliable Phase Information)

  • 송경;신가영;김종규;오상호
    • Applied Microscopy
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    • 제41권3호
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    • pp.215-222
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    • 2011
  • We discuss the experimental procedure for extracting reliable phase information from a defocus series of transmission electron microscopy (TEM) dark-field images using the transport of intensity equation (TIE). Taking InGaN/GaN multi-quantum well light-emitting diode as a model system, various factors affecting the final result of reconstructed phase such as TEM sample preparation, TEM imaging condition, image alignment, the correction of defocus values and the use of high frequency pass filter are evaluated. The obtained phase of wave function was converted to the geometric phase of the corresponding lattice planes, which was then used for the two-dimensional mapping of lattice strain following the dark-field inline holography (DIH) routine. The strain map obtained by DIH after optimized image processing is compared with that obtained by the geometric phase analysis of high resolution TEM (HRTEM) image, manifesting that DIH yields more accurate and reliable strain information than HRTEM-based GPA.

파장에 따른 개별모형안의 수차변화 분석 (According to the Wavelength, the Analysis of Individual Eye Model's Aberration Change)

  • 김세진;임현선;김봉환;고정휘
    • 한국안광학회지
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    • 제13권3호
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    • pp.61-64
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    • 2008
  • 목적: 정시안의 임상자료를 기초로 설계한 개별모형안의 파장에 따른 수차 변화를 분석하였다. 방법: 측정된 안구의 임상 자료를 기초로 설계한 모형안은 4개의 굴절면과 균일한 굴절률을 갖는 형태로 설계하였다. 설계한 12안의 개별모형안에 대하여 프라운호퍼선 6개의 파장 변화를 주어 그에 따른 수차 변화를 분석하였다. 결과: 각 모형안에 대하여 파면수차의 파장에 따른 변화를 Zernike 계수로 분석한 결과 파장이 짧을수록 Defocus는 증가하였고 구면수차(spherical aberration)와 RMS는 개별모형안간의 편차가 크게 나타났다. 결론: 파장의 변화에 따른 Defocus양은 12안의 개별모형안이 비슷한 기울기로 짧을수록 크게 나타났고, 구면수차(spherical aberration)와 RMS는 대부분의 모형안의 경우 변화가 적었으며, 변화가 크게 나타난 일부 모형안은 성능 저하가 발생될 수 있다.

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Photometric Defocus Observations of Transiting Extrasolar Planets

  • Hinse, Tobias C.;Han, Wonyong;Yoon, Joh-Na;Lee, Chung-Uk;Kim, Yong-Gi;Kim, Chun-Hwey
    • Journal of Astronomy and Space Sciences
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    • 제32권1호
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    • pp.21-32
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    • 2015
  • We have carried out photometric follow-up observations of bright transiting extrasolar planets using the CbNUOJ 0.6 m telescope. We have tested the possibility of obtaining high photometric precision by applying the telescope defocus technique, allowing the use of several hundred seconds in exposure time for a single measurement. We demonstrate that this technique is capable of obtaining a root-mean-square scatter of sub-millimagnitude order over several hours for a V~10 host star, typical for transiting planets detected from ground-based survey facilities. We compared our results with transit observations from a telescope operated in in-focus mode. High photometric precision was obtained due to the collection of a larger amount of photons, resulting in a higher signal compared to other random and systematic noise sources. Accurate telescope tracking is likely to further contribute to lowering systematic noise by exposing the same pixels on the CCD. Furthermore, a longer exposure time helps reduce the effect of scintillation noise which otherwise has a significant effect for small-aperture telescopes operated in in-focus mode. Finally we present the results of modelling four light-curves in which a root-mean-square scatter of 0.70 to 2.3 milli-magnitudes was achieved.

비초점 정밀 계측 방식에 의한 새로운 광학 프로브를 이용한 반도체 웨이퍼의 삼차원 미소형상 측정 기술 (A New Method of Noncontact Measurement for 3D Microtopography in Semiconductor Wafer Implementing a New Optical Probe based on the Precision Defocus Measurement)

  • 박희재;안우정
    • 한국정밀공학회지
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    • 제17권1호
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    • pp.129-137
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    • 2000
  • In this paper, a new method of noncontact measurement has been developed for a 3 dimensional topography in semiconductor wafer, implementing a new optical probe based on the precision defocus measurement. The developed technique consists of the new optical probe, precision stages, and the measurement/control system. The basic principle of the technique is to use the reflected slit beam from the specimen surface, and to measure the deviation of the specimen surface. The defocusing distance can be measured by the reflected slit beam, where the defocused image is measured by the proposed optical probe, giving very high resolution. The distance measuring formula has been proposed for the developed probe, using the laws of geometric optics. The precision calibration technique has been applied, giving about 10 nanometer resolution and 72 nanometer of four sigma uncertainty. In order to quantitize the micro pattern in the specimen surface, some efficient analysis algorithms have been developed to analyse the 3D topography pattern and some parameters of the surface. The developed system has been successfully applied to measure the wafer surface, demonstrating the line scanning feature and excellent 3 dimensional measurement capability.

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