• 전자공학회논문지 IE
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• 제48권2호
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• pp.26-31
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• 2011

본 논문에서는 LCD 제조공정 상에서 발생할 수 있는 결함을 검사하고 분류할 수 있는 적응적인 LCD 표면 결함 검사 시스템을 제안하였다. 즉, 반복되는 LCD 패턴의 주기를 확정한 후에 결함 패턴을 검출하고 검출된 결함 패턴의 특징을 계산하여 결함을 분류하였다. 그리고 결함을 검출하는 과정에서 발생하는 잡음은 모폴로지 연산자를 이용하여 제거하였다. 또한, 검출된 결함 패턴에서 기하학적인 특징과 통계적 특징을 계산한 후 신경회로망 알고리즘을 이용하여 여러 종류의 결함 패턴을 적응적으로 분류하였으며, 실험 결과 92.3%의 결함 검출율 및 94.5%의 결함 분류 및 인식율을 획득함으로써, LCD 결함 검사 시스템의 실질적인 구현 가능성을 제시하였다.

• 대한전기학회:학술대회논문집
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• 대한전기학회 2005년도 제36회 하계학술대회 논문집 D
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• pp.2846-2848
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• 2005

This paper proposes a pattern classification algorithm for the defect distribution of Hard Disk Drive (HDD). In the HDD productions, the defect pattern of defective HDD set is important information to diagnosis of defective HDD set. In this paper, 5 characteristics are determined for the classification to six standard defect pattern classes. A fuzzy inference system is proposed, the inputs of which are 5 characteristic values and the outputs are the possibilities that the input pattern is classified to the standard patterns. Classification result is the pattern with maximum possibility. The proposed algorithm is implemented with a PC system for defective HDD sets and shows its effectiveness.

• Journal of Advanced Marine Engineering and Technology
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• 제32권6호
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• pp.834-840
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• 2008

We carried out fatigue testing with materials of aluminum alloyC7075-T6, 2024-T4) by rotary bending fatigue tester. We investigated fatigue limit, fatigue crack initiation, fatigue crack propagation behavior and possibility of fatigue life prediction to the different small circular hole defect. The summarized result are as follows; Fatigue limit of the smooth specimens were related tensile strength and yield strength. In case of more large applied stress and small circular hole crack defect, the fatigue crack was grown rapidly. The fatigue crack propagation behavior proceed at according to inclusion. Fatigue crack propagation ratio appeared instability and retardation phenomenon in the first half of fatigue life but appeared stability and replied in the latter half. On other hand, this experimental data of the materials are appeared fatigue life predictability.

• 대한전기학회논문지:시스템및제어부문D
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• 제54권6호
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• pp.383-389
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• 2005

This paper proposes a pattern classification algorithm for the defect distribution of Hard Disk Drive (HDD). In the HDD production, the defect pattern of defective HDD set is important information to diagnosis of defective HDD set. In this paper, 5 characteristics are determined for the classification to six standard defect pattern classes. A fuzzy inference system is proposed, the inputs of which are 5 characteristic values and the outputs are the possibilities that the input pattern is classified to standard patterns. Therefore, classification result is the pattern with maximum possibility. The proposed algorithm is implemented with the PC system for defective HDD sets and shows its effectiveness.

• 소성∙가공
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• 제31권4호
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• pp.229-239
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• 2022

Convolution Neural Network(CNN) is a class of deep learning algorithms and can be used for image analysis. In particular, it has excellent performance in finding the pattern of images. Therefore, CNN is commonly applied for recognizing, learning and classifying images. In this study, the surface defect classification performance of Al 6061 extruded material using CNN-based algorithms were compared and evaluated. First, the data collection criteria were suggested and a total of 2,024 datasets were prepared. And they were randomly classified into 1,417 learning data and 607 evaluation data. After that, the size and quality of the training data set were improved using data augmentation techniques to increase the performance of deep learning. The CNN-based algorithms used in this study were VGGNet-16, VGGNet-19, ResNet-50 and DenseNet-121. The evaluation of the defect classification performance was made by comparing the accuracy, loss, and learning speed using verification data. The DenseNet-121 algorithm showed better performance than other algorithms with an accuracy of 99.13% and a loss value of 0.037. This was due to the structural characteristics of the DenseNet model, and the information loss was reduced by acquiring information from all previous layers for image identification in this algorithm. Based on the above results, the possibility of machine vision application of CNN-based model for the surface defect classification of Al extruded materials was also discussed.

• 한국진공학회:학술대회논문집
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• 한국진공학회 2016년도 제50회 동계 정기학술대회 초록집
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• pp.128.1-128.1
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• 2016

Nitrided-metal gates on the high-${\kappa}$ dielectric material are widely studied because of their use for sub-20nm semiconductor devices and the academic interest for the evanescent states at the Si/insulator interface. Issues in these systems with the Si substrate are the electron mobility degradation and the reliability problems caused from N defects that permeates between the Si and the $SiO_2$ buffer layer interface from the nitrided-gate during the gate deposition process. Previous studies proposed the N defect structures with the gap states at the Si band gap region. However, recent experimental data shows the possibility of the most stable structure without any N defect state between the bulk Si valence band maximum (VBM) and conduction band minimum (CBM). In this talk, we present a new type of the N defect structure and the electronic structure of the proposed structure by using the first-principles calculation. We find that the pair structure of N atoms at the $Si/SiO_2$ interface has the lowest energy among the structures considered. In the electronic structure, the N pair changes the eigenvalue of the silicon-induced gap state (SIGS) that is spatially localized at the interface and energetically located just above the bulk VBM. With increase of the number of N defects, the SIGS gradually disappears in the bulk Si gap region, as a result, the system gap is increased by the N defect. We find that the SIGS shift with the N defect mainly originates from the change of the kinetic energy part of the eigenstate by the reduction of the SIGS modulation for the incorporated N defect.

• 전자공학회논문지A
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• 제30A권2호
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• pp.46-52
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• 1993

The estimation of yield for semiconductor devices requires not only establishment of critical area but also a new parameter of process defect density that contains inspection mean defect density related cleanness of manufacure process line, minimum feature size and the total number of mask process. We estimate the repaired yield of memory devide, leads the semiconductor technique, repaired by redundancy scheme in relation with defect density distribution function, and we confirm the repaired yield for different devices as this model. This shows the possibility of the yield estimation as statistical analysis for the condition of device related cleanness of manufacture process line, design and manufacture process.

• 한국콘크리트학회:학술대회논문집
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• 한국콘크리트학회 2009년도 춘계 학술대회 제21권1호
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• pp.551-552
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• 2009

오늘날 건축시공에 있어 하자발생 가능성이 증가하고 있다. 이에 부실공사 방지를 위해 건설 안전 정책이 시행되고 있지만, 하자 관련 규정이 추상적이고 불확실하게 규정되어 있어 하자와 관련 된 분쟁은 나날이 증가 되고 있다. 이에 본 연구에서는 하자의 유형 및 원인을 분석하고, 이에 대한 하자책임 및 하자담보 책임기간에 대한 분쟁의 합리적 해결책을 제시하기 위하여 관계 전문가들을 대상으로 설문조사를 실시하였다.

• 대한유전성대사질환학회지
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• 제15권1호
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• pp.25-28
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• 2015

Mitochondrial disorders are rare metabolic diseases. They often present during neonatal period but with nonspecific clinical features such as feeding difficulties, failure to thrive, and seizures. Mitochondrial defects have also known to be associated with neurological disorders, as well as cancers. We report the first case of neonatal mitochondrial respiratory chain defect with sarcoma botryoides confirmed by pathologic diagnosis, suggesting another possible link between mitochondrial dysfunction and cancer.

• EDISON SW 활용 경진대회 논문집
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• 제5회(2016년)
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• pp.75-79
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• 2016

A helical nanosturctrue can be obtained by self-assembly method. Utilizing DPD simulation coarse-grained model, we patterned 2D layer nanosheets with repeated diagonal defects and grafts, and programed to self-roll into hollow helix structure. The defected pattern side caused anisotropy, and formed helix or helix-like structure. This opens the possibility to control the helix pitch or cavity radius. In this work, we designed several patterns about diagonal defect with a variety of defect side densities and defect widths and then simulation was carried out. Thus, our results have that parameters are affecting self-assembly of nanosheets and their conformation.