• 전기전자학회논문지
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• 제18권2호
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• pp.234-239
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• 2014

This paper proposes a new automatic detection method to inspect mura defects on display film surface using morphological image processing and labeling. This automatic detection method for mura defects on display films comprises 3 phases of preprocessing with morphological image processing, Gabor filtering, and labeling. Since distorted results could be obtained with the presence of non-uniform illumination, preprocessing step reduces illumination components using morphological image processing. In Gabor filtering, mura images are created with binary coded mura components using Gabor filters. Subsequently, labeling is a final phase of finding the mura defect area using the difference between large mura defects and values in the periphery. To evaluate the accuracy of the proposed detection method, detection rate was assessed by applying the method in 200 display film samples. As a result, the detection rate was high at about 95.5%. Moreover, the study was able to acquire reliable results using the Semu index for luminance mura in image quality inspection.

• 반도체디스플레이기술학회지
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• 제10권1호
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• pp.113-118
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• 2011

This paper proposes computer visual inspection algorithms for PCB defects which are found in a manufacturing process. The proposed method can detect open circuit and short circuit on bare PCB without using any reference images. It performs adaptive threshold processing for the ROI (Region of Interest) of a target image, median filtering to remove noises, and then analyzes connected components of the binary image. In this paper, the connected components of circuit pattern are defined as 6 types. The proposed method classifies the connected components of the target image into 6 types, and determines an unclassified component as a defect of the circuit. The analysis of the original target image detects open circuits, while the analysis of the complement image finds short circuits. The machine vision inspection system is implemented using C language in an embedded Linux system for a high-speed real-time image processing. Experiment results show that the proposed algorithms are quite successful.

• 한국컴퓨터정보학회:학술대회논문집
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• 한국컴퓨터정보학회 2023년도 제68차 하계학술대회논문집 31권2호
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• pp.21-22
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• 2023

딥러닝 모델은 영상 처리와 불량 감지 등 다양한 분야에서 높은 성능을 발휘하여 산업적으로 매우 중요하고 필수적인 기술이 되었다. 특히, 불량 감지는 제조업 분야에서 제품 품질 향상과 생산성 향상에 핵심적인 역할을 하는 기술로써 큰 관심을 받고 있다. 본 논문에서는 재건축 방식의 대표적인 모델인 DRAEM에 대해 불량 감지 성능을 향상하는 방법을 제시합니다. 이를 위해 컬러 분포의 차이를 최소화하는 손실 함수와 마스킹에 고주파 필터링을 적용하여 노이즈를 제거하는 방법을 활용한다. 이러한 방법들을 통해 DRAEM 모델의 성능을 개선하고, 정확하고 효과적인 불량 감지를 실현할 수 있다.

• 전기학회논문지
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• 제66권10호
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• pp.1508-1515
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• 2017

This paper proposes the defect detection method for automatic inspection machines in printed circuit boards (PCBs) manufacturing system. The defects of PCB such as open, short, pin hole and scratch can be detected by comparing the standard image and the target image. The standard image is obtained from CAD file such as ODB++ format, and the target image is obtained by arranging, filtering and binarization of captured PCB image. Since the PCB size is too large and image resolution is too high, the image processing requires a lot of memory and computational time. The wavelet transform is applied to compress the standard and target images, which results in reducing the memory and computational time. To increase the inspection accuracy, we utilize the he HH-domain as well as LL-domain of the transformed images. Experimental results are finally presented to show the performance improvement of the proposed method.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2001년도 춘계학술대회 논문집 반도체재료
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• pp.34-37
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• 2001

As the integrated circuit device shrinks to smaller dimensions, chemical mechanical polishing (CMP) process was required for the global planarization of inter-metal dielectric (IMD) layer with free-defect. However, as the inter-metal dielectrics (IMD) layer gets thinner, micro-scratches are becoming as major defects. Micro-scratches are generated by agglomerated slurry, solidified and attached slurry in pipe line of slurry supply system. To prevent agglomerated slurry particle from inflow, we installed 0.5${\mu}m$ POU (point of use) filter, which is depth-type filter and has 80% filtering efficiency for the $1.0{\mu}m$ size particle. In this paper, we studied the relationship between defect generation and pad count to understand the exact efficiency of the slurry filtration, and to find out the appropriate pad usage. Our preliminary results showed that it is impossible to prevent defect-causing particles perfectly through the depth-type filter. Thus, we suggest that it is necessary to optimize the flow rate of slurry to overcome depth type filters weak-point, and to install the high spray of de-ionized Water (DIW) with high pressure.

• Journal of Biosystems Engineering
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• 제16권3호
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• pp.272-280
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• 1991

The aims of this study were to investigate the feasivility of analyzing a few sorting factors such as size, coloration and defect of apples with a monochrome image processing system and to find apparent properties which could be effectively used for apple sorting. The results are summarized as follows. 1. A computer program was made to analyze the projection area, coloration and defect of an apple with a monochrome image processing system. 2. The algorithm developed to compute the projedtion area of an apple was between on the proportional relation between a given reference area and the corresponding number of pixels, and the computing time was 0.74 to 0.82 second depending on the size of apple. 3. The coloration of an apple was expressed as the ratio of the gray value of a reference color to that of a given bounded area of the stem end surface (defined as coloration index), and the computing time was about 3.0 seconds with this algorithm. 4. Defect of an apple could be isolated by lowpass filtering and image subtraction but it took about 20 seconds in computing time. 5. The coloration of the Fuji apple could be classified into 3 to 4 groups by the coloration index and also, it was found that the correlation coefficient between the indices and sugar contents was 0.74. 6. The coloration index obtained from a given bounded area of the stem end side of the Fuji apple could represent the coloration of total surface with a correlation coefficient of 0.922.

• 한국전기전자재료학회논문지
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• 제14권9호
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• pp.707-713
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• 2001

As the integrated circuit device shrinks to smaller dimensions, chemical mechanical polishing (CMP) process was requirdfo the global planarization of inter-metal dielectric (IMD) layer with free-defect. However, as the IMD layer gest thinner, micro-scratches are becoming as major defects. However, as the IMD layer gets thinner, micro-scratches are becoming as major defects. Micro-scratches are generated by agglomerated slurry, solidified and attached slurry in pipe line of slurry supply system. To prevent agglomerated slurry particle from inflow, we installed 0.5${\mu}{\textrm}{m}$ point of use (POU) filter, which is depth-type filter and has 80% filtering efficiency for the 1.0${\mu}{\textrm}{m}$ size particle. In this paper, we studied the relationship between defect generation and polished wafer counts to understand the exact efficiency fo the slurry filteration, and to find out the appropriate pad usage. Our experimental results showed that it sis impossible to prevent defect-causing particles perfectly through the depth-type filter. Thus, we suggest that it is necessary to optimize the slurry flow rate, and to install the high spray bar of de-ionized water (DIW) with high pressure, to overcome the weak-point of depth type filter.

• 한국음향학회지
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• 제14권6호
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• pp.62-67
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• 1995

본 논문에서는 금속내부에 존재하는 결함의 다양한 형태로부터 반사된 초음파 신호를 디지탈 신호처리에 의하여 특징추출하는 방법을 연구분석하였다. 다양한 형태의 결함으로부터 반사된 초음파 신호는 잡음 등의 영향으로 그 특징의 구별이 애매하므로 자기 회기법(auto-regressive)을 이용한 위너 필터링(Wiener filtering)과 최소 절대치 노름(least-absolute-values norm) 기법을 사용하여 신호의 특징을 추출하고 상호 비교분석하였다. 실험에서는 알루미늄 시편에 평면결함, 사각결함, 원형결함의 세가지 결함형태를 제작하였으며, 초음파를 입사하고 펄스-에코 방법에 의하여 반사신호를 측정하였다. 반사신호의 디지탈 신호처리 결과, 이러한 특징추출방법은 다양한 형태의 결함으로부터 반사된 신호를 효율적으로 분류 할 수 있었다.

• 한국표면공학회:학술대회논문집
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• 한국표면공학회 1999년도 춘계학술발표회 초록집
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• pp.97-97
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• 1999

Dross formation in the zinc bath is inevitable under any condition as long as coating process on steel strip continues. Thus, bath aluminum and temperature are precisely managed to suppress the increase of dross. Also, excessive dross for normal coating process is generally eliminated physically by bubbling and skimming. Total amount of dross in the bath can be sometimes high enough to cause coating defect. On the other hand, local concentration of dross can make coating defect even with satisfactory level of total amount of dross. Reduction of dross in the bath was attempted by using ceramic foam filter made of mainly alumina. Dross in molten zinc was almost reduced to the levels of solubility of iron and aluminum in molten zinc at $450~460^{\circ}C$. Their solubility levels were confirmed by thermodynamic calculations or DEAL program. Two kinds of filters were tested for dross reduction. One was #20 ppi, porous per inch, and the other #30 ppi filter. Both were effective in reducing the bath dross to the solubility levels at the static state. Bath iron was reduced by 24 wt% and 19 wt% with #20 filter, and by 35 wt% and 29 wt% with #30 filter for GI and GA pot, respectively. Also, ceramic foam filter did not make any harm to the zinc bath composition after filtering test.

• 대한전자공학회논문지TC
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• 제37권4호
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• pp.1-8
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• 2000

상향 링크와 하향 링크의 대역폭이 다른 대역폭 비대칭 환경에서 TCP는 단말국 링크에서의 지연 및 손 실로 인해 전송율이 감소하는 문제점이 있다. 또한, 양방향 TCP 트래픽하에서는 연속적인 이터패킷이 버퍼에 주입됨으로써 전체 링크 효율이 저하된다. 이러한 문제를 해결하기 위한 방안으로서 본 논문에서는 단 말국 ACK 필터링 기법과 단말국 패킷 스제줄링 기법을 제안한다. ACK 필터링은 대역폭이 제한된 상향 링 크에서 단말국의 송신 버퍼에 쌓인 ACK 패킷들을 제거하고 최근의 ACK 패킷만을 전송하고, 패킷 스케줄 링은 데이터 패킷과 ACK 패킷을 번갈아 전송하여 양방향 TCP 트래픽에서 발생하는 'clustering'과 'ack compression' 현상을 억제하는 기법이다. 모의 실험을 통해서 대역폭 비대칭 위성망에서 역방향 TCP 연결 의 데이터 전송을 보장하는 동시에 순방향 TCP 트래픽에서도 높은 전송율을 얻게되는 것을 확인하였다.