• Korean Journal of Materials Research
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• v.15 no.6
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• pp.370-374
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• 2005

Doppler broadening spectrometer for positron annihilation experiment(DBPAS) has been used to characterize nano size defect structures in materials. DBPAS measures the concentration, spatial distribution, and size of open volume defects in the rare-earth intensifying screen materials. The screens were exposed by X-ray varying the exposed doses from 3, 6, 9, and 12 Gy with 6 W and 15 MV respectively and also irradiated by 37 MeV proton beams ranging from 0 to $10^{12}ptls$. The S parameter values increased as the exposed time and the energies increased, which indicated the defects were generated more. The S parameters of the samples with X-rays varied from 0.5098 to 0.5108, on the other hand, as proton beams varied from 0.4804 to 0.4821.

• Proceedings of the Korean Society of Radiological Science
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• 2002.06b
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• pp.32.3-32.3
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• 2002

• Journal of the Korean Vacuum Society
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• v.13 no.2
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• pp.92-98
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• 2004

DBPAS has been used to characterize atomic size defect structures in materials. In this investigation the numerical analysis of the Doppler spectra was employed to the determination of the shape parameter, S, defined as the ratio between the amount of counts in a central portion of the spectrum and the total counts of whole spectrum. As the samples were exposed by X-ray increasing the exposed doses from 3, 6, and 9 Gy with 6 MV and 15 MV, respectively and also irradiated by X-ray as the medical applications used for in 0, 2, 4 and 6 years. The S-parameter values were increased as increasing the exposed time and the energies, that indicated the defects generate more. The S-parameters of the samples with medical treatment is varied from 0.4932 to 0.4956.

• Korean Journal of Materials Research
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• v.12 no.5
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• pp.359-362
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• 2002

DBPAS has been used to characterize atomic level defect structures in materials. In this investigation the numerical analysis of the Doppler spectra was restricted to the determination of the shape parameter, S, defined as the ratio between the total amount of counts in a central portion of the spectrum and the total amount of counts. As samples were exposed by X-ray increasing from 3, 6, and 9 Gy with 6 MV, and 10 MV each and also by E-beam increasing the energies with 6 MeV, 9 MeV, 12 MeV, and 20 MeV. The S-parameter values were increased as increasing the exposed time and the energies. The S-parameters of the large and small size grains in $CaWO_4$ were measured. The S-parameter of the small size grains in $CaWO_4$ was resulted in larger values.