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http://dx.doi.org/10.3740/MRSK.2005.15.6.370

The Defect Characterization of Rare-earth Intensifying Screen Material by Doppler Broadening Positron Annihilation Spectrometer  

Lee C. Y. (Department of Physics, Hannam University)
Kim C. G. (Radiology Department, Gimcheon College)
Song G. Y. (Department of Physics, Hannam University)
Kim J. H. (Radiopharmaceuticals Lab, KIRAM)
Publication Information
Korean Journal of Materials Research / v.15, no.6, 2005 , pp. 370-374 More about this Journal
Abstract
Doppler broadening spectrometer for positron annihilation experiment(DBPAS) has been used to characterize nano size defect structures in materials. DBPAS measures the concentration, spatial distribution, and size of open volume defects in the rare-earth intensifying screen materials. The screens were exposed by X-ray varying the exposed doses from 3, 6, 9, and 12 Gy with 6 W and 15 MV respectively and also irradiated by 37 MeV proton beams ranging from 0 to $10^{12}ptls$. The S parameter values increased as the exposed time and the energies increased, which indicated the defects were generated more. The S parameters of the samples with X-rays varied from 0.5098 to 0.5108, on the other hand, as proton beams varied from 0.4804 to 0.4821.
Keywords
Intensifying screen; DBPAS; proton beam; X-ray; defect;
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1 T. K. Gupta, W. D. Straub, M. S. Ramanachalam, J. P. Schaffer, and A. Rohatgi J. Appl. Phys., 66, 6132 (1989)   DOI
2 A. Uedono, Y. Cho, S. Tanigawa, and A. Ikari Jpn. J. Appl. Phys., pt1 33, 1 (1994)   DOI   ScienceOn
3 Nak Bae Kim, March Technical Report, KIGM&M (1994)
4 T. K. Gupta and W. G. Carlson, J. Mater. Sci., 20, 3487 (1987)   DOI
5 M. Pacilio et. al., Phys. Med. Biol., 47, 107 (2002)   DOI   ScienceOn
6 Korean Radiation Imaging & Information Technology Researchers, Medical - Radiation Imaging & Information Technology, Komoonsa, (2002)
7 J. S. Chai, MC-50 Cyclotron Operation Annual Report, KIRAM (2003)
8 A. P. Druzhkov, R. N. Yeshchenko, S. M. Klotsman, A. N. Martem' Yanov, and G. G. Taluts, Phys. Met. Metall., 66, 117 (1988)
9 J. L. Lee, J. T. Waber, Meta. Trans., 21a, 2037 (1990)   DOI
10 Z. Wei, D. Yang, and K. H. Wu, Seri. Meta. Meter., 29, 753 (1993)   DOI
11 C. G. Kim, C. M. Ahn, G. Y. Song, and C. Y. Lee, J. Mater. Res., 12, 359 (2002)
12 B. Mantl and W. Triftshauser, Appl. Phys., 5, 177 (1974)   DOI
13 T. M. Wesik, D. Krammer, W. T. Lee, and A. Q. Pard, Turbomachinary Intl., 1, 24 (1984)
14 H. E. Collins, Met. Trans., 5, 189 (1974)
15 E. H. Molen, J. M. Oblak, and O. H. Kriege, Met. Trans., 2, 1627 (1971)
16 B. Nielson, O. W. Holland, T. C. Leung, and K. G. Lynn, J. Appl. Phys., 74, 1636 (1993)   DOI   ScienceOn
17 M. S. Ramanachalam, A. Rohatgi, J. P. Schaffer, and T. K. Gupta, J. Appl. Phys., 69, 8380 (1991)   DOI