• 제목/요약/키워드: Contact/Adhesion/Collision/Detachment mechanism modeling

검색결과 2건 처리시간 0.017초

극저온 $CO_2$ 세정과정 시 미세오염물의 탈착 메커니즘 연구 (A dynamic analysis on minute particles' detachment mechanism in a cryogenic $CO_2$ cleaning process)

  • 석종원;이성훈;김필기;이주홍
    • 반도체디스플레이기술학회지
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    • 제7권4호
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    • pp.29-33
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    • 2008
  • Rapid increase of integrity for recent semiconductor industry highly demands the development of removal technology of contaminated particles in the scale of a few microns or even smaller. It is known that the surface cleaning technology using $CO_2$ snow has its own merits of high efficiency. However, the detailed removal mechanism of particles using this technology is not yet fully understood due to the lack of sophisticated research endeavors. The detachment mechanism of particles from the substrates is known to be belonged in four types; rebounding, sliding, rolling and lifting. In this study, a modeling effort is performed to explain the detachment mechanism of a contaminant particle due to the rebounding caused by the vertical collision of the $CO_2$ snow. The Hertz and Johnson-Kendall-Roberts(JKR) theories are employed to describe the contact, adhesion and deformation mechanisms of the particles on a substrate. Numerical simulations are followed for several representative cases, which provide the perspective views on the dynamic characteristics of the particles as functions of the material properties and the initial inter-particle collision velocity.

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