• Title/Summary/Keyword: Compact Disk-Recordable

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Heat transfer analysis for optimization of recording mark on Compact Disk-Recordable (추기형 광디스크에서 최적 기록마크 생성을 위한 열전달 해석)

  • Hong, S.K.;Lee, J.D.;Shin, J.M.;Go, S.R.;Lee, K.H.;Cho, H.H.
    • Proceedings of the KSME Conference
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    • 2001.06d
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    • pp.589-595
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    • 2001
  • The present study conducted heat transfer analysis in multi-layer of CD-R. It is necessary to analyze heat transfer during the recording process to find optimum power and write strategy in CD-R. This study investigated effects of several parameters such as recording speed, laser power, layer thickness and thermal property. The calculated results presented temperature distribution in the multi-layer and detailed information of recording characteristics. Optimum laser power was estimated, comparing an optimum mark length with the calculated mark lengths. The results showed that the optimum laser power was influenced significantly by the layer thickness and the thermal properties of the dye.

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Investigation of Spot Marking in Multilayer Thin Films using OCT (OCT에 의한 다층 박막의 Spot Marking 분석)

  • Shin Yongjin;Kim Hyunjin;Kim Youngseop;Park Sohee
    • Laser Solutions
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    • v.7 no.2
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    • pp.11-18
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    • 2004
  • We propose a novel application of optical coherence tomography (OCT) to monitor pit formation in laser irradiated optical storage materials. A multilayer optical storage recordable compact disk, is composed of multiple layers, each of different structure. Disks were irradiated with aQ-Switched Nd:YAG laser with an energy of 373 mJ. Post-irradiated disks were evaluated by OCT and those images were compared with optical microscopy. Our results indicate that OCT is a useful instrument to investigate pit formation in multilayer optical storage disks and might also provide information to optimize optical memory technology.

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Spot marking of the multilayer thin films by Nd:YAG laser (Nd:YAG 레이저에 의한 다층 박막의 미소 점 마킹)

  • Kim, Hyun-Jin;Shin, Yong-Jin
    • Korean Journal of Optics and Photonics
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    • v.15 no.4
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    • pp.361-368
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    • 2004
  • We separated the multilayer structure of CD-R(compact disk-recordable) and investigated optimal spot marking conditions and physical and chemical transitions in response to various laser beam energh levels. Spot marking(80 ${\mu}{\textrm}{m}$ spot size) was produced on the surface of each layer using a Q-switched Nd:YAG laser between 27 mJ and 373mJ. By investigating resulting pit formation with Optical Microscopy(OM) and Optical Coherence Tomography(OCT), we analyzed the formation process of spot marking in the multilayer structure of different chemical composition. The localized heating of the substrate in the multilayer thin film caused the short temporal thermal expansion, and absorbed optical energy between reflective and dye interfaces melted dye and increased the volume. During the cooling phase, formation of pit and surrounding rim can be explained by three distinct processes; effect of surface tension, evaporation by spontaneous temperature increase due to laser energy, and mass flow from the recoil pressure. Our results shows that the spot marking formation process in the multilayer thin film is closely related to the layers' physical, chemical, and optical properties, such as surface tension, melt viscosity, layer thickness, and chemical composition.